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Synthesis, crystal structure, and properties of KSbO3-type Bi3Mn1.9Te1.1O11”. Li MR, Retuerto M, Bok Go Y, Emge TJ, Croft M, Ignatov A, Ramanujachary KV, Dachraoui W, Hadermann J, Tang MB, Zhao JT, Greenblatt M;, Journal of solid state chemistry 197, 543 (2013). http://doi.org/10.1016/j.jssc.2012.07.038
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Pb5Fe3TiO11Cl : a rare example of Ti(IV) in a square pyramidal oxygen coordination”. Batuk M, Batuk D, Abakumov AM, Hadermann J, Journal of solid state chemistry 215, 245 (2014). http://doi.org/10.1016/j.jssc.2014.04.002
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The interplay of microstructure and magnetism in La3Ni2SbO9”. Battle PD, Avdeev M, Hadermann J, Journal of solid state chemistry 220, 163 (2014). http://doi.org/10.1016/j.jssc.2014.08.024
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Source/drain materials for Ge nMOS devices: phosphorus activation in epitaxial Si, Ge, Ge1-xSnx and SiyGe1-x-ySnx”. Vohra A, Makkonen I, Pourtois G, Slotte J, Porret C, Rosseel E, Khanam A, Tirrito M, Douhard B, Loo R, Vandervorst W, Ecs Journal Of Solid State Science And Technology 9, 044010 (2020). http://doi.org/10.1149/2162-8777/AB8D91
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Farmers' preferences towards water hyacinth control : a contingent valuation study”. Van Oijstaeijen W, Van Passel S, Cools J, Janssens de Bisthoven L, Huge J, Berihun D, Ejigu N, Nyssen J, Journal Of Great Lakes Research 46, 1459 (2020). http://doi.org/10.1016/J.JGLR.2020.06.009
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Evaluation of different rectangular scan strategies for STEM imaging”. Velazco A, Nord M, Béché, A, Verbeeck J, Ultramicroscopy , 113021 (2020). http://doi.org/10.1016/j.ultramic.2020.113021
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Atom column detection from simultaneously acquired ABF and ADF STEM images”. Fatermans J, den Dekker Aj, Müller-Caspary K, Gauquelin N, Verbeeck J, Van Aert S, Ultramicroscopy 219, 113046 (2020). http://doi.org/10.1016/j.ultramic.2020.113046
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HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale”. Prabhakara V, Jannis D, Guzzinati G, Béché, A, Bender H, Verbeeck J, Ultramicroscopy 219, 113099 (2020). http://doi.org/10.1016/j.ultramic.2020.113099
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Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations”. De wael A, De Backer A, Van Aert S, Ultramicroscopy 219, 113131 (2020). http://doi.org/10.1016/j.ultramic.2020.113131
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Nanowire facilitated transfer of sensitive TEM samples in a FIB”. Gorji S, Kashiwar A, Mantha LS, Kruk R, Witte R, Marek P, Hahn H, Kübel C, Scherer T, Ultramicroscopy 219, 113075 (2020). http://doi.org/10.1016/J.ULTRAMIC.2020.113075
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Follow-up of solid-state fungal wood pretreatment by a novel near-infrared spectroscopy-based lignin calibration model”. Wittner N, Gergely S, Slezsák J, Broos W, Vlaeminck SE, Cornet I, Journal of microbiological methods 208, 106725 (2023). http://doi.org/10.1016/J.MIMET.2023.106725
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Reliable phase quantification in focused probe electron ptychography of thin materials”. Hofer C, Pennycook TJ, Ultramicroscopy 254, 113829 (2023). http://doi.org/10.1016/j.ultramic.2023.113829
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A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection”. De Backer A, Bals S, Van Aert S, Ultramicroscopy , 113702 (2023). http://doi.org/10.1016/j.ultramic.2023.113702
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Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions”. Zhang Z, Lobato I, De Backer A, Van Aert S, Nellist P, Ultramicroscopy 246, 113671 (2023). http://doi.org/10.1016/j.ultramic.2022.113671
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Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network”. Lobato I, De Backer A, Van Aert S, Ultramicroscopy 251, 113769 (2023). http://doi.org/10.1016/j.ultramic.2023.113769
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Characterization of a Timepix detector for use in SEM acceleration voltage range”. Denisov N, Jannis D, Orekhov A, Müller-Caspary K, Verbeeck J, Ultramicroscopy 253, 113777 (2023). http://doi.org/10.1016/j.ultramic.2023.113777
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Convexity constraints on linear background models for electron energy-loss spectra”. Van den Broek W, Jannis D, Verbeeck J, Ultramicroscopy 254, 113830 (2023). http://doi.org/10.1016/j.ultramic.2023.113830
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Phase offset method of ptychographic contrast reversal correction”. Hofer C, Gao C, Chennit T, Yuan B, Pennycook TJ, Ultramicroscopy , 113922 (2024). http://doi.org/10.1016/j.ultramic.2024.113922
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Atom counting from a combination of two ADF STEM images”. Şentürk DG, Yu CP, De Backer A, Van Aert S, Ultramicroscopy 255, 113859 (2024). http://doi.org/10.1016/j.ultramic.2023.113859
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Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination”. Şentürk DG, De Backer A, Van Aert S, Ultramicroscopy 259, 113941 (2024). http://doi.org/10.1016/j.ultramic.2024.113941
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On central focusing for contrast optimization in direct electron ptychography of thick samples”. Gao C, Hofer C, Pennycook TJ, Ultramicroscopy 256, 113879 (2024). http://doi.org/10.1016/J.ULTRAMIC.2023.113879
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Driven spin transitions in fluorinated single- and bilayer-graphene quantum dots”. Zebrowski DP, Peeters FM, Szafran B, Semiconductor science and technology 32, 065016 (2017). http://doi.org/10.1088/1361-6641/AA6DF4
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Strain measurement in semiconductor FinFET devices using a novel moiré, demodulation technique”. Prabhakara V, Jannis D, Béché, A, Bender H, Verbeeck J, Semiconductor science and technology (2019). http://doi.org/10.1088/1361-6641/ab5da2
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Klein tunneling in single and multiple barriers in graphene”. Pereira JM, Peeters FM, Chaves A, Farias GA, Semiconductor science and technology 25, 033002 (2010). http://doi.org/10.1088/0268-1242/25/3/033002
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The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-field electron holography”. Denneulin T, Rouvière JL, Béché, A, Py M, Barnes JP, Rochat N, Hartmann JM, Cooper D, Semiconductor science and technology 26, 1 (2011). http://doi.org/10.1088/0268-1242/26/12/125010
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RAMS and WRF sensitivity to grid spacing in large-eddy simulations of the dry convective boundary layer”. Ercolani G, Gorle C, Garcia Sánchez C, Corbari C, Mancini M, Computers and fluids 123, 54 (2015). http://doi.org/10.1016/j.compfluid.2015.09.009
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Electrochemical deposition of a copper carboxylate layer on copper as potential corrosion inhibitor”. Elia A, De Wael K, Dowsett M, Adriaens A, Journal of solid state electrochemistry 16, 143 (2011). http://doi.org/10.1007/S10008-010-1283-6
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Influence of the deposition method, temperature and deposition time on the corrosion inhibition of lead dodecanoate coatings deposited on lead surfaces”. De Keersmaecker M, De Wael K, Adriaens A, Journal of solid state electrochemistry 17, 1259 (2013). http://doi.org/10.1007/S10008-012-1964-4
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Effect of interface evolution on thermal conductivity of vacuum hot pressed SiC/Al composites”. Chen Z, Tan Z, Ji G, Schryvers D, Ouyang Q, Li Z, Advanced engineering materials 17, 1076 (2015). http://doi.org/10.1002/adem.201400412
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Oxidation states of uranium in DU particles from Kosovo”. Salbu B, Janssens K, Lind OC, Proost K, Danesi PR, Journal of environmental radioactivity 64, 167 (2003). http://doi.org/10.1016/S0265-931X(02)00047-4
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