Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Van Aert, S.; van Dyck, D. |
Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? |
2001 |
Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties |
81 |
11 |
UA library record; WoS full record; WoS citing articles |
Schryvers, D.; Van Aert, S. |
High-resolution visualization techniques : structural aspects |
2012 |
|
|
|
UA library record |
Van Aert, S. |
Meer zien met onzichtbaar licht |
2007 |
Karakter : tijdschrift van wetenschap |
18 |
|
UA library record |
Schryvers, D.; Shi, H.; Martinez, G.T.; Van Aert, S.; Frenzel, J.; Van Humbeeck, J. |
Nano- and microcrystal investigations of precipitates, interfaces and strain fields in Ni-Ti-Nb by various TEM techniques |
2013 |
Materials science forum
T2 – 9th European Symposium on Martensitic Transformations (ESOMAT 2012), SEP 09-16, 2012, St Petersburg, RUSSIA |
738/739 |
2 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
The notion of resolution |
2008 |
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|
UA library record |
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
The notion of resolution |
2007 |
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|
UA library record |
van Dyck, D.; Van Aert, S.; Croitoru, M.D. |
Obstacles on the road towards atomic resolution tomography |
2005 |
Microscoy and microanalysis |
11 |
|
UA library record |
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis |
2003 |
Institute of physics conference series |
|
|
UA library record; WoS full record; |
Jones, L.; Yang, H.; Pennycook, T.J.; Marshall, M.S.J.; Van Aert, S.; Browning, N.D.; Castell, M.R.; Nellist, P.D. |
Smart Align : a new tool for robust non-rigid registration of scanning microscope data |
2015 |
Advanced Structural and Chemical Imaging |
1 |
131 |
UA library record; WoS full record; WoS citing articles |
Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D. |
Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction |
2005 |
Microscopy and microanalysis |
11 |
|
UA library record |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
Statistical experimental design for quantitative atomic resolution transmission electron microscopy |
2004 |
|
|
13 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S. |
Statistical parameter estimation theory : a tool for quantitative electron microscopy |
2012 |
|
|
|
UA library record |
Batenburg, J.; Van Aert, S. |
Three-dimensional reconstruction of a nanoparticle at atomic resolution |
2011 |
ERCIM news |
86 |
|
UA library record |
De Backer, A.; De Wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits? |
2015 |
Journal of physics : conference series |
644 |
|
UA library record; WoS full record |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
High resolution electron microscopy from imaging towards measuring |
2001 |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
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|
UA library record |
de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits? |
2015 |
Journal of physics : conference series |
644 |
|
UA library record |
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. |
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data |
2008 |
|
|
|
UA library record |
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. |
StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images |
2017 |
Journal of physics : conference series
T2 – Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 3-6 July 2017, Manchester, UK |
902 |
1 |
UA library record; WoS full record; WoS citing articles |
van den Bos, K.H.W.; Altantzis, T.; De Backer, A.; Van Aert, S.; Bals, S. |
Recent breakthroughs in scanning transmission electron microscopy of small species |
2018 |
Advances in Physics: X |
3 |
8 |
UA library record; WoS full record; WoS citing articles |
Goris, B.; De Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, J.; Sanchez-Iglesias, A.; Liz-Marzan, L.; Van Aert, S.; Sijbers, J.; Van Tendeloo, G.; Bals, S. |
Investigating lattice strain in Au nanodecahedrons |
2016 |
|
|
|
UA library record |
Groenendijk, D.J.; Autieri, C.; van Thiel, T.C.; Brzezicki, W.; Hortensius, J.R.; Afanasiev, D.; Gauquelin, N.; Barone, P.; van den Bos, K.H.W.; van Aert, S.; Verbeeck, J.; Filippetti, A.; Picozzi, S.; Cuoco, M.; Caviglia, A.D. |
Berry phase engineering at oxide interfaces |
2020 |
|
2 |
58 |
UA library record; WoS full record; WoS citing articles |
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Atom column detection |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Atom counting |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Efficient fitting algorithm |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
General conclusions and future perspectives |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Image-quality evaluation and model selection with maximum a posteriori probability |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Introduction |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Optimal experiment design for nanoparticle atom counting from ADF STEM images |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Statistical parameter estimation theory : principles and simulation studies |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
Arslan Irmak, E.; Liu, P.; Bals, S.; Van Aert, S. |
3D Atomic Structure of Supported Metallic Nanoparticles Estimated from 2D ADF STEM Images: A Combination of Atom – Counting and a Local Minima Search Algorithm |
2021 |
Small methods |
|
12 |
UA library record; WoS full record; WoS citing articles |