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  Author Title Year Publication Volume Times cited Additional Links Links
Zhang, X.F.; Zhang, X.B.; Van Tendeloo, G.; Amelinckx, S.; op de Beeck, M.; van Landuyt, J. Carbon nano-tubes: their formation process and observation by electron microscopy 1993 Journal of crystal growth 130 190 UA library record; WoS full record; WoS citing articles doi
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging 1991 UA library record
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry 1991 Journal of crystal growth 110 40 UA library record; WoS full record; WoS citing articles
Luyten, W.; Volkov, V.V.; van Landuyt, J.; Amelinckx, S.; Férauge, C.; Gijbels, R.; Vasilev, M.G.; Shelyakin, A.A.; Lazarev, V.B. Electron microscopy and mass-spectrometry study of In0.72Ga0.28As0.62P0.38 lasers grown by liquid phase epitaxy 1993 Physica status solidi: A: applied research 140 3 UA library record; WoS full record; WoS citing articles doi
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; Mommaert, C.; Severne, G. Radiation defects and ordered radiation patterns in Ni and Ni4Mo: a study by electron microscopy 1993 Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 67 1 UA library record; https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1993; WoS full record; WoS citing articles pdf doi
Zhang, X.B.; Zhang, X.F.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. The reciprocal space of carbon tubes: a detailed interpretation of the electron diffraction effects 1994 Ultramicroscopy 54 59 UA library record; WoS full record; WoS citing articles doi
Vanhellemont, J.; Maes, H.E.; Schaekers, M.; Armigliato, A.; Cerva, H.; Cullis, A.; de Sande, J.; Dinges, H.; Hallais, J.; Nayar, V.; Pickering, C.; Stehlé, J.L.; Van Landuyt, J.; Walker, C.; Werner, H.; Salieri, P.; Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry 1993 Applied surface science T2 – SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE 63 13 UA library record; WoS full record; WoS citing articles pdf doi
Udoh, K.-I.; El- Araby, A.M.; Tanaka, Y.; Hisatsune, K.; Yasuda, K.; Van Tendeloo, G.; van Landuyt, J. Structural aspects of AuCu I or AuCu II and a cuboidal black configuration of f.c.c. disordered phase in AuCu-Pt and AuCu-Ag pseudobinary alloys 1995 Materials science and engineering: part A: structural materials: properties, microstructure and processing 203 15 UA library record; WoS full record; WoS citing articles doi
Bernaerts, D.; Amelinckx, S.; Zhang, X.B.; Van Tendeloo, G.; van Landuyt, J. Structural aspects of carbon nanotubes 1995 UA library record
Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. Structural characterisation of erbium silicide thin films of an Si(111) substrate 1996 Journal of alloys and compounds 234 14 UA library record; WoS full record; WoS citing articles pdf doi
Shpanchenko, R.V.; Nistor, L.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. Structural studies on new ternary oxides Ba8Ta4Ti3O24 and Ba10Ta7.04Ti1.2O30 1995 Journal of solid state chemistry 114 23 UA library record; WoS full record; WoS citing articles pdf doi
Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C. EM study of sensitisation of silver halide grains 1994 Icem 13 UA library record; WoS full record;
Zhang, X.F.; Zhang, X.B.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Werner, H. A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60 1994 Ultramicroscopy 55 2 UA library record; WoS full record; WoS citing articles pdf doi
Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. Some examples of electron microscopy studies of microstructures and phase transitions in solids 1995 Meccanica 30 1 UA library record; WoS full record; WoS citing articles doi
Bernaerts, D.; Zhang, X.B.; Zhang, X.F.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. HREM study of Rb6C60 and helical carbon nanotubules 1994 Icem 13 UA library record
Nistor, L.C.; van Landuyt, J.; Barton, J.D.; Hole, D.E.; Skelland, N.D.; Townsend, P.D. Colloid size distributions in ion implanted glass 1993 Journal of non-crystalline solids 162 63 UA library record; WoS full record; WoS citing articles doi
Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. A comparative investigation of replication techniques used for the study of (S+Au) sensitized AgBr microcrystals 1996 The journal of imaging science and technology 40 4 UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Landuyt, J.; Millan, A.; de Keyzer, R. Electron microscopical investigation of AgBr needle crystals 1995 Journal of crystal growth 151 14 UA library record; WoS full record; WoS citing articles doi
Deveirman, A.; van Landuyt, J.; Vanhellemont, J.; Maes, H.E.; Yallup, K. Defects in high-dose oxygen implanted silicon : a TEM study 1991 Vacuum: the international journal and abstracting service for vacuum science and technology T2 – 1ST SIOMX WORKSHOP ( SEPARATION BY IMPLANTATION OF OXYGEN ) ( SWI-88 ), NOV 07-08, 1988, UNIV SURREY, GUILDFORD, ENGLAND 42 4 UA library record; WoS full record; WoS citing articles pdf doi
Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. New method to determine the parity of the number of twin planes in tabular silver halide microcrystals from top views 1997 The journal of imaging science and technology 41 1 UA library record; WoS full record; WoS citing articles
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Bollen, D.; de Keyzer, R.; van Roost, C. Influence of twinning on the morphology of AgBr and AgCl microcrystals 2001 The journal of imaging science and technology 45 UA library record; WoS full record; WoS citing articles
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; van Roost, C.; de Keyzer, R. A TEM study of non-parallel twins inducing thickness growth in silver chloride {111} tabular crystals 2001 The journal of imaging science and technology 45 UA library record; WoS full record; WoS citing articles
Suvorov, A.V.; Lebedev, O.I.; Suvorova, A.A.; van Landuyt, J.; Usov, I.O. Defect characterization in high temperature implanted 6H-SiC using TEM 1997 Nuclear instruments and methods in physics research: B 127/128 17 UA library record; WoS full record; WoS citing articles doi
Goessens, C.; Schryvers, D.; van Landuyt, J. Transmission electron microscopy studies of (111) twinned silver halide microcrystals 1998 Microscopy research and technique 42 8 UA library record; WoS full record; WoS citing articles doi
Mihailescu, I.N.; Gyorgy, E.; Marin, G.; Popescu, M.; Teodorescu, V.S.; van Landuyt, J.; Grivas, C.; Hatziapostolou, A. Crystalline structure of very hard tungsten carbide thin films obtained by reactive pulsed laser deposition 1999 Journal of vacuum science and technology: A: vacuum surfaces and films 17 8 UA library record; WoS full record; WoS citing articles pdf doi
de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E. Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM 2001 Physica: B : condensed matter T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY 308 3 UA library record; WoS full record; WoS citing articles pdf doi
de Gryse, O.; Vanhellemont, J.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. A novel approach to analyse FTIR spectra of precipitates in boron-doped silicon 2003 Physica: B : condensed matter T2 – 22nd International Conference on Defects in Semiconductors (ICDS-22), JUL 28-AUG 01, 2003, UNIV AARHUS, AARHUS, DENMARK 340 4 UA library record; WoS full record; WoS citing articles doi
de Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon 1999 The review of scientific instruments 70 5 UA library record; WoS full record; WoS citing articles doi
Nistor, L.C.; van Landuyt, J. Structural studies of diamond thin films grown from the arc plasma 1998 Journal of materials research 12 13 UA library record; WoS full record; WoS citing articles
Ghica, C.; Nistor, L.; Bender, H.; Steegen, A.; Lauwers, A.; Maex, K.; van Landuyt, J. In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates 2001 Journal of materials research 16 4 UA library record; WoS full record; WoS citing articles doi
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