Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Nowak, M.P.; Szafran, B.; Peeters, F.M. |
Manipulation of two-electron states by the electric field in stacked self-assembled dots |
2008 |
Journal of physics : condensed matter |
20 |
5 |
UA library record; WoS full record; WoS citing articles |
Nguten, N.T.T.; Peeters, F.M. |
Many-body effects in the cyclotron resonance of a magnetic dot |
2009 |
Physical review : B : solid state |
80 |
6 |
UA library record; WoS full record; WoS citing articles |
Nikolaev, A.V.; Michel, K.H. |
Many electron- and hole terms of molecular ions C60n\pm |
2003 |
Coupling In Chemistry And Physics |
44 |
1 |
UA library record; WoS full record; WoS citing articles |
Schryvers, D. |
Martensitic and bainitic transformations in Ni-Al alloys |
1994 |
Journal de physique: 4 |
C2 |
|
UA library record |
Schryvers, D. |
Martensitic and related transformations in Ni-Al alloys |
1995 |
Journal de physique: 4
T2 – IIIrd European Symposium on Martensitic Transformations (ESOMAT 94), SEP 14-16, 1994, BARCELONA, SPAIN |
5 |
21 |
UA library record; WoS full record; WoS citing articles |
Zhang, H.; Salje, E.K.H.; Schryvers, D.; Bartova, B. |
The martensitic phase transition in Ni-Al: experimental observation of excess entropy and heterogeneous spontaneous strain |
2008 |
Journal of physics : condensed matter |
20 |
7 |
UA library record; WoS full record; WoS citing articles |
Schryvers, D.; Holland-Moritz, D. |
Martensitic transformations and microstructures in splat-cooled Ni-Al |
1999 |
Materials science and engineering: part A: structural materials: properties, microstructure and processing |
273/275 |
6 |
UA library record; WoS full record; WoS citing articles |
Schryvers, D.; Boullay, P.; Potapov, P.; Satto, C. |
Martensitic transformations studied on nano- and microscopic length scales |
2000 |
Festkörperprobleme |
40 |
|
UA library record |
Vodolazov, D.Y.; Peeters, F.M.; Morelle, M.; Moshchalkov, V.V. |
Masking effect of heat dissipation on the current-voltage characteristics of a mesoscopic superconducting sample with leads |
2005 |
Physical review : B : condensed matter and materials physics |
71 |
43 |
UA library record; WoS full record; WoS citing articles |
Gijbels, R.; van Straaten, M.; Bogaerts, A. |
Mass spectrometric analysis of inorganic solids: GDMS and other methods |
1995 |
Advances in mass spectrometry |
13 |
12 |
UA library record; WoS full record; WoS citing articles |
Adriaens, A.; Van 't dack, L.; Adams, F.; Gijbels, R. |
A mass spectrometric study of the dissolution behavior of sanidine |
1995 |
Microchimica acta |
120 |
1 |
UA library record; WoS full record; WoS citing articles |
Bogaerts, A.; Gijbels, R. |
Mathematical description of a direct current glow discharge in argon |
1996 |
Fresenius' journal of analytical chemistry |
355 |
12 |
UA library record; WoS full record; WoS citing articles |
Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. |
Matrix-enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films |
2005 |
Rapid communications in mass spectrometry |
19 |
24 |
UA library record; WoS full record; WoS citing articles |
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework |
2005 |
Ultramicroscopy |
104 |
70 |
UA library record; WoS full record; WoS citing articles |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example |
2005 |
Ultramicroscopy |
104 |
37 |
UA library record; WoS full record; WoS citing articles |
Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. |
Measurement of specimen thickness by phase change determination in TEM |
2008 |
Ultramicroscopy |
108 |
2 |
UA library record; WoS full record; WoS citing articles |
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R.; Waag, A. |
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography |
2005 |
Applied Physics Letters |
86 |
5 |
UA library record; WoS full record; WoS citing articles |
Hendrich, C.; Favre, L.; Ievlev, D.N.; Dobrynin, A.N.; Bras, W.; Hörmann, U.; Piscopiello, E.; Van Tendeloo, G.; Lievens, P.; Temst, K. |
Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering |
2007 |
Applied physics A : materials science & processing |
86 |
11 |
UA library record; WoS full record; WoS citing articles |
Felten, A.; Gillon, X.; Gulas, M.; Pireaux, J.-J.; Ke, X.; Van Tendeloo, G.; Bittencourt, C.; Najafi, E.; Hitchcock, A.P. |
Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy |
2010 |
ACS nano |
4 |
26 |
UA library record; WoS full record; WoS citing articles |
Biermans, E.; Molina, L.; Batenburg, K.J.; Bals, S.; Van Tendeloo, G. |
Measuring porosity at the nanoscale by quantitative electron tomography |
2010 |
Nano letters |
10 |
79 |
UA library record; WoS full record; WoS citing articles |
Schryvers, D.; Tirry, W.; Yang, Z.Q.; |
Measuring strain fields and concentration gradients around Ni4Ti3 precipitates |
2006 |
Materials science and engineering A: structural materials properties microstructure and processing |
438 |
35 |
UA library record; WoS full record; WoS citing articles |
Potapov, P.L.; Schryvers, D. |
Measuring the absolute position of EELS ionisation edges in a TEM |
2004 |
Ultramicroscopy |
99 |
29 |
UA library record; WoS full record; WoS citing articles |
Kirilenko, D.A.; Dideykin, A.T.; Van Tendeloo, G. |
Measuring the corrugation amplitude of suspended and supported graphene |
2011 |
Physical review : B : condensed matter and materials physics |
84 |
31 |
UA library record; WoS full record; WoS citing articles |
Hervieu, M.; Michel, C.; Martin, C.; Huvé, M.; Van Tendeloo, G.; Maignan, A.; Pelloquin, D.; Goutenoire, F.; Raveau, B. |
Mécanismes de la non-stoechiométrie dans les nouveaux supraconducteurs à haute Tc |
1994 |
Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation |
4 |
|
UA library record; WoS full record; |
Çakir, D.; Peeters, F.M.; Sevik, C. |
Mechanical and thermal properties of h-MX2 (M = Cr, Mo, W; X = O, S, Se, Te) monolayers : a comparative study |
2014 |
Applied physics letters |
104 |
130 |
UA library record; WoS full record; WoS citing articles |
Salje, E.K.H.; Zhang, H.; Idrissi, H.; Schryvers, D.; Carpenter, M.A.; Moya, X.; Planes, A. |
Mechanical resonance of the austenite/martensite interface and the pinning of the martensitic microstructures by dislocations in Cu74.08Al23.13Be2.79 |
2009 |
Physical review: B: condensed matter and materials physics |
80 |
38 |
UA library record; WoS full record; WoS citing articles |
Li, Y.J.; Wang, J.J.; Ye, J.C.; Ke, X.X.; Gou, G.Y.; Wei, Y.; Xue, F.; Wang, J.; Wang, C.S.; Peng, R.C.; Deng, X.L.; Yang, Y.; Ren, X.B.; Chen, L.Q.; Nan, C.W.; Zhang, J.X.; |
Mechanical switching of nanoscale multiferroic phase boundaries |
2015 |
Advanced functional materials |
25 |
23 |
UA library record; WoS full record; WoS citing articles |
Zaghi, A.E.; Buffière, M.; Brammertz, G.; Batuk, M.; Lenaers, N.; Kniknie, B.; Hadermann, J.; Meuris, M.; Poortmans, J.; Vleugels, J. |
Mechanical synthesis of high purity Cu-In-Se alloy nanopowder as precursor for printed CISe thin film solar cells |
2014 |
Advanced powder technology |
25 |
10 |
UA library record; WoS full record; WoS citing articles |
Van Daele, B.; Van Tendeloo, G.; Derluyn, J.; Shrivastava, P.; Lorenz, A.; Leys, M.R.; Germain, M.; |
Mechanism for Ohmic contact formation on Si3N4 passivated AlGaN/GaN high-electron-mobility transistors |
2006 |
Applied physics letters |
89 |
15 |
UA library record; WoS full record; WoS citing articles |
Mahieu, S.; Ghekiere, P.; de Winter, G.; Heirwegh, S.; Depla, D.; de Gryse, R.; Lebedev, O.I.; Van Tendeloo, G. |
Mechanism of preferential orientation in sputter deposited titanium nitride and yttria-stabilized zirconia layers |
2005 |
Journal of crystal growth |
279 |
41 |
UA library record; WoS full record; WoS citing articles |