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Author	Title	Year	Publication	Volume	Times cited	Additional Links
de Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J.	Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon	1999	The review of scientific instruments	70	5	UA library record; WoS full record; WoS citing articles
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J.	Accurate infrared absorption measurement of interstitial and precipitated oxygen in p⁺ silicon wafers	1999	Microelectronic engineering	45		UA library record; WoS full record
Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J.	The study of high T_c-superconducting materials by electron microscopy and electron diffraction	1991	Superconductor science and technology T2 – SATELLITE CONF TO THE 19TH INTERNATIONAL CONF ON LOW TEMPERATURE PHYSICS : HIGH TEMPERATURE SUPERCONDUCTIVITY, AUG 13-15, 1990, QUEENS COLL, CAMBRIDGE, ENGLAND	4	2	UA library record; WoS full record; WoS citing articles
Teodorescu, V.S.; Mihailescu, I.N.; Gyorgy, E.; Luches, A.; Martino, M.; Nistor, L.C.; van Landuyt, J.; Hermann, J.	The study of a crater forming on the surface of a Ti target submitted to multipulse excimer laser irradiation under low pressure N₂	1996	Journal of modern optics	43	11	UA library record; WoS full record; WoS citing articles
Cassiers, K.; van der Voort, P.; Linssen, T.; Vansant, E.F.; Lebedev, O.; van Landuyt, J.	A counterion-catalyzed (S⁰H⁺)(X^-I⁺) pathway toward heat- and steam-stable mesostructured silica assembled from amines in acidic conditions	2003	The journal of physical chemistry : B : condensed matter, materials, surfaces, interfaces and biophysical	107	9	UA library record; WoS full record; WoS citing articles
Luyten, W.; Volkov, V.V.; van Landuyt, J.; Amelinckx, S.; Férauge, C.; Gijbels, R.; Vasilev, M.G.; Shelyakin, A.A.; Lazarev, V.B.	Electron microscopy and mass-spectrometry study of In_0.72Ga_0.28As_0.62P_0.38 lasers grown by liquid phase epitaxy	1993	Physica status solidi: A: applied research	140	3	UA library record; WoS full record; WoS citing articles
Ivanov, V.; Nagy, J.B.; Lambin, P.; Lucas, A.; Zhang, X.B.; Zhang, X.F.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.	The study of carbon nanotubules produced by catalytic method	1994	Chemical physics letters	223	405	UA library record; WoS full record; WoS citing articles
Xu, T.; Wang, P.; Fang, P.; Kan, Y.; Chen, L.; Vleugels, J.; Van der Biest, O.; van Landuyt, J.	Phase assembly and microstructure of CeO₂-doped ZrO₂ ceramics prepared by spark plasma sintering	2005	Journal of the European Ceramic Society	25	13	UA library record; WoS full record; WoS citing articles
Stuer, C.; van Landuyt, J.; Bender, H.; de Wolf, I.; Rooyackers, R.; Badenes, G.	Investigation by convergent beam electron diffraction of the stress around shallow trench isolation structures	2001	Journal of the electrochemical society	148	13	UA library record; WoS full record; WoS citing articles
Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B.	Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study	2000				UA library record; WoS full record;
Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A.	Structural characterisation of erbium silicide thin films of an Si(111) substrate	1996	Journal of alloys and compounds	234	14	UA library record; WoS full record; WoS citing articles
De Meulenaere, P.; van Dyck, D.; Van Tendeloo, G.; van Landuyt, J.	Dynamical electron diffraction in substitutionally disordered column structures	1995	Ultramicroscopy	60	14	UA library record; WoS full record; WoS citing articles
Nistor, L.C.; Nistor, S.V.; Dinca, G.; Georgeoni, P.; van Landuyt, J.; Manfredotti, C.; Vittone, E.	Microstructure and spectroscopy studies on cubic boron nitride synthesized under high-pressure conditions	2002	Journal of physics : condensed matter	14	7	UA library record; WoS full record; WoS citing articles
Volkov, V.V.; van Landuyt, J.; Marushkin, K.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A.	LPE growth and characterization of InGaAsP/InP heterostructures: IR-emitting diodes at 1.66 μm: application to the remote monitoring of methane gas	1997	Sensors and actuators : A : physical	62	3	UA library record; WoS full record; WoS citing articles
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J.	Clustering of vacancies on {113} planes in Si layers close to Si-Si₃N₄ interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation	1999	Institute of physics conference series T2 – Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND			UA library record; WoS full record;
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J.	Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ electron irradiation in an HREM	1999	Physica status solidi: A: applied research T2 – International Conference on Extended Defects in Semiconductors (EDS 98), Sept. 06-11, 1998, Jaszowiec, Poland	171	40	UA library record; WoS full record; WoS citing articles
Zhang, X.F.; Zhang, X.B.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Werner, H.	A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb₆C₆₀	1994	Ultramicroscopy	55	2	UA library record; WoS full record; WoS citing articles
Romano-Rodriguez, A.; Perez-Rodriguez, A.; Serre, C.; van Landuyt, J.; et al.	Epitaxial growth of \beta-SiC on ion-beam synthesized \beta-SiC : structural characterization	2000	Materials science forum T2 – International Conference on Silicon Carbide and Related Materials, OCT 10-15, 1999, RES TRIANGLE PK, NORTH CAROLINA	338-3	2	UA library record; WoS full record; WoS citing articles
Muret, P.; Nguyen, T.T.A.; Frangis, N.; Van Tendeloo, G.; van Landuyt, J.	Photoelectric and electrical responses of several erbium silicide/silicon interfaces	1996	Applied surface science T2 – International Symposium on Si Heterostructures – From Physics to Devices, SEP 11-14, 1995, IRAKLION, GREECE	102	3	UA library record; WoS full record; WoS citing articles
de Gryse, O.; Vanhellemont, J.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C.	A novel approach to analyse FTIR spectra of precipitates in boron-doped silicon	2003	Physica: B : condensed matter T2 – 22nd International Conference on Defects in Semiconductors (ICDS-22), JUL 28-AUG 01, 2003, UNIV AARHUS, AARHUS, DENMARK	340	4	UA library record; WoS full record; WoS citing articles
De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C.	Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy	2002				UA library record; WoS full record;
de Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.I.; van Landuyt, J.; Simoen, E.; Claeys, C.	Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy	2004	Journal of the electrochemical society	151	13	UA library record; WoS full record; WoS citing articles
de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E.	Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM	2001	Physica: B : condensed matter T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY	308	3	UA library record; WoS full record; WoS citing articles
Gryse, O.D.; Clauws, P.; van Landuyt, J.; Lebedev, O.; Claeys, C.; Simoen, E.; Vanhellemont, J.	Oxide phase determination in silicon using infrared spectroscopy and transmission electron microscopy techniques	2002	Journal of applied physics	91	27	UA library record; WoS full record; WoS citing articles
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R.	The influence of crystal thickness on the image tone	2003	Journal of imaging science	47		UA library record; WoS full record; WoS citing articles
Teodorescu, V.S.; Nistor, L.C.; van Landuyt, J.; Dinescu, M.	TEM study of laser induced phase transition in iron thin films	1994	Materials research bulletin	29	2	UA library record; WoS full record; WoS citing articles
Hens, S.; Bender, H.; Donaton, R.A.; Maex, K.; Vanhaelemeersch, S.; van Landuyt, J.	EFTEM study of plasma etched low-k Si-O-C dielectrics	2001	Institute of physics conference series T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, UNIV OXFORD, OXFORD, ENGLAND			UA library record; WoS full record;
Schryvers, D.; Van Landuyt, J.	Electron microscopy study of twin sequences and branching in NissAl34 3R martensite	1992	ICOMAT
Bernaerts, D.; op de Beeck, M.; Amelinckx, S.; van Landuyt, J.; Van Tendeloo, G.	The chirality of carbon nanotubules determined by dark-field electron microscopy	1996	Philosophical magazine: A: physics of condensed matter: defects and mechanical properties	74	20	UA library record; WoS full record; WoS citing articles
Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C.	The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals	2000				UA library record; WoS full record;