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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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De Schutter, B.; Devulder, W.; Schrauwen, A.; van Stiphout, K.; Perkisas, T.; Bals, S.; Vantomme, A.; Detavernier, C. |
Phase formation in intermixed NiGe thin films : influence of Ge content and low-temperature nucleation of hexagonal nickel germanides |
2014 |
Microelectronic engineering |
120 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Peeters, F.M.; Reijniers, J.; Badalian, S.M.; Vasilopoulos, P. |
Snake orbits in hybrid semiconductor/ferromagnetic devices |
1999 |
Microelectronic engineering |
47 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Clima, S.; Govoreanu, B.; Jurczak, M.; Pourtois, G. |
HfOx as RRAM material : first principles insights on the working principles |
2014 |
Microelectronic engineering |
120 |
22 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Pathangi, H.; Cherman, V.; Khaled, A.; Sorée, B.; Groeseneken, G.; Witvrouw, A. |
Towards CMOS-compatible single-walled carbon nanotube resonators |
2013 |
Microelectronic engineering |
107 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Moors, K.; Sorée, B.; Magnus, W. |
Resistivity scaling in metallic thin films and nanowires due to grain boundary and surface roughness scattering |
2017 |
Microelectronic engineering |
167 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Clima, S.; Garbin, D.; Devulder, W.; Keukelier, J.; Opsomer, K.; Goux, L.; Kar, G.S.; Pourtois, G. |
Material relaxation in chalcogenide OTS SELECTOR materials |
2019 |
Microelectronic engineering |
215 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Leenaerts, O.; Partoens, B.; Peeters, F.M. |
Adsorption of small molecules on graphene |
2009 |
Microelectronics journal |
40 |
116 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Li, B.; Partoens, B.; Peeters, F.M.; Magnus, W. |
Dielectric mismatch effect on coupled impurity states in a freestanding nanowire |
2009 |
Microelectronics journal |
40 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Slachmuylders, A.F.; Partoens, B.; Magnus, W.; Peeters, F.M. |
Neutral shallow donors near a metallic interface |
2009 |
Microelectronics journal |
40 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Milton Pereira, J.; Vasilopoulos, P.; Peeters, F.M. |
Resonant tunneling in graphene microstructures |
2008 |
Microelectronics journal |
39 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Mlinar, V.; Peeters, F.M. |
Theoretical study of InAs/GaAs quantum dots grown on [11k] substrates in the presence of a magnetic field |
2006 |
Microelectronics journal |
37 |
|
UA library record; WoS full record |
|
|
|
Mlinar, V.; Peeters, F.M. |
Tuning of the optical properties of (11k) grown InAs quantum dots by the capping layer |
2008 |
Microelectronics journal |
39 |
|
UA library record; WoS full record |
|
|
|
Janssens, K.L.; Partoens, B.; Peeters, F.M. |
Type II quantum dots in magnetic fields: excitonic behaviour |
2003 |
Microelectronics journal |
34 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Analytical electron microscopy of silver halide photographic systems |
2000 |
Micron |
31 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Dyck, D.; Lobato, I.; Chen, F.-R.; Kisielowski, C. |
Do you believe that atoms stay in place when you observe them in HREM? |
2015 |
Micron |
68 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. |
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images |
2014 |
Micron |
63 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
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Felten, A.; Ghijsen, J.; Pireaux, J.-J.; Drube, W.; Johnson, R.L.; Liang, D.; Hecq, M.; Van Tendeloo, G.; Bittencourt, C. |
Electronic structure of Pd nanoparticles on carbon nanotubes |
2009 |
Micron |
40 |
44 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Béché, A.; Winkler, R.; Plank, H.; Hofer, F.; Verbeeck, J. |
Focused electron beam induced deposition as a tool to create electron vortices |
2015 |
Micron |
80 |
21 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bertoni, G.; Calmels, L. |
First-principles calculation of the electronic structure and energy loss near edge spectra of chiral carbon nanotubes |
2006 |
Micron |
37 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Ruelle, B.; Felten, A.; Ghijsen, J.; Drube, W.; Johnson, R.L.; Liang, D.; Erni, R.; Van Tendeloo, G.; Sophie, P.; Dubois, P.; Godfroid, T.; Hecq, M.; Bittencourt, C.; |
Functionalization of MWCNTs with atomic nitrogen |
2009 |
Micron |
40 |
24 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; den Dekker, A.J.; van Dyck, D. |
How to optimize the experimental design of quantitative atomic resolution TEM experiments? |
2004 |
Micron |
35 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Xu, Q.; Zandbergen, H.W.; van Dyck, D. |
Imaging from atomic structure to electronic structure |
2012 |
Micron |
43 |
|
UA library record; WoS full record |
|
|
|
Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. |
Model-based electron microscopy : from images toward precise numbers for unknown structure parameters |
2012 |
Micron |
43 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Kirilenko, D.A.; Dideykin, A.T.; Aleksenskiy, A.E.; Sitnikova, A.A.; Konnikov, S.G.; Vul', A.Y. |
One-step synthesis of a suspended ultrathin graphene oxide film: Application in transmission electron microscopy |
2015 |
Micron |
68 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Yang, Z.; Schryvers, D. |
Study of changes in composition and EELS ionization edges upon Ni4Ti3 precipitation in a NiTi alloy |
2006 |
Micron |
37 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Leroux, O.; Leroux, F.; Bagniewska-Zadworna,.; Knox, J.P.; Claeys, M.; Bals, S.; Viane, R.L.L. |
Ultrastructure and composition of cell wall appositions in the roots of Asplenium (Polypodiales) |
2011 |
Micron |
42 |
20 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Samaeeaghmiyoni, V.; Idrissi, H.; Groten, J.; Schwaiger, R.; Schryvers, D. |
Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach |
2017 |
Micron |
94 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Cooper, D.; Denneulin, T.; Bernier, N.; Béché, A.; Rouvière, J.-L. |
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope |
2016 |
Micron |
80 |
50 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Godet, M.; Vergès-Belmin, V.; Gauquelin, N.; Saheb, M.; Monnier, J.; Leroy, E.; Bourgon, J.; Verbeeck, J.; Andraud, C. |
Nanoscale investigation by TEM and STEM-EELS of the laser induced yellowing |
2018 |
Micron |
115 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
De Meyer, R.; Albrecht, W.; Bals, S. |
Effectiveness of reducing the influence of CTAB at the surface of metal nanoparticles during in situ heating studies by TEM |
2021 |
Micron |
144 |
|
UA library record; WoS full record |
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