|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
Jannis, D.; Velazco, A.; Béché, A.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process |
2022 |
Ultramicroscopy |
|
4 |
UA library record; WoS full record; WoS citing articles |
|
|
Denisov, N.; Jannis, D.; Orekhov, A.; Müller-Caspary, K.; Verbeeck, J. |
Characterization of a Timepix detector for use in SEM acceleration voltage range |
2023 |
Ultramicroscopy |
253 |
|
UA library record; WoS full record |
|
|
Van den Broek, W.; Jannis, D.; Verbeeck, J. |
Convexity constraints on linear background models for electron energy-loss spectra |
2023 |
Ultramicroscopy |
254 |
|
UA library record |
|
|
Van Rompaey, S.; Dachraoui, W.; Turner, S.; Podyacheva, O.Y.; Tan, H.; Verbeeck, J.; Abakumov, A.; Hadermann, J. |
Layered oxygen vacancy ordering in Nb-doped SrCo1-xFexO3-\delta perovskite |
2013 |
Zeitschrift für Kristallographie |
228 |
9 |
UA library record; WoS full record; WoS citing articles |
|