Records |
Author |
van Malderen, H.; Hoornaert, S.; Injuk, J.; Przybylowicz, W.J.; Pineda, C.A.; Prozesky, V.M.; Van Grieken, R. |
Title |
Individual particle characterization of Siberian aerosols by micro-PIXE and backscattering spectrometry |
Type |
A1 Journal article |
Year |
2001 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
30 |
Issue |
|
Pages |
320-329 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000171234700008 |
Publication Date |
2002-08-25 |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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UA library record; WoS full record; WoS citing articles |
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no |
Call Number |
UA @ admin @ c:irua:36084 |
Serial |
8080 |
Permanent link to this record |
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Author |
Van Dyck, P.; Markowicz, A.; Van Grieken, R. |
Title |
Influence of sample thickness, excitation energy and geometry on particle size effects in XRF |
Type |
A1 Journal article |
Year |
1985 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
14 |
Issue |
4 |
Pages |
183-187 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
Expressions are presented for calculating the matrix effect and the pure particle size effect in the XRF analysis of particulate samples with a discrete particle size. The equations are based on the absorption-weighted radiometric diameter concept. Two excitationdetection geometries are considered, with the angles between the sample plane and both the incident and emerging radiation being either 90° (π geometry) or 45° (π/2 geometry). Calculations were made for different sample loadings and exciting radiation energies. The influence of these parameters on the matrix and pure particle size effects is shown. From the results, it is possible to predict the performances of alternative experimental correction procedures for the particle size effect, involving dual measurements at different excitation energies or in different excitationdetection geometries. |
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Wos |
A1985ATB6100007 |
Publication Date |
2005-05-28 |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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UA library record; WoS full record; WoS citing articles |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:116486 |
Serial |
8097 |
Permanent link to this record |
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Author |
Van Grieken, R. |
Title |
Introducing four new members of the editorial board of X-ray spectrometry |
Type |
Editorial |
Year |
2015 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
44 |
Issue |
1 |
Pages |
1-2 |
Keywords |
Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000346727300001 |
Publication Date |
2014-12-22 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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UA library record; WoS full record |
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no |
Call Number |
UA @ admin @ c:irua:123608 |
Serial |
8119 |
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Author |
Van Grieken, R. |
Title |
Introducing John Campbell, the new regional editor for North America of X-Ray Spectrometry |
Type |
Editorial |
Year |
2014 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
43 |
Issue |
2 |
Pages |
67 |
Keywords |
Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000331386000001 |
Publication Date |
2014-02-07 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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UA library record; WoS full record |
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no |
Call Number |
UA @ admin @ c:irua:114470 |
Serial |
8120 |
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Author |
Ozen, S.A.; Ozkalayci, F.; Cevik, U.; Van Grieken, R. |
Title |
Investigation of heavy metal distributions along 15m soil profiles using EDXRF, XRD, SEM-EDX, and ICP-MS techniques |
Type |
A1 Journal article |
Year |
2018 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
47 |
Issue |
3 |
Pages |
231-241 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
The research of soil contamination by heavy metal is an important field due to its environmental and health implications. The goal was to study the elemental mobility as a function of depth. For this reason, the distribution of heavy metals (V, Cr, Co, Ni, Cu, Zn, As, Sn, and Pb) was investigated along soil profiles up to a depth of 15m at 9 sampling sites in the Nilufer industrial district (Bursa, Turkey). Elemental analyses were done with the Epsilon 5 energy dispersive X-ray fluorescence and inductively coupled plasma mass spectrometry equipment. Particle analysis was performed with a JEOL scanning electron microscope equipped with a Si(Li) X-ray detector. The crystallographic compositions of oxide compounds in soil samples were identified by a Rigaku X-ray diffraction instrument. Different parameters such as the soil's chemical (mineralogical structure, pH, and electrical conductivity) and physical properties (the number of blows, the stiffness index, the liquidity index, the plasticity index, and the water content) were analyzed. To assess the mobility of the heavy metals, diffusion (D) and convection coefficients (?) were calculated with the finite difference method. Convection was determined to dominate the studied region. In addition, the mobility coefficient was determined for each metal. High mobilities were determined for Zn and V, moderate mobilities for Cr, Ni, Cu, and As, and low mobilities were determined for Co and Pb. The results revealed that elements had reached depths of up to 15m, causing irreversible soil contamination that may lead to environmental health issues. |
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Wos |
000430188700005 |
Publication Date |
2018-03-09 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:150722 |
Serial |
8123 |
Permanent link to this record |
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Author |
Injuk, J.; Van Grieken, R. |
Title |
Literature trends in x-ray emission spectrometry in the period 1990-2000: a review |
Type |
A1 Journal article |
Year |
2003 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
32 |
Issue |
|
Pages |
35-39 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Wos |
000180811200006 |
Publication Date |
2005-01-19 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:40614 |
Serial |
8175 |
Permanent link to this record |
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Author |
Van Dyck, P.; Török, S.; Van Grieken, R. |
Title |
Monte Carlo simulation of backscattered peaks in secondary target energy-dispersive X-ray spectra |
Type |
A1 Journal article |
Year |
1986 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
15 |
Issue |
4 |
Pages |
231-238 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
A Monte Carlo simulation has been developed to describe the incoherent and coherent scatter processes for the complex geometry of a secondary target energy-dispersive x-ray fluorescence system. Photons are followed from the x-ray tube anode until the detection of scattered secondary target photons in the active Si layer of the detector. The program quantitatively shows the broadening of the incoherent scatter peak with increasing atomic number, and it models the incoherent peak shape adequately. The incoherent-to-coherent scatter intensity ratios obtained differ by 1030% from the theoretical values, while their dependence on the sample atomic number corresponds to that expected from theory. |
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Wos |
A1986E535600001 |
Publication Date |
2005-05-28 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:113612 |
Serial |
8280 |
Permanent link to this record |
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Author |
Van Grieken, R. |
Title |
New Chinese members of the Advisory Board of X-Ray Spectrometry |
Type |
A1 Journal article |
Year |
2006 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
35 |
Issue |
4 |
Pages |
205-206 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:58861 |
Serial |
8297 |
Permanent link to this record |
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Author |
Romero-Pastor, J.; Garcia-Porras, A.; Van Grieken, R.; Potgieter-Vermaak, S.; Coll-Conesa, J.; Cardell, C. |
Title |
New insights in technology characterization of medieval Valencia glazes |
Type |
A1 Journal article |
Year |
2015 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
44 |
Issue |
6 |
Pages |
426-435 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
This study shows the first Raman microscopy (RM) and scanning electron microscopy with energy dispersive X-ray spectroscopy (SEM-EDX) characterization of two 14th and 15th century lead-glazed and luster ceramics from the Manises and Paterna workshops (Valencia, Spain) produced after the Aragon Christian conquest of the Iberian Peninsula (14th century). According to experts, these coetaneous ceramics were most probably involved in a process of technological transfer from the Islamic area of Southeast Spain to the Christian area of Valencia (East Spain) at the beginning of the 14th century; later on, the celebrated Manises and Paterna workshops were formed. Although these ceramics have been studied widely in terms of production technology (ceramic body, glazes and luster) using an array of diverse analytical techniques, until now, an RM study has not been carried out. This paper presents results regarding the complex chemical composition of the glaze and luster coloring agents, and the quality of color manufacturing processes, elucidating firing conditions via spectral components analysis (i.e., Q(n) for stretching/bending components) and polymerization index (Ip), emphasizing chronology and pigment technology changes between both Valencian workshops. Coloring agents identified in glazes and lusters were cobalt present in blue glazes, copper in greenish glazes, copper and cobalt in the turquoise glaze, and pyrolusite in black glazes. Tin oxyde was used as an opacifier in white glazes. Two luster manufacture recipes were recognized mainly based on copper and silver compounds. Calculated firing temperatures were up to 1000 degrees C for white glazes and up to 600 degrees C for luster and color glazes. Copyright (c) 2015 John Wiley & Sons, Ltd. |
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Wos |
000363279600002 |
Publication Date |
2015-03-12 |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:129445 |
Serial |
8300 |
Permanent link to this record |
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Author |
Van Grieken, R. |
Title |
New members of the editorial board of X-ray Spectrometry |
Type |
A1 Journal article |
Year |
2013 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
42 |
Issue |
1 |
Pages |
1-2 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Corporate Author |
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Place of Publication |
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Wos |
000314971600001 |
Publication Date |
2012-12-22 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:104627 |
Serial |
8301 |
Permanent link to this record |
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Author |
Szalóki, I.; Osán, J.; Worobiec, A.; de Hoog, J.; Van Grieken, R. |
Title |
Optimization of experimental conditions of thin-window EPMA for ligh-element analysis of individual environmental particles |
Type |
A1 Journal article |
Year |
2001 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
30 |
Issue |
|
Pages |
143-155 |
Keywords |
A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000169194800003 |
Publication Date |
2005-01-24 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:34102 |
Serial |
8338 |
Permanent link to this record |
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Author |
Arana, A.; Loureiro, A.L.; Barbosa, H.M.J.; Van Grieken, R.; Artaxo, P. |
Title |
Optimized energy dispersive X-ray fluorescence analysis of atmospheric aerosols collected at pristine and perturbed Amazon Basin sites |
Type |
A1 Journal article |
Year |
2014 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
43 |
Issue |
4 |
Pages |
228-237 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
Elemental composition of aerosols is important to source apportionment studies and to understand atmospheric processes that influence aerosol composition. Energy dispersive X-ray fluorescence spectroscopy was applied for measuring the elemental composition of Amazonian atmospheric aerosols. The instrument used was a spectrometer Epsilon 5, PANalytical B. V., with tridimensional geometry that reduces the background signal with a polarized X-ray detection. The measurement conditions were optimized for low-Z elements, e. g. Mg, Al, Si, that are present at very low concentrations in the Amazon. From Na to K, our detection limits are about 50% to 75% lower than previously published results for similar instrument. Calibration was performed using Micromatter standards, except for P whose standard was produced by nebulization of an aqueous solution of KH2PO4 at our laboratory. The multi-element reference material National Institute of Standards and Technology-2783 (air particulate filter) was used for evaluating the accuracy of the calibration procedure of the 22 elements in our standard analysis routine, and the uncertainty associated with calibration procedures was evaluated. The overall performance of the instrument and validation of our measurements were assessed by comparison with results obtained from parallel analysis using particle-induced X-ray emission and another Epsilon 5 spectrometer. The elemental composition in 660 samples collected at a pristine site in the Amazon Basin and of 1416 samples collected at a site perturbed by land use change was determined. Our measurements show trace elements associated with biogenic aerosols, soil dust, biomass burning, and sea-salt, even for the very low concentrations as observed in Amazonia. Copyright (C) 2014 John Wiley & Sons, Ltd. |
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Wos |
000337724600006 |
Publication Date |
2014-06-09 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Open Access |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:118419 |
Serial |
8342 |
Permanent link to this record |
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Author |
Samek, L.; Injuk, J.; van Espen, P.; Van Grieken, R. |
Title |
Performance of a new compact EDXRF spectrometer for aerosol analysis |
Type |
A1 Journal article |
Year |
2002 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
31 |
Issue |
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Pages |
84-86 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
Abstract |
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Place of Publication |
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Wos |
000173653400015 |
Publication Date |
2002-10-06 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Open Access |
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no |
Call Number |
UA @ admin @ c:irua:36383 |
Serial |
8371 |
Permanent link to this record |
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Author |
Claes, M.; de Bokx, P.; Van Grieken, R. |
Title |
Progress in laboratory grazing emission X-ray fluorescence spectrometry |
Type |
A1 Journal article |
Year |
1999 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
28 |
Issue |
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Pages |
224-229 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Place of Publication |
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Editor |
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Language |
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Wos |
000081693400004 |
Publication Date |
2005-12-05 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Open Access |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:24715 |
Serial |
8423 |
Permanent link to this record |
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Author |
Markowicz, A.; Van Dyck, P.; Van Grieken, R. |
Title |
Radiometric diameter concept and exact intensities for spherical particles in x-ray fluorescence analysis |
Type |
A1 Journal article |
Year |
1980 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
9 |
Issue |
2 |
Pages |
52-56 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
In X-ray fluorescence analysis the concept of radiometric diameter, d, is often introduced in considerations of the fluorescent intensity from a particulate sample. It represents the mean geometric path of the X-rays through one particle and is usually simply taken to be equal to the volume-to-area ratio of the particle. The effective radiometric path is, however, itself dependent on geometry and absorption effects. Rigorous calculations of the fluorescent intensity from a particle in the π and π/2 geometries were carried out to evaluate the errors involved. It appears that, for π geometry, the discrepancy between these exact results and the intensity calculated via the use of d does not exceed 5.2%. For the π/2 geometry, the errors are much larger and can amount to 50% in realistic cases of X-ray fluorescence analysis. These conclusions are also applicable to monolayers. The effective radiometric diameter approaches d only when absorption effects become negligible, but is smaller in other cases. |
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Wos |
A1980JN16500003 |
Publication Date |
2005-05-28 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Open Access |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:116482 |
Serial |
8451 |
Permanent link to this record |
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Author |
Worobiec, A.; Kaplinski, A.; Van Grieken, R. |
Title |
Ruthenium staining as an alternative preparation method for automated EPMA of individual biogenic and organic particles |
Type |
A1 Journal article |
Year |
2005 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
34 |
Issue |
3 |
Pages |
245-252 |
Keywords |
A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Wos |
000229093000014 |
Publication Date |
2005-01-31 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Open Access |
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no |
Call Number |
UA @ admin @ c:irua:52229 |
Serial |
8488 |
Permanent link to this record |
|
|
|
Author |
Markowicz, A.; Storms, H.; Van Grieken, R. |
Title |
A simple absorption correction for electron probe X-ray microanalysis of bulk samples |
Type |
A1 Journal article |
Year |
1986 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
15 |
Issue |
2 |
Pages |
115-119 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
A simple procedure is proposed for the calculation of the absorption correction factor in electron-probe x-ray microanalysis. It is based on the concept of an effective depth of x-ray production, assuming a rectangular depth distribution function for x-ray generation. This effective x-ray production depth is expressed as a fraction of the x-ray excitation depth given by Whelan's expression. Adequate values for this fraction are presented. Two versions are considered. In the first the effective x-ray production is a function of both the characteristic x-ray energy and the atomic numbers of the matrix elements, whereas in the second one, which is indicated for routine use, the energy dependence is neglected. Calculations pointed to satisfactory results, even for low x-ray energies and high overvoltages. |
Address |
|
Corporate Author |
|
Thesis |
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Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
A1986C017300007 |
Publication Date |
2005-05-28 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:113872 |
Serial |
8524 |
Permanent link to this record |
|
|
|
Author |
Samek, L.; Ostachowicz, B.; Worobiec, A.; Spolnik, Z.; Van Grieken, R. |
Title |
Speciation of selected metals in aerosol samples by TXRF after sequential leaching |
Type |
A1 Journal article |
Year |
2006 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
35 |
Issue |
4 |
Pages |
226-231 |
Keywords |
A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
000239321500004 |
Publication Date |
2006-06-29 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:58901 |
Serial |
8572 |
Permanent link to this record |
|
|
|
Author |
Trincavelli, J.; Montoro, S.; van Espen, P.; Van Grieken, R. |
Title |
M\alpha/L\alpha intensity ratios for Ta, W, Pt, Au, Pb and Bi for electron energies in the 11-40 keV range |
Type |
A1 Journal article |
Year |
1993 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
22 |
Issue |
|
Pages |
372-376 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
Abstract |
Both energy- and wavelength-dispersive systems were used to obtain Malpha/Lalpha intensity ratios for Ta, W, Pt, Au, Pb and Bi at various overvoltages. A table of these ratios corrected for matrix absorption and detector efficiency is presented, in addition to an interpolatory function of Malpha/Lalpha generated ratios vs. overvoltage, for each element. In addition, three different ZAF correction models were used to predict both detected and generated ratios. Finally, experimental Mbeta/Malpha ratios measured at different overvoltages are presented for the six elements considered. |
Address |
|
Corporate Author |
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Thesis |
|
Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
A1993MB01200008 |
Publication Date |
2005-05-28 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:6221 |
Serial |
8649 |
Permanent link to this record |
|
|
|
Author |
Muia, L.M.; Van Grieken, R. |
Title |
Theoretical evaluation of the effective alpha and De Jongh approaches in X-ray fluorescence analysis of geological materials in borax glass beads |
Type |
A1 Journal article |
Year |
1989 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
18 |
Issue |
6 |
Pages |
259-262 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
An evaluation of the accuracy and suitability of the LachanceTraill algorithm using effective α-coefficients, and the De Jongh α approach for x-ray fluorescence analysis of borax glass beads prepared from geological material was performed. By using theoretical α-coefficients obtained from the same standard and calculated elemental intensities, the two algorithms were compared under identical conditions. When only the monitor standard is used, the LachanceTrail1 approach is found to be inferior to the De Jongh basic α method. If multi-standard calibration is performed for both approaches, the accuracies are almost identical and no significant difference is found in the results. The LachanceTraill algorithm has the advantage of being easier to implement on a minicomputer and, when used without standards, it is found to give results within a few percent of the true values, which is a useful indicator in the choice of appropriate standards for more accurate analytical work. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
A1989CE70800002 |
Publication Date |
2005-05-28 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:116490 |
Serial |
8660 |
Permanent link to this record |
|
|
|
Author |
Sauter, L.; Van der Ben, D.; Van Grieken, R. |
Title |
Trace analysis of estuarine brown algae by energy-dispersive X-ray fluorescence |
Type |
A1 Journal article |
Year |
1979 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
8 |
Issue |
4 |
Pages |
159-163 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
Brown algae, which are good indicators for estuarine metal pollution, can advantageously be analysed by energy-dispersive X-ray fluorescence. The use of thin film samples and samples of intermediate thickness has several advantages over the conventional thick pellet procedure. A quite homogeneous thin target is prepared by suspending 15 mg of dried and ground seaweed powder in bi-distilled water and evaporating the slurry on a 10 cm2 Mylar foil held in a Teflon ring. The effective sample weight in the beam is calculated by a procedure based on the scatter peaks in the spectrum. Sensitivities are typically in the 215 ppm range. The coefficient of variation per analysis averaged over ten elements amounts to 10%. The natural concentration variation in seaweed specimens at one location is 13%. Samples from locations in the more polluted western Scheldt estuary yield significantly higher values for several elements, relative to the eastern Scheldt sites. Possible trace element variations between the top and base of plants, and between different seaweed specimens and sampling seasons, are discussed. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
A1979JC63700003 |
Publication Date |
2005-05-28 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:116481 |
Serial |
8687 |
Permanent link to this record |
|
|
|
Author |
Muia, L.M.; Van Grieken, R. |
Title |
Use of theoretical accurate binary influence coefficients with Tertian's equation in X-ray fluorescence analysis of silicate rocks in borax glass beads |
Type |
A1 Journal article |
Year |
1990 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
19 |
Issue |
3 |
Pages |
141-144 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
A study of the suitability of the Tertian algorithm using new accurate binary influence coefficients and a comparison standard for x-ray fluorescence analysis of geological materials prepared as borax glass beads was performed. The algorithm was found to give satisfactory results for the analysis of four major components in geological materials. Even in the worst case, when there is a factor of 20 difference in the concentration in the specimen and a comparison standard, the algorithm gives results which differ from the true results by a factor of about 2. This makes the algorithm attractive as a diagnostic tool in analyses of unknown specimens and in the identification of appropriate standards. The binary coefficients are easily calculated so that the algorithm can be implemented on a minicomputer. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
A1990DJ47800009 |
Publication Date |
2005-05-28 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:116492 |
Serial |
8725 |
Permanent link to this record |
|
|
|
Author |
Janssens, K. |
Title |
EXRS2022 : the 2022 edition of the European X-ray Spectrometry conference, held in Bruges, Belgium |
Type |
Editorial |
Year |
2023 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
52 |
Issue |
6 |
Pages |
276-278 |
Keywords |
Editorial; Antwerp X-ray Imaging and Spectroscopy (AXIS) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
001043528400001 |
Publication Date |
2023-08-07 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record |
Impact Factor |
1.2 |
Times cited |
|
Open Access |
Not_Open_Access |
Notes |
|
Approved |
Most recent IF: 1.2; 2023 IF: 1.298 |
Call Number |
UA @ admin @ c:irua:198217 |
Serial |
8865 |
Permanent link to this record |
|
|
|
Author |
Fredrickx, P.; de Ryck, I.; Janssens, K.; Schryvers, D.; Petit, J.-P.; Döcking, H. |
Title |
EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments |
Type |
A1 Journal article |
Year |
2004 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
33 |
Issue |
5 |
Pages |
326-333 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
London |
Editor |
|
Language |
|
Wos |
000223880800002 |
Publication Date |
2004-04-01 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246;1097-4539; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
13 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.298; 2004 IF: 1.391 |
Call Number |
UA @ lucian @ c:irua:48786 |
Serial |
1076 |
Permanent link to this record |
|
|
|
Author |
Vekemans, B.; Janssens, K.; Vincze, L.; Aerts, A.; Adams, F.; Hertogen, J. |
Title |
Automated segmentation of μ-XRF image sets |
Type |
A1 Journal article |
Year |
1997 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
26 |
Issue |
|
Pages |
333-346 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
A1997YG79300005 |
Publication Date |
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.298; 1997 IF: 1.307 |
Call Number |
UA @ admin @ c:irua:18319 |
Serial |
5486 |
Permanent link to this record |
|
|
|
Author |
Proost, K.; Vincze, L.; Janssens, K.; Gao, N.; Bulska, E.; Schreiner, M.; Falkenberg, G. |
Title |
Characterization of a polycapillary lens for use in micro-XANES experiments |
Type |
A1 Journal article |
Year |
2003 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
32 |
Issue |
3 |
Pages |
215-222 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
000183630400007 |
Publication Date |
2003-06-12 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
50 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.298; 2003 IF: 1.227 |
Call Number |
UA @ admin @ c:irua:41804 |
Serial |
5502 |
Permanent link to this record |
|
|
|
Author |
van der Linden, V.; Schalm, O.; Houbraken, J.; Thomas, M.; Meesdom, E.; Devos, A.; van Dooren, R.; Nieuwdorp, H.; Janssen, E.; Janssens, K. |
Title |
Chemical analysis of 16th to 19th century Limoges School painted enamel objects in three museums of the Low Countries |
Type |
A1 Journal article |
Year |
2010 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
39 |
Issue |
2 |
Pages |
112-121 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
In this study, the results of analysing of a series of 16th-19th century painted enamel objects of the Limoges School currently in collections in three Dutch and Flemish museums by means of portable and micro x-ray fluorescence analysis (PXRF and µ-XRF) and electron probe micro analysis (EPMA) are presented. The aim of the investigation was the authentication of specific pieces. Therefore, the glass compositions as well as the (glass) colouring agents used by the Limoges' artists were studied as a function of the age of the objects. Due to the evolution of these properties, it is possible to approximately date these objects based on their chemical composition. The complete émail peint collection of the Museum Boijmans-Van Beuningen (Rotterdam, The Netherlands), consisting of 20 émail peint plaques, was analysed with µ-XRF. Quantitative information was obtained by EPMA analysis of 15 enamel fragments of objects from museum and private collections in the Low Countries. PXRF analyses were performed on the painted enamel collection of the Antwerp Vleeshuis Museum (13 objects) and the Mayer van den Bergh Museum (4 objects) and on a set of 18 plaques that were donated to the Boijmans-Van Beuningen Museum by a private collector. The results obtained by means of EPMA, µ-XRF and PXRF proved to be useful in the discrimination of 16th century painted enamel objects from those of the19th century. From a total of 70 objects examined, 2 objects (OM964A and OM993) featured a chemical signature that deviated from the published literature composition and pigment use consistent with its presumed period of manufacture. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
000275959400007 |
Publication Date |
2009-08-11 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
8 |
Open Access |
|
Notes |
; ; |
Approved |
Most recent IF: 1.298; 2010 IF: 1.661 |
Call Number |
UA @ admin @ c:irua:82325 |
Serial |
5509 |
Permanent link to this record |
|
|
|
Author |
Bichlmeier, S.; Janssens, K.; Heckel, J.; Hoffmann, P.; Ortner, H.M. |
Title |
Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer |
Type |
A1 Journal article |
Year |
2002 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
31 |
Issue |
1 |
Pages |
87-91 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
000173653400016 |
Publication Date |
2002-10-06 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
12 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.298; 2002 IF: 1.574 |
Call Number |
UA @ admin @ c:irua:36670 |
Serial |
5529 |
Permanent link to this record |
|
|
|
Author |
Bichlmeier, S.; Janssens, K.; Heckel, J.; Gibson, D.; Hoffmann, P.; Ortner, H.M. |
Title |
Component selection for a compact micro-XRF spectrometer |
Type |
A1 Journal article |
Year |
2001 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
30 |
Issue |
|
Pages |
8-14 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
000166923700003 |
Publication Date |
2002-08-25 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
33 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.298; 2001 IF: 1.414 |
Call Number |
UA @ admin @ c:irua:36126 |
Serial |
5534 |
Permanent link to this record |
|
|
|
Author |
Somogyi, A.; Drakopoulos, M.; Vincze, L.; Vekemans, B.; Camerani, C.; Janssens, K.; Snigirev, A.; Adams, F. |
Title |
ID18F: a new micro-X-ray fluorescence end-station at the European Synchrotron Radiation Facility (ESRF): preliminary results |
Type |
A1 Journal article |
Year |
2001 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
30 |
Issue |
|
Pages |
242-252 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
000170089700006 |
Publication Date |
2002-09-11 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
76 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.298; 2001 IF: 1.414 |
Call Number |
UA @ admin @ c:irua:34062 |
Serial |
5647 |
Permanent link to this record |