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Author Title Year Publication Volume Times cited Additional Links
Van Aert, S.; den Dekker, A.J.; van Dyck, D. How to optimize the experimental design of quantitative atomic resolution TEM experiments? 2004 Micron 35 14 UA library record; WoS full record; WoS citing articles
Xu, Q.; Zandbergen, H.W.; van Dyck, D. Imaging from atomic structure to electronic structure 2012 Micron 43 UA library record; WoS full record
Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. Model-based electron microscopy : from images toward precise numbers for unknown structure parameters 2012 Micron 43 7 UA library record; WoS full record; WoS citing articles
Kirilenko, D.A.; Dideykin, A.T.; Aleksenskiy, A.E.; Sitnikova, A.A.; Konnikov, S.G.; Vul', A.Y. One-step synthesis of a suspended ultrathin graphene oxide film: Application in transmission electron microscopy 2015 Micron 68 13 UA library record; WoS full record; WoS citing articles
Yang, Z.; Schryvers, D. Study of changes in composition and EELS ionization edges upon Ni4Ti3 precipitation in a NiTi alloy 2006 Micron 37 10 UA library record; WoS full record; WoS citing articles
Leroux, O.; Leroux, F.; Bagniewska-Zadworna,.; Knox, J.P.; Claeys, M.; Bals, S.; Viane, R.L.L. Ultrastructure and composition of cell wall appositions in the roots of Asplenium (Polypodiales) 2011 Micron 42 20 UA library record; WoS full record; WoS citing articles
Samaeeaghmiyoni, V.; Idrissi, H.; Groten, J.; Schwaiger, R.; Schryvers, D. Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach 2017 Micron 94 11 UA library record; WoS full record; WoS citing articles
Cooper, D.; Denneulin, T.; Bernier, N.; Béché, A.; Rouvière, J.-L. Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope 2016 Micron 80 50 UA library record; WoS full record; WoS citing articles
Godet, M.; Vergès-Belmin, V.; Gauquelin, N.; Saheb, M.; Monnier, J.; Leroy, E.; Bourgon, J.; Verbeeck, J.; Andraud, C. Nanoscale investigation by TEM and STEM-EELS of the laser induced yellowing 2018 Micron 115 9 UA library record; WoS full record; WoS citing articles
De Meyer, R.; Albrecht, W.; Bals, S. Effectiveness of reducing the influence of CTAB at the surface of metal nanoparticles during in situ heating studies by TEM 2021 Micron 144 UA library record; WoS full record
Leenaerts, O.; Partoens, B.; Peeters, F.M. Adsorption of small molecules on graphene 2009 Microelectronics journal 40 116 UA library record; WoS full record; WoS citing articles
Li, B.; Partoens, B.; Peeters, F.M.; Magnus, W. Dielectric mismatch effect on coupled impurity states in a freestanding nanowire 2009 Microelectronics journal 40 4 UA library record; WoS full record; WoS citing articles
Slachmuylders, A.F.; Partoens, B.; Magnus, W.; Peeters, F.M. Neutral shallow donors near a metallic interface 2009 Microelectronics journal 40 1 UA library record; WoS full record; WoS citing articles
Milton Pereira, J.; Vasilopoulos, P.; Peeters, F.M. Resonant tunneling in graphene microstructures 2008 Microelectronics journal 39 9 UA library record; WoS full record; WoS citing articles
Mlinar, V.; Peeters, F.M. Theoretical study of InAs/GaAs quantum dots grown on [11k] substrates in the presence of a magnetic field 2006 Microelectronics journal 37 UA library record; WoS full record
Mlinar, V.; Peeters, F.M. Tuning of the optical properties of (11k) grown InAs quantum dots by the capping layer 2008 Microelectronics journal 39 UA library record; WoS full record
Janssens, K.L.; Partoens, B.; Peeters, F.M. Type II quantum dots in magnetic fields: excitonic behaviour 2003 Microelectronics journal 34 1 UA library record; WoS full record; WoS citing articles
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers 1999 Microelectronic engineering 45 UA library record; WoS full record
Lujan, G.S.; Magnus, W.; Sorée, B.; Ragnarsson, L.A.; Trojman, L.; Kubicek, S.; De Gendt, S.; Heyns, A.; De Meyer, K. Barrier permeation effects on the inversion layer subband structure and its applications to the electron mobility 2005 Microelectronic engineering 80 1 UA library record; WoS full record; WoS citing articles
Pourtois, G.; Lauwers, A.; Kittl, J.; Pantisano, L.; Sorée, B.; De Gendt, S.; Magnus, W.; Heyns, A.; Maex, K. First-principle calculations on gate/dielectric interfaces : on the origin of work function shifts 2005 Microelectronic engineering 80 31 UA library record; WoS full record; WoS citing articles
Peeters, F.M.; Schweigert, V.A.; Deo, P.S. Mesoscopic superconducting disks: fluxoids in a box 1999 Microelectronic engineering 47 1 UA library record; WoS full record; WoS citing articles
De Schutter, B.; Devulder, W.; Schrauwen, A.; van Stiphout, K.; Perkisas, T.; Bals, S.; Vantomme, A.; Detavernier, C. Phase formation in intermixed NiGe thin films : influence of Ge content and low-temperature nucleation of hexagonal nickel germanides 2014 Microelectronic engineering 120 9 UA library record; WoS full record; WoS citing articles
Peeters, F.M.; Reijniers, J.; Badalian, S.M.; Vasilopoulos, P. Snake orbits in hybrid semiconductor/ferromagnetic devices 1999 Microelectronic engineering 47 6 UA library record; WoS full record; WoS citing articles
Clima, S.; Govoreanu, B.; Jurczak, M.; Pourtois, G. HfOx as RRAM material : first principles insights on the working principles 2014 Microelectronic engineering 120 22 UA library record; WoS full record; WoS citing articles
Pathangi, H.; Cherman, V.; Khaled, A.; Sorée, B.; Groeseneken, G.; Witvrouw, A. Towards CMOS-compatible single-walled carbon nanotube resonators 2013 Microelectronic engineering 107 6 UA library record; WoS full record; WoS citing articles
Moors, K.; Sorée, B.; Magnus, W. Resistivity scaling in metallic thin films and nanowires due to grain boundary and surface roughness scattering 2017 Microelectronic engineering 167 6 UA library record; WoS full record; WoS citing articles
Clima, S.; Garbin, D.; Devulder, W.; Keukelier, J.; Opsomer, K.; Goux, L.; Kar, G.S.; Pourtois, G. Material relaxation in chalcogenide OTS SELECTOR materials 2019 Microelectronic engineering 215 1 UA library record; WoS full record; WoS citing articles
Adriaens, A.; Van 't dack, L.; Adams, F.; Gijbels, R. A mass spectrometric study of the dissolution behavior of sanidine 1995 Microchimica acta 120 1 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Bertoni, G. Model-based quantification of EELS: is standardless quantification possible? 2008 Microchimica acta 161 5 UA library record; WoS full record; WoS citing articles
Van 't dack, L.; Gijbels, R.; Walker, C.T. Modern developments and applications in microbeam analysis: proceedings of the 10th Workshop of the European Microbeam Analysis Society (EMAS), Antwerp, Belgium, May 6-10, 2007 2008 Microchimica acta 161 1 UA library record; WoS full record; WoS citing articles