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Abstract |
Over the years, electron microscopes (EM) have evolved from basic imaging and magnification tools into versatile characterization instruments. They are now capable of reaching atomic resolution, reconstructing nanoparticles down to the atomic-position level, capturing dynamic processes in real time, resolving internal strains in crystal structures, and obtaining chemical compositions of various materials and alloys, among others. All the applications mentioned above are largely enabled by the multidimensionality that can be achieved with the active elements within the EM column, i.e., the ability to control the electron wavefront as it propagates before and after its interaction with the sample. However, this multidimensionality is relatively limited compared to what can be achieved in other fields, such as light optics. There, the spatial light modulator (SLM) has revolutionized the field by introducing a position-dependent phase shift in the wavefront. In contrast, wavefront shaping in electron microscopy is significantly constrained by the spatial and physical limitations imposed on its active elements. Building on the capabilities provided by the multidimensional nature of the EM and motivated by the advancements in optics introduced by SLMs, the primary goal of this work is to develop a tool that enhances the multi-dimensional manipulation of wavefronts in electron optics. After designing and characterizing a spatial electron modulator (electrostatic phase plate), we will discuss the potential applications of this advanced wavefront shaping technology. Integrating this technology into the EM could enhance its capabilities and address current challenges in phase retrieval and the characterization of soft matter. |
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