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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Vijayakumar, J.; Savchenko, T.M.; Bracher, D.M.; Lumbeeck, G.; Béché, A.; Verbeeck, J.; Vajda, Š.; Nolting, F.; Vaz, Ca.f.; Kleibert, A. Absence of a pressure gap and atomistic mechanism of the oxidation of pure Co nanoparticles 2023 Nature communications 14 1 UA library record; WoS full record; WoS citing articles url doi
Poulain, R.; Lumbeeck, G.; Hunka, J.; Proost, J.; Savolainen, H.; Idrissi, H.; Schryvers, D.; Gauquelin, N.; Klein, A. Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism 2022 ACS applied electronic materials 4 UA library record; WoS full record; WoS citing articles pdf doi
Lumbeeck, G.; Delvaux, A.; Idrissi, H.; Proost, J.; Schryvers, D. Analysis of internal stress build-up during deposition of nanocrystalline Ni thin films using transmission electron microscopy 2020 Thin solid films : an international journal on the science and technology of thin and thick films 707 UA library record; WoS full record; WoS citing articles url doi
Delvaux, A.; Lumbeeck, G.; Idrissi, H.; Proost, J. Effect of microstructure and internal stress on hydrogen absorption into Ni thin film electrodes during alkaline water electrolysis 2020 Electrochimica Acta 340 2 UA library record; WoS full record; WoS citing articles pdf doi
Idrissi, H.; Samaee, V.; Lumbeeck, G.; Werf, T.; Pardoen, T.; Schryvers, D.; Cordier, P. In Situ Quantitative Tensile Testing of Antigorite in a Transmission Electron Microscope 2020 Journal Of Geophysical Research-Solid Earth 125 UA library record; WoS full record; WoS citing articles pdf url doi
Ding, L.; Raskin, J.-P.; Lumbeeck, G.; Schryvers, D.; Idrissi, H. TEM investigation of the role of the polycrystalline-silicon film/substrate interface in high quality radio frequency silicon substrates 2020 Materials Characterization 161 UA library record; WoS full record; WoS citing articles pdf url doi
Tran Phong Le, P.; Hofhuis, K.; Rana, A.; Huijben, M.; Hilgenkamp, H.; Rijnders, G.A.J.H.M.; ten Elshof, J.E.; Koster, G.; Gauquelin, N.; Lumbeeck, G.; Schuessler-Langeheine, C.; Popescu, H.; Fortuna, F.; Smit, S.; Verbeek, X.H.; Araizi-Kanoutas, G.; Mishra, S.; Vaskivskyi, I.; Duerr, H.A.; Golden, M.S. Tailoring vanadium dioxide film orientation using nanosheets : a combined microscopy, diffraction, transport, and soft X-ray in transmission study 2020 Advanced Functional Materials 30 1 UA library record; WoS full record; WoS citing articles url doi
Retuerto, M.; Calle-Vallejo, F.; Pascual, L.; Lumbeeck, G.; Fernandez-Diaz, M.T.; Croft, M.; Gopalakrishnan, J.; Pena, M.A.; Hadermann, J.; Greenblatt, M.; Rojas, S. La1.5Sr0.5NiMn0.5Ru0.5O6 double perovskite with enhanced ORR/OER bifunctional catalytic activity 2019 ACS applied materials and interfaces 11 12 UA library record; WoS full record; WoS citing articles pdf doi
Idrissi, H.; Samaee, V.; Lumbeeck, G.; van der Werf, T.; Pardoen, T.; Schryvers, D.; Cordier, P. Supporting data for “In situ Quantitative Tensile Tests on Antigorite in a Transmission Electron Microscope” 2019 UA library record doi
Lumbeeck, G. Mechanisms of nano-plasticity in as-deposited and hydrided nanocrystalline Pd and Ni thin films 2019 UA library record url
Lumbeeck, G.; Idrissi, H.; Amin-Ahmadi, B.; Favache, A.; Delmelle, R.; Samaee, V.; Proost, J.; Pardoen, T.; Schryvers, D. Effect of hydriding induced defects on the small-scale plasticity mechanisms in nanocrystalline palladium thin films 2018 Journal Of Applied Physics 124 2 UA library record; WoS full record; WoS citing articles pdf url doi
Guzzinati, G.; Altantzis, T.; Batuk, M.; De Backer, A.; Lumbeeck, G.; Samaee, V.; Batuk, D.; Idrissi, H.; Hadermann, J.; Van Aert, S.; Schryvers, D.; Verbeeck, J.; Bals, S. Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp 2018 Materials 11 15 UA library record; WoS full record; WoS citing articles url doi
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