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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. Imaging TOF-SIMS for the surface analysis of silver halide microcrystals 2003 Applied surface science 203/204 7 UA library record; WoS full record; WoS citing articles doi
Verlinden, G.; Gijbels, R.; Geuens, I. Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS 2002 Microscopy and microanalysis 8 1 UA library record; WoS full record; WoS citing articles doi
Lenaerts, J.; Verlinden, G.; Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Geuens, I. Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS) 2001 Fresenius' journal of analytical chemistry 370 3 UA library record; WoS full record; WoS citing articles doi
Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I.; Callant, P. Exchange of fluorinated cyanine dyes between different types of silver halide microcrystals studied by imaging time-of-flight secondary ion mass spectrometry 2001 Langmuir 17 8 UA library record; WoS full record; WoS citing articles doi
Verlinden, G.; Gijbels, R.; Geuens, I. Photographic materials 2001 UA library record
Charlier, E.; van Doorselaer, M.; Gijbels, R.; de Keyzer, R.; Geuens, I. Unveiling the composition of sulphur sensitization specks by their interactions with TAI 2000 Journal Of Imaging Science And Technology 44 16 UA library record; WoS full record; WoS citing articles
Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I. TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates 2000 UA library record
Lenaerts, J.; Verlinden, G.; Gijbels, R.; Geuens, I.; Callant, P. The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS) 2000 UA library record; WoS full record;
Gijbels, R.; Verlinden, G.; Geuens, I. SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification 2000 UA library record; WoS full record;
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling 2000 UA library record
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) 1999 Journal of analytical atomic spectrometry 14 10 UA library record; WoS full record; WoS citing articles doi
de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. Characterization of AgxAuy nano particles by TEM and STEM 1999 Journal of analytical atomic spectrometry 14 2 UA library record; WoS full record; WoS citing articles doi
Verlinden, G.; Gijbels, R.; Geuens, I. Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals 1999 Journal of the American Society for Mass Spectrometry 10 4 UA library record; WoS full record; WoS citing articles doi
Gregory, C.L.; Nullens, H.A.; Gijbels, R.H.; van Espen, P.J.; Geuens, I.; de Keyzer, R. Automated particle analysis of populations of silver halide microcrystals by electron probe microanalysis under cryogenic conditions 1998 Analytical chemistry 70 12 UA library record; WoS full record; WoS citing articles doi
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) 1998 UA library record
Verlinden, G.; Gijbels, R.; Geuens, I. Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods 1998 UA library record
de Vyt, A.; Gijbels, R.; van Roost, C.; Geuens, I. Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1 1998 UA library record
Vanwelkenhuysen, I.; Gijbels, R.; Geuens, I. Influence of the temperature on the morphology of silver behenate microcrystals 1998 UA library record
Verlinden, G.; Gijbels, R.; Geuens, I.; Benninghoven, A. Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals 1998 UA library record
Verlinden, G.; Janssens, G.; Gijbels, R.; van Espen, P.; Geuens, I. Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis 1997 Analytical chemistry 69 6 UA library record; WoS full record; WoS citing articles doi
Verlinden, G.; Gijbels, R.; Brox, O.; Benninghoven, A.; Geuens, I.; de Keyzer, R. Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS) 1997 UA library record; WoS full record;
Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy 1997 Journal of microscopy 188 6 UA library record; WoS full record; WoS citing articles
Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe 1996 UA library record
Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R. A temperature study of mixed AgBr-AgBrI tabular crystals 1995 3 UA library record; WoS full record; WoS citing articles
Geuens, I.; Gijbels, R.; Dekeyzer, R.; Verbeeck, A. Micro and surface analysis of individual silver halide microcrystals using a scanning ion microprobe 1994 Papers UA library record; WoS full record;
Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. The chemical characterization of silver halide microcrystals 1993 UA library record
Geuens, I.; Nys, B.; Gijbels, R.; Jacob, W. Application of neural networks in image analysis: the classification of geometrical shapes 1993 CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology 10 UA library record
Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R. A temperature study of mixed AgBr-AgBrI tabular crystals 1992 UA library record
Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. Depth profiling of silver halide microcrystals 1992 UA library record
Geuens, I.; Gijbels, R.; Jacob, W.A.; Verbeeck, A.; de Keyzer, R. Analysis of silver halide microcrystals using different modes of a scanning transmission electron microscope and digital image processing 1992 The journal of imaging science and technology 36 10 UA library record; WoS full record; WoS citing articles
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