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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Cândido, L.; Rino, J.-P.; Studart, N.; Peeters, F.M. |
Classical model of clusters of screened charges in quantum dots |
1997 |
Brazilian journal of physics |
27 |
|
UA library record |
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Shi, J.M.; Farias, G.A.; Koenraad, P.M.; van de Stadt, A.F.W.; Peeters, F.M.; Wolter, J.H.; Devreese, J.T. |
Correlation effects of DX centers on electron mobility in delta doped semiconductors investigated by Monte Carlo simulations |
1997 |
Brazilian journal of physics |
27 |
|
UA library record |
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van Vaeck, L.; Poels, K.; de Nollin, S.; Hachimi, A.; Gijbels, R. |
Laser microprobe mass spectrometry: principle and applications in biology and medicine |
1997 |
Cell biology international |
21 |
6 |
UA library record; WoS full record; WoS citing articles |
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Fedina, L.; Lebedev, O.I.; Van Tendeloo, G.; van Landuyt, J. |
In-situ HREM irradiation study of point defect clustering in strained GexSi1-x/(001)Si heterostructure |
1997 |
Conference series of the Institute of Physics |
157 |
1 |
UA library record; WoS full record; WoS citing articles |
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Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
New intermediate defect configuration in Si studied by in situ HREM irradiation |
1997 |
Conference series of the Institute of Physics |
157 |
|
UA library record; WoS full record; |
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Vanhellemont, J.; Bender, H.; van Landuyt, J. |
TEM studies of processed Si device materials |
1997 |
Conference series of the Institute of Physics |
157 |
|
UA library record; WoS full record; |
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Janssens, K.; Adams, F. |
Microscopic X-ray fluorescence analysis at second and third generation synchrotron sources |
1997 |
Debye Institute synchrotron chronicle |
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UA library record |
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Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Obratzova, E.D.; Smolin, A.A. |
Nanocrystalline diamond films: transmission electron microscopy and Raman spectroscopy characterization |
1997 |
Diamond and related materials |
6 |
116 |
UA library record; WoS full record; WoS citing articles |
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Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Verhoeven, M.A.J.; Rijnders, A.J.H.M.; Blank, D.H.A. |
Study of ramp-type Josephson junctions by HREM |
1997 |
Electronic Applications; Vol 2: Large Scale And Power Applications |
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UA library record; WoS full record; |
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Jambers, W.; Van Grieken, R. |
Single particle characterisation of inorganic suspension in Lake Baikal |
1997 |
Environmental science and technology |
31 |
|
UA library record |
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Torfs, K.M.; Van Grieken, R.E.; Buzek, F. |
Use of stable isotope measurements to evaluate the origin of suphur in gypsum layers on limestone buildings |
1997 |
Environmental science and technology |
31 |
|
UA library record |
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Devouard, B.; Baronnet, A.; Van Tendeloo, G.; Amelinckx, S. |
First evidence of synthetic polygonal serpentines |
1997 |
European journal of mineralogy |
9 |
15 |
UA library record; WoS full record; WoS citing articles |
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Kato, H.; Peeters, F.M.; Ulloa, S.E. |
The remote Wigner polaron in a two-dimensional electron system |
1997 |
Europhysics letters |
40 |
5 |
UA library record; WoS full record; WoS citing articles |
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Goldoni, G.; Peeters, F.M. |
Wigner crystallization in quantum electron bilayers |
1997 |
Europhysics letters |
37 |
24 |
UA library record; WoS full record; WoS citing articles |
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Goldoni, G.; Peeters, F.M. |
Wigner crystallization in quantum electron bilayers: erratum |
1997 |
Europhysics letters |
38 |
7 |
UA library record; WoS full record; WoS citing articles |
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Gijbels, R.; Bogaerts, A. |
Recent trends in solids mass spectrometry: GDMS and other methods |
1997 |
Fresenius' journal of analytical chemistry |
359 |
5 |
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Gijbels, R. |
Three-dimensional modeling of a direct current glow discharge in argon: is it better than one-dimensional modeling? |
1997 |
Fresenius' journal of analytical chemistry |
359 |
9 |
UA library record; WoS full record; WoS citing articles |
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Vasiliev, A.L.; Stepantsov, E.A.; Ivanov, Z.G.; Olsson, E.; Verbist, K.; Van Tendeloo, G. |
Structure of artificial grain boundaries in sapphire bicrystals with intermediate layers |
1997 |
Interface science |
5 |
3 |
UA library record; WoS full record; WoS citing articles |
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Seo, J.W.; Schryvers, D. |
Defect structures in CuZr martensite, studies by CTEM and HRTEM |
1997 |
Journal de physique: 4 |
C5 |
1 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D. |
Electron microscopy studies of martensite microstructures |
1997 |
Journal de physique: 4 |
C5 |
2 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Yandouzi, M.; Holland-Moritz, D.; Toth, L. |
HRTEM study of austenite and martensite in splat-cooled and nanoscale thin film Ni-Al |
1997 |
Journal de physique: 4 |
C5 |
2 |
UA library record; WoS full record; WoS citing articles |
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Blank, D.H.A.; Rijnders, A.J.H.M.; Verhoeven, M.A.J.; Bergs, R.M.H.; Rogalla, H.; Verbist, K.; Lebedev, O.; Van Tendeloo, G. |
Characterisation of multilayer ramp-type REBa2Cu3O7-\delta structures by scanning probe microscopy and high-resolution electron microscopy |
1997 |
Journal of alloys and compounds
T2 – Symposium on High Temperature Superconductor Thin Films, Growth, Mechanisms, Interfaces, Multilayers, at the 1996 Spring Meeting of the European-Materials-Society, June 04-07, 1996, Strasbourg, France |
251 |
|
UA library record; WoS full record |
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Bogaerts, A.; Gijbels, R. |
Computer simulation of an analytical direct current glow discharge in argon: influence of the cell dimensions on the plasma quantities |
1997 |
Journal of analytical atomic spectrometry |
12 |
21 |
UA library record; WoS full record; WoS citing articles |
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Adams, F.; Adriaens, A.; Aerts, A.; de Raedt, I.; Janssens, K.; Schalm, O. |
Micro and surface analysis in archaeology |
1997 |
Journal of analytical atomic spectrometry |
12 |
|
UA library record; WoS full record; WoS citing articles |
|
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Schelles, W.; Van Grieken, R. |
Quantitative analysis of zirconium oxide by direct glow discharge mass spectrometry using a secondary cathode |
1997 |
Journal of analytical atomic spectrometry |
12 |
|
UA library record |
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Milants, K.; Verheyden, J.; Barancira, T.; Deweerd, W.; Pattyn, H.; Bukshpan, S.; Williamson, D.L.; Vermeiren, F.; Van Tendeloo, G.; Vlekken, C.; Libbrecht, S.; van Haesendonck, C. |
Size distribution and magnetic behavior of lead inclusions in silicon single crystals |
1997 |
Journal of applied physics |
81 |
8 |
UA library record; WoS full record; WoS citing articles |
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Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. |
Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas |
1997 |
Journal of crystal growth |
173 |
4 |
UA library record; WoS full record; WoS citing articles |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. |
Electron microscopical investigation of tetrahedral-shaped AgBr microcrystals |
1997 |
Journal of crystal growth |
172 |
15 |
UA library record; WoS full record; WoS citing articles |
|
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Frangis, N.; Stoemenos, J.; van Landuyt, J.; Nejim, A.; Hemment, P.L.F. |
The formation of 3C-SiC in crystalline Si by carbon implantation at 9500C and annealing: a structural study |
1997 |
Journal of crystal growth |
181 |
9 |
UA library record; WoS full record; WoS citing articles |
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Frangis, N.; van Landuyt, J.; Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G. |
Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction |
1997 |
Journal of crystal growth |
172 |
29 |
UA library record; WoS full record; WoS citing articles |
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