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  Author Title Year (up) Publication Volume Times cited Additional Links Links
Schelles, W.; Van Grieken, R. Direct current glow discharge mass spectrometry for elemental characterization of polymers 1997 Analytical chemistry 69 UA library record; WoS full record; WoS citing articles doi
Gregory, C.L.; Nullens, H.A.; Gijbels, R.H.; van Espen, P.J.; Geuens, I.; de Keyzer, R. Automated particle analysis of populations of silver halide microcrystals by electron probe microanalysis under cryogenic conditions 1998 Analytical chemistry 70 12 UA library record; WoS full record; WoS citing articles doi
Poels, K.; van Vaeck, L.; Gijbels, R. Microprobe speciation analysis of inorganic solids by Fourier transform laser mass spectrometry 1998 Analytical chemistry 70 32 UA library record; WoS full record; WoS citing articles doi
Hołynska, B.; Olko, M.; Ostachowicz, B.; Ostachowicz, J.; Wegrzynek, D.; Claes, M.; Van Grieken, R.; de Bokx, P.; Kump, P.; Necemer, M. Performance of total reflection and grazing emission X-ray fluorescence spectrometry for the determination of trace metals in drinking water in relation to other analytical techniques 1998 Fresenius' journal of analytical chemistry 362 UA library record; WoS full record; WoS citing articles doi
Török, S.; Labar, J.; Schmeling, M.; Van Grieken, R. X-ray spectrometry 1998 Analytical chemistry 70 UA library record; WoS full record; WoS citing articles
Bogaerts, A.; Gijbels, R. New developments and applications in GDMS 1999 Fresenius' journal of analytical chemistry 364 17 UA library record; WoS full record; WoS citing articles doi
Janssens, K.; Vincze, L.; Vekemans, B.; Williams, C.T.; Radtke, M.; Haller, M.; Knöchel, A. The non-destructive determination of REE in fossilized bone using synchrotron radiation induced K-line X-ray microfluorescence analysis 1999 Fresenius' journal of analytical chemistry 363 UA library record; WoS full record; WoS citing articles pdf doi
Ro, C.-U.; Osán, J.; Van Grieken, R. Determination of low-Z elements in individual environmental particles using windowless EPMA 1999 Analytical chemistry 71 UA library record; WoS full record; WoS citing articles doi
Tsuji, K.; Wagatsuma, K.; Nullens, R.; Van Grieken, R.E. Grazing exit electron probe microanalysis for surface and particle analysis 1999 Analytical chemistry 71 UA library record; WoS full record; WoS citing articles doi
Tsuji, K.; Spolnik, Z.; Wagatsuma, K.; Van Grieken, R.E.; Vis, R.D. Grazing-exit particle-induced X-ray emission analysis with extremely low background 1999 Analytical chemistry 71 UA library record; WoS full record; WoS citing articles doi
Blockhuys, F.; Claes, M.; Van Grieken, R.; Geise, H.J. Assessing the molecular weight of a conducting polymer by grazing emission XRF 2000 Analytical chemistry 72 UA library record; WoS full record; WoS citing articles doi
Szalóki, I.; Török, S.B.; Ro, C.-U.; Injuk, J.; Van Grieken, R.E. X-ray spectrometry 2000 Analytical chemistry 72 UA library record; WoS full record; WoS citing articles doi
Robben, J.; Dufour, D.; Gijbels, R. Design and development of a new program for data processing of mass spectra acquired by means of a high-resolution double-focusing glow-discharge mass spectrometer 2001 Fresenius' journal of analytical chemistry 370 2 UA library record; WoS full record; WoS citing articles doi
Lenaerts, J.; Verlinden, G.; Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Geuens, I. Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS) 2001 Fresenius' journal of analytical chemistry 370 3 UA library record; WoS full record; WoS citing articles doi
Kempenaers, L.; de Koster, C.; van Borm, W.; Janssens, K. Micro-heterogeneity study of trace elements in BCR CRM 680 by means of synchrotron micro-XRF 2001 Fresenius' journal of analytical chemistry 369 15 UA library record; WoS full record; WoS citing articles doi
Ro, C.-U.; Oh, K.-Y.; Osán, J.; de Hoog, J.; Worobiec, A.; Van Grieken, R. Heterogeneity assessment in individual CaCO3-CaSO4 particles using ultrathin window electron probe X-ray microanalysis 2001 Analytical chemistry 73 UA library record; WoS full record; WoS citing articles doi
Eyckmans, K.; Zhang, J.; de Hoog, J.; Joos, P.; Van Grieken, R. Leaching of nutrients and trace metals from aerosol samples: a comparison between a re-circulation and an ultrasound system 2001 International journal of environmental analytical chemistry 80 UA library record; WoS full record; WoS citing articles doi
Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. Atomic spectroscopy 2002 Analytical chemistry 74 18 UA library record; WoS full record; WoS citing articles doi
Kempenaers, L.; Janssens, K.; Vincze, L.; Vekemans, B.; Somogyi, A.; Drakopoulos, M.; Simionovici, A.S.; Adams, F. A Monte Carlo model for studying the microheterogeneity of trace elements in reference materials by means of synchrotron microscopic X-ray fluorescence 2002 Analytical chemistry 74 21 UA library record; WoS full record; WoS citing articles doi
Vincze, L.; Somogyi, A.; Osán, J.; Vekemans, B.; Török, S.; Janssens, K.; Adams, F. Quantitative trace element analysis of individual fly ash particles by means of X-ray microfluorescence 2002 Analytical chemistry 74 44 UA library record; WoS full record; WoS citing articles doi
Injuk, J.; Osán, J.; Van Grieken, R.; Tsuji, K. Airborne particles in the Miyagi Museum of Art in Sendai, Japan, studied by electron probe X-ray microanalysis and energy dispersive X-ray fluorescence analysis 2002 Analytical sciences : the international journal of the Japan Society for Analytical Chemistry 18 UA library record; WoS full record; WoS citing articles url doi
Szalóki, I.; Török, S.B.; Injuk, J.; Van Grieken, R.E. X-ray spectrometry 2002 Analytical chemistry 74 UA library record; WoS full record; WoS citing articles doi
Ro, C.-U.; Osán, J.; Szalóki, I.; de Hoog, J.; Worobiec, A.; Van Grieken, R. A Monte Carlo program for quantitative electron-induced x-ray analysis of individual particles 2003 Analytical chemistry 75 UA library record; WoS full record; WoS citing articles doi
Eyckmans, K.; de Hoog, J.; van der Auwera, L.; Van Grieken, R. Speciation of aerosols by combining bulk ion chromatography and thin-window electron probe micro analysis 2003 International journal of environmental analytical chemistry 83 UA library record; WoS full record; WoS citing articles doi
Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. Atomic spectroscopy 2004 Analytical chemistry 76 32 UA library record; WoS full record; WoS citing articles doi
Adriaensen, L.; Vangaever, F.; Gijbels, R. Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields 2004 Analytical chemistry 76 67 UA library record; WoS full record; WoS citing articles doi
Ro, C.-U.; Kim, H.K.; Van Grieken, R. An expert system for chemical speciation of individual particles using low-Z particle electron probe X-ray microanalysis data 2004 Analytical chemistry 76 UA library record; WoS full record; WoS citing articles doi
Vincze, L.; Vekemans, B.; Brenker, F.E.; Falkenberg, G.; Rickers, K.; Somogyi, A.; Kersten, M.; Adams, F. Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging 2004 Analytical chemistry 76 UA library record; WoS full record; WoS citing articles doi
Szalóki, I.; Osán, J.; Van Grieken, R.E. X-ray spectrometry 2004 Analytical chemistry 76 UA library record; WoS full record; WoS citing articles doi
Choël, M.; Deboudt, K.; Osán, J.; Flament, P.; Van Grieken, R. Quantitative determination of low-Z elements in single atmospheric particles on boron substrates by automated scanning electron microscopy: energy-dispersive X-ray spectrometry 2005 Analytical chemistry 77 UA library record; WoS full record; WoS citing articles doi
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