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  Author Title Year Publication Volume (down) Times cited Additional Links Links
van den Broek, W.; Van Aert, S.; van Dyck, D. A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy 2010 Ultramicroscopy 110 16 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Chang, L.Y.; Bals, S.; Kirkland, A.I.; Van Tendeloo, G. Effect of amorphous layers on the interpretation of restored exit waves 2009 Ultramicroscopy 109 10 UA library record; WoS full record; WoS citing articles pdf doi
van den Broek, W.; Van Aert, S.; van Dyck, D. A model based atomic resolution tomographic algorithm 2009 Ultramicroscopy 109 17 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy 2009 Ultramicroscopy 109 166 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R. Electron channelling based crystallography 2007 Ultramicroscopy 107 32 UA library record; WoS full record; WoS citing articles doi
Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images 2006 Ultramicroscopy 106 18 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Van Aert, S.; Bertoni, G. Model-based quantification of EELS spectra: including the fine structure 2006 Ultramicroscopy 106 38 UA library record; WoS full record; WoS citing articles pdf doi
Gonnissen, J.; de Backer, A.; den Dekker, A.J.; Martinez, G.T.; Rosenauer, A.; Sijbers, J.; Van Aert, S. Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images 2014 Applied physics letters 105 12 UA library record; WoS full record; WoS citing articles pdf url doi
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework 2005 Ultramicroscopy 104 70 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example 2005 Ultramicroscopy 104 37 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Van Aert, S. Model based quantification of EELS spectra 2004 Ultramicroscopy 101 147 UA library record; WoS full record; WoS citing articles pdf doi
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? 2003 Ultramicroscopy 98 26 UA library record; WoS full record; WoS citing articles doi
Müller-Caspary, K.; Duchamp, M.; Roesner, M.; Migunov, V.; Winkler, F.; Yang, H.; Huth, M.; Ritz, R.; Simson, M.; Ihle, S.; Soltau, H.; Wehling, T.; Dunin-Borkowski, R.E.; Van Aert, S.; Rosenauer, A. Atomic-scale quantification of charge densities in two-dimensional materials 2018 Physical review B 98 10 UA library record; WoS full record; WoS citing articles url doi
van Dyck, D.; Van Aert, S.; Croitoru, M. Atomic resolution electron tomography: a dream? 2006 International journal of materials research 97 6 UA library record; WoS full record; WoS citing articles pdf doi
Bals, S.; Van Aert, S.; Van Tendeloo, G.; Avila-Brande, D. Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range 2006 Physical review letters 96 69 UA library record; WoS full record; WoS citing articles url doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. Optimal experimental design of STEM measurement of atom column positions 2002 Ultramicroscopy 90 35 UA library record; WoS full record; WoS citing articles doi
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. Does a monochromator improve the precision in quantitative HRTEM? 2001 Ultramicroscopy 89 22 UA library record; WoS full record; WoS citing articles doi
Tan, H.; Egoavil, R.; Béché, A.; Martinez, G.T.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Rotella, H.; Boullay, P.; Pautrat, A.; Prellier, W. Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures 2013 Physical review : B : condensed matter and materials physics 88 15 UA library record; WoS full record; WoS citing articles url doi
Van Aert, S.; de Backer, A.; Martinez, G.T.; Goris, B.; Bals, S.; Van Tendeloo, G.; Rosenauer, A. Procedure to count atoms with trustworthy single-atom sensitivity 2013 Physical review : B : condensed matter and materials physics 87 106 UA library record; WoS full record; WoS citing articles url doi
Schryvers, D.; Van Aert, S.; Delville, R.; Idrissi, H.; Turner, S.; Salje, E.K.H. Dedicated TEM on domain boundaries from phase transformations and crystal growth 2013 Phase transitions 86 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Ding, X.; Salje, E.K.H. Functional twin boundaries 2013 Phase transitions 86 5 UA library record; WoS full record; WoS citing articles pdf doi
Batenburg, J.; Van Aert, S. Three-dimensional reconstruction of a nanoparticle at atomic resolution 2011 ERCIM news 86 UA library record pdf
Van Aert, S.; van Dyck, D. Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? 2001 Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties 81 11 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Batenburg, J.; Van Tendeloo, S. Atomen tellen 2011 Nederlands tijdschrift voor natuurkunde (1991) 77 UA library record pdf
Shi, H.; Frenzel, J.; Martinez, G.T.; Van Rompaey, S.; Bakulin, A.; Kulkova, A.; Van Aert, S.; Schryvers, D. Site occupation of Nb atoms in ternary Ni-Ti-Nb shape memory alloys 2014 Acta materialia 74 21 UA library record; WoS full record; WoS citing articles pdf doi
Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images 2014 Micron 63 25 UA library record; WoS full record; WoS citing articles pdf url doi
Albrecht, W.; Van Aert, S.; Bals, S. Three-Dimensional Nanoparticle Transformations Captured by an Electron Microscope 2021 Accounts Of Chemical Research 54 12 UA library record; WoS full record; WoS citing articles pdf url doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. High-resolution electron microscopy : from imaging toward measuring 2002 IEEE transactions on instrumentation and measurement 51 13 UA library record; WoS full record; WoS citing articles doi
Boschker, H.; Huijben, M.; Vailinois, A.; Verbeeck, J.; Van Aert, S.; Luysberg, M.; Bals, S.; Van Tendeloo, G.; Houwman, E.P.; Koster, G.; Blank, D.H.A.; Rijnders, G. Optimized fabrication of high-quality La0.67Sr0.33MnO3 thin films considering all essential characteristics 2011 Journal of physics: D: applied physics 44 99 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. Model-based electron microscopy : from images toward precise numbers for unknown structure parameters 2012 Micron 43 7 UA library record; WoS full record; WoS citing articles pdf doi
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