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  Author Title Year Publication Volume (down) Times cited Additional Links Links
Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kruse, P.; Gerthsen, D. Ab initio computation of the mean inner Coulomb potential of technological important semiconductors 2005 1007 UA library record; WoS full record;
Mahr, C.; Kundu, P.; Lackmann, A.; Zanaga, D.; Thiel, K.; Schowalter, M.; Schwan, M.; Bals, S.; Wittstock, A.; Rosenauer, A. Quantitative determination of residual silver distribution in nanoporous gold and its influence on structure and catalytic performance 2017 Journal of catalysis 352 42 UA library record; WoS full record; WoS citing articles pdf url doi
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. Ab initio based atomic scattering amplitudes and {002} electron structure factors of InxGa1-xAs/GaAs quantum wells 2010 Journal of physics : conference series 209 UA library record; WoS full record url doi
Müller, K.; Schowalter, M.; Rosenauer, A.; Jansen, J.; Tsuda, K.; Titantah, J.T.; Lamoen, D. Refinement of chemically sensitive structure factors using parallel and convergent beam electron nanodiffraction 2010 Journal of physics : conference series 209 UA library record url doi
Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose 2019 Ultramicroscopy 203 25 UA library record; WoS full record; WoS citing articles pdf url doi
Grieb, T.; Krause, F.F.; Schowalter, M.; Zillmann, D.; Sellin, R.; Müller-Caspary, K.; Mahr, C.; Mehrtens, T.; Bimberg, D.; Rosenauer, A. Strain analysis from nano-beam electron diffraction : influence of specimen tilt and beam convergence 2018 Ultramicroscopy 190 1 UA library record; WoS full record; WoS citing articles pdf url doi
Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation 2018 Ultramicroscopy 184 7 UA library record; WoS full record; WoS citing articles pdf doi
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? 2017 Ultramicroscopy 181 3 UA library record; WoS full record; WoS citing articles pdf url doi
Gauquelin, N.; van den Bos, K.H.W.; Béché, A.; Krause, F.F.; Lobato, I.; Lazar, S.; Rosenauer, A.; Van Aert, S.; Verbeeck, J. Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques 2017 Ultramicroscopy 181 34 UA library record; WoS full record; WoS citing articles pdf url doi
Grieb, T.; Krause, F.F.; Mahr, C.; Zillmann, D.; Müller-Caspary, K.; Schowalter, M.; Rosenauer, A. Optimization of NBED simulations for disc-detection measurements 2017 Ultramicroscopy 181 6 UA library record; WoS full record; WoS citing articles pdf doi
Krause, F.F.; Ahl, J.P.; Tytko, D.; Choi, P.P.; Egoavil, R.; Schowalter, M.; Mehrtens, T.; Müller-Caspary, K.; Verbeeck, J.; Raabe, D.; Hertkorn, J.; Engl, K.; Rosenauer, A. Homogeneity and composition of AlInGaN : a multiprobe nanostructure study 2015 Ultramicroscopy 156 11 UA library record; WoS full record; WoS citing articles pdf url doi
Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM 2014 Ultramicroscopy 141 6 UA library record; WoS full record; WoS citing articles pdf url doi
Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy 2014 Ultramicroscopy 137 74 UA library record; WoS full record; WoS citing articles pdf doi
de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations 2013 Ultramicroscopy 134 48 UA library record; WoS full record; WoS citing articles pdf url doi
Müller-Caspary, K.; Grieb, T.; Müßener, J.; Gauquelin, N.; Hille, P.; Schörmann, J.; Verbeeck, J.; Van Aert, S.; Eickhoff, M.; Rosenauer, A. Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy 2019 Physical review letters 122 26 UA library record; WoS full record; WoS citing articles pdf url doi
Schowalter, M.; Rosenauer, A.; Titantah, J.T.; Lamoen, D. Calculation of Debye-Waller temperature factors for GaAs 2008 Springer proceedings in physics 120 UA library record; WoS full record;
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. Effect of temperature on the 002 electron structure factor and its consequence for the quantification of ternary and quaternary III-V crystals 2008 Springer proceedings in physics 120 UA library record; WoS full record;
van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. Correction of non-linear thickness effects in HAADF STEM electron tomography 2012 Ultramicroscopy 116 67 UA library record; WoS full record; WoS citing articles pdf doi
Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping 2019 Applied physics letters 114 17 UA library record; WoS full record; WoS citing articles url doi
Verbeeck, J.; Sc hattschneider, P.; Rosenauer, A. Image simulation of high resolution energy filtered TEM images 2009 Ultramicroscopy 109 36 UA library record; WoS full record; WoS citing articles pdf doi
Müller, K.; Schowalter, M.; Jansen, J.; Tsuda, K.; Titantah, J.; Lamoen, D.; Rosenauer, A. Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data 2009 Ultramicroscopy 109 8 UA library record; WoS full record; WoS citing articles pdf doi
Rosenauer, A.; Schowalter, M.; Titantah, J.T.; Lamoen, D. An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission electron microscopy 2008 Ultramicroscopy 108 25 UA library record; WoS full record; WoS citing articles doi
Rosenauer, A.; Schowalter, M.; Glas, F.; Lamoen, D. First-principles calculations of 002 structure factors for electron scattering in strained InxGa1-xAs 2005 107 UA library record; WoS full record;
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. Measurement of the mean inner potential of ZnO nanorods by transmission electron holography 2005 Microscopy of Semiconducting Materials 107 UA library record; WoS full record; pdf
Kruse, P.; Schowalter, M.; Lamoen, D.; Rosenauer, A.; Gerthsen, D. Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography 2006 Ultramicroscopy 106 50 UA library record; WoS full record; WoS citing articles doi
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. Modified atomic scattering amplitudes and size effects on the 002 and 220 electron structure factors of multiple Ga1-xInxAs/GaAs quantum wells 2009 Journal of applied physics 105 UA library record; WoS full record pdf doi
Gonnissen, J.; de Backer, A.; den Dekker, A.J.; Martinez, G.T.; Rosenauer, A.; Sijbers, J.; Van Aert, S. Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images 2014 Applied physics letters 105 12 UA library record; WoS full record; WoS citing articles pdf url doi
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. Bond length variation in Ga1-xInxAs crystals from the Tersoff potential 2007 Journal of applied physics 101 19 UA library record; WoS full record; WoS citing articles doi
Müller-Caspary, K.; Duchamp, M.; Roesner, M.; Migunov, V.; Winkler, F.; Yang, H.; Huth, M.; Ritz, R.; Simson, M.; Ihle, S.; Soltau, H.; Wehling, T.; Dunin-Borkowski, R.E.; Van Aert, S.; Rosenauer, A. Atomic-scale quantification of charge densities in two-dimensional materials 2018 Physical review B 98 10 UA library record; WoS full record; WoS citing articles url doi
Carmesin, C.; Schowalter, M.; Lorke, M.; Mourad, D.; Grieb, T.; Müller-Caspary, K.; Yacob, M.; Reithmaier, J.P.; Benyoucef, M.; Rosenauer, A.; Jahnke, F. Interplay of morphology, composition, and optical properties of InP-based quantum dots emitting at the 1.55 \mum telecom wavelength 2017 Physical review B 96 3 UA library record; WoS full record; WoS citing articles url doi
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