| |
Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Denecke, M.A.; Somogyi, A.; Janssens, K.; Simon, R.; Dardenne, K.; Noseck, U. |
Microanalysis (micro-XRF, micro-XANES, and micro-XRD) of a tertiary sediment using microfocused synchrotron radiation |
2007 |
Microscopy and microanalysis |
13 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. |
High-quality sample preparation by low kV FIB thinning for analytical TEM measurements |
2007 |
Microscopy and microanalysis |
13 |
82 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bach, D.; Störmer, H.; Schneider, R.; Gerthsen, D.; Verbeeck, J. |
EELS investigations of different niobium oxide phases |
2006 |
Microscopy and microanalysis |
12 |
50 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Jinschek, J.R.; Bals, S.; Gopal, V.; Xus, X.; Kisielowski, C. |
Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs |
2004 |
Microscopy and microanalysis |
10 |
|
UA library record |
|
|
|
Bals, S.; Radmilovic, V.; Kisielowski, C. |
TEM annular objective apertures fabricated by FIB |
2004 |
Microscopy and microanalysis |
10 |
|
UA library record |
|
|
|
van Dyck, D.; Van Aert, S.; den Dekker, A.J. |
Physical limits on atomic resolution |
2004 |
Microscopy and microanalysis |
10 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verlinden, G.; Gijbels, R.; Geuens, I. |
Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS |
2002 |
Microscopy and microanalysis |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
|
