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Near-field diffraction of fs and sub-fs pulses: super resolution of NSOM in space and time”. Kukhlevsky SV, Mechler M, Csapo L, Janssens K, Physics letters : A 319, 439 (2003). http://doi.org/10.1016/J.PHYSLETA.2003.10.054
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Micro-XANES determination of ferric iron and its application in thermobarometry”. Schmid R, Wilke M, Ober R, Dong S, Janssens K, Falkenberg G, Franz L, Gaab A, Lithos 70, 381 (2003). http://doi.org/10.1016/S0024-4937(03)00107-5
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Effect of strain on the magnetoexciton ground state in InP/GaxIn1-xP quantum disks”. Janssens KL, Partoens B, Peeters FM, Physical review : B : condensed matter and materials physics 67, 235325 (2003). http://doi.org/10.1103/PhysRevB.67.235325
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Reconstruction of the three-dimensional distribution of elements in fly-ash particles by micro-XRF spectroscopy”. Rindby A, Janssens K, Osán J, X-ray spectrometry 32, 248 (2003). http://doi.org/10.1002/XRS.647
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Characterization of a polycapillary lens for use in micro-XANES experiments”. Proost K, Vincze L, Janssens K, Gao N, Bulska E, Schreiner M, Falkenberg G, X-ray spectrometry 32, 215 (2003). http://doi.org/10.1002/XRS.635
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Characterization of the main causes of deterioration of grisaille paint layers in 19th C. stained-glass windows by J.-B. Capronnier”. Schalm O, Janssens K, Caen J, Spectrochimica acta: part B : atomic spectroscopy 58, 589 (2003). http://doi.org/10.1016/S0584-8547(02)00282-3
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A flexible and accurate quantification algorithm for EPXMA based on thin-film element yields”. Schalm O, Janssens K, Spectrochimica acta: part B : atomic spectroscopy 58, 669 (2003). http://doi.org/10.1016/S0584-8547(02)00290-2
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Type II quantum dots in magnetic fields: excitonic behaviour”. Janssens KL, Partoens B, Peeters FM, Microelectronics journal 34, 347 (2003). http://doi.org/10.1016/S0026-2692(03)00023-5
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Change in silica sources in Roman and post Roman glass”. Aerts A, Janssens K, Velde B, Dijkman W, Spectrochimica acta: part B : atomic spectroscopy 58, 659 (2003). http://doi.org/10.1016/S0584-8547(02)00287-2
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Micro-heterogeneity study of trace elements in USGS, MPI-DING and glass reference materials by means of synchrotron micro-XRF”. Kempenaers L, Janssens K, Jochum KP, Vincze L, Vekemans B, Somogyi A, Drakopoulos M, Adams F, Journal of analytical atomic spectrometry 18, 350 (2003). http://doi.org/10.1039/B212196D
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Oxidation states of uranium in DU particles from Kosovo”. Salbu B, Janssens K, Lind OC, Proost K, Danesi PR, Journal of environmental radioactivity 64, 167 (2003). http://doi.org/10.1016/S0265-931X(02)00047-4
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Excitons in single and vertically coupled type II quantum dots in high magnetic fields”. Peeters FM, Janssens KL, Partoens B s.l., page 117 (2003).
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The use of focussed X-ray beams for non-destructive characterization of historical materials: from elemental trace analysis towards chemical state investigations”. Janssens K, Proost K, Deraedt I, Bulska E, Wagner B, Schreiner M, , 193 (2003)
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Editorial”. Janssens K, (2003)
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Methods 4: elemental analysis (AAS/AES/X-ray fluorescence)”. Janssens K (2003).
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X-ray fluorescence analysis”. Janssens K (2003).
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Quantitative trace element analysis of individual fly ash particles by means of X-ray microfluorescence”. Vincze L, Somogyi A, Osán J, Vekemans B, Török S, Janssens K, Adams F, Analytical chemistry 74, 1128 (2002). http://doi.org/10.1021/AC010789B
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High-resolution X-ray fluorescence micro-tomography on single sediment particles”. Vincze L, Vekemans B, Szalóki I, Janssens K, Van Grieken R, Feng H, Jones KW, Adams F page 240 (2002).
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Strain and band edges in single and coupled cylindrical InAs/GaAs and InP/InGaP self-assembled quantum dots”. Tadić, M, Peeters FM, Janssens KL, Korkusinski M, Hawrylak P, Journal of applied physics 92, 5819 (2002). http://doi.org/10.1063/1.1510167
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Electron and hole localization in coupled InP/InGaP self-assembled quantum dots”. Tadić, M, Peeters FM, Partoens B, Janssens KL, Physica. E: Low-dimensional systems and nanostructures 13, 237 (2002). http://doi.org/10.1016/S1386-9477(01)00528-8
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Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Hoffmann P, Ortner HM, X-ray spectrometry 31, 87 (2002). http://doi.org/10.1002/XRS.563
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Single and vertically coupled type-II quantum dots in a perpendicular magnetic field: exciton ground-state properties”. Janssens KL, Partoens B, Peeters FM, Physical review : B : condensed matter and materials physics 66, 075314 (2002). http://doi.org/10.1103/PhysRevB.66.075314
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A Monte Carlo model for studying the microheterogeneity of trace elements in reference materials by means of synchrotron microscopic X-ray fluorescence”. Kempenaers L, Janssens K, Vincze L, Vekemans B, Somogyi A, Drakopoulos M, Simionovici AS, Adams F, Analytical chemistry 74, 5017 (2002). http://doi.org/10.1021/AC025662G
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Magneto-exciton in single and coupled type II quantum dots”. Janssens KL, Partoens B, Peeters FM, Physica status solidi: A: applied research 190, 571 (2002). http://doi.org/10.1002/1521-396X(200204)190:2<571::AID-PSSA571>3.0.CO;2-K
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Effect of isotropic versus anisotropic elasticity on the electronic structure of cylindrical InP/In0.49Ga0.51P self-assembled quantum dots”. Tadić, M, Peeters FM, Janssens KL, Physical review : B : condensed matter and materials physics 65, 165333 (2002). http://doi.org/10.1103/PhysRevB.65.165333
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Stark shift in single and vertically coupled type-I and type-II quantum dots”. Janssens KL, Partoens B, Peeters FM, Physical review : B : condensed matter and materials physics 65, 233301 (2002). http://doi.org/10.1103/PhysRevB.65.233301
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Suitability of polycapillary optics for focusing of monochromatic synchrotron radiation as used in trace level micro-XANES measurements”. Vincze L, Wei F, Proost K, Vekemans B, Janssens K, He Y, Yan Y, Falkenberg G, Journal of analytical atomic spectrometry 17, 177 (2002). http://doi.org/10.1039/B110210A
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Single and coupled type II quantum dots in magnetic and electric fields”. Janssens KL, Partoens B, Peeters FM, Physicalia magazine 24, 211 (2002)
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Nanoscale morphology of a piece of ruby red Kunckel glass”. Fredrickx P, Schryvers D, Janssens K, Physics and chemistry of glasses 43, 176 (2002)
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Art 2002 : 7th International Conference on Non-destructive Testing and Microanalysisfor the Diagnostics and Conservation of the Cultural and Environmental Heritage, 2-6 June 2002, Congress Centre Elzenveld, Antwerp, Belgium”. Van Grieken R, Janssens K, Van 't dack L, Meersman G page 780 p. (2002).
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