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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 78, 4069 (2006). http://doi.org/10.1021/AC060688J
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Quantitative determination of low-Z elements in single atmospheric particles on boron substrates by automated scanning electron microscopy: energy-dispersive X-ray spectrometry”. Choël M, Deboudt K, Osán J, Flament P, Van Grieken R, Analytical chemistry 77, 5686 (2005). http://doi.org/10.1021/AC050739X
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 76, 3313 (2004). http://doi.org/10.1021/ac040052x
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Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields”. Adriaensen L, Vangaever F, Gijbels R, Analytical chemistry 76, 6777 (2004). http://doi.org/10.1021/ac049108d
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An expert system for chemical speciation of individual particles using low-Z particle electron probe X-ray microanalysis data”. Ro C-U, Kim HK, Van Grieken R, Analytical chemistry 76, 1322 (2004). http://doi.org/10.1021/AC035149I
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Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging”. Vincze L, Vekemans B, Brenker FE, Falkenberg G, Rickers K, Somogyi A, Kersten M, Adams F, Analytical chemistry 76, 6786 (2004). http://doi.org/10.1021/AC049274L
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 76, 3445 (2004). http://doi.org/10.1021/AC0400820
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A Monte Carlo program for quantitative electron-induced x-ray analysis of individual particles”. Ro C-U, Osán J, Szalóki I, de Hoog J, Worobiec A, Van Grieken R, Analytical chemistry 75, 851 (2003). http://doi.org/10.1021/AC025973R
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 74, 2691 (2002). http://doi.org/10.1021/ac020190r
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A Monte Carlo model for studying the microheterogeneity of trace elements in reference materials by means of synchrotron microscopic X-ray fluorescence”. Kempenaers L, Janssens K, Vincze L, Vekemans B, Somogyi A, Drakopoulos M, Simionovici AS, Adams F, Analytical chemistry 74, 5017 (2002). http://doi.org/10.1021/AC025662G
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Quantitative trace element analysis of individual fly ash particles by means of X-ray microfluorescence”. Vincze L, Somogyi A, Osán J, Vekemans B, Török S, Janssens K, Adams F, Analytical chemistry 74, 1128 (2002). http://doi.org/10.1021/AC010789B
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X-ray spectrometry”. Szalóki I, Török SB, Injuk J, Van Grieken RE, Analytical chemistry 74, 2895 (2002). http://doi.org/10.1021/AC020241K
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Heterogeneity assessment in individual CaCO3-CaSO4 particles using ultrathin window electron probe X-ray microanalysis”. Ro C-U, Oh K-Y, Osán J, de Hoog J, Worobiec A, Van Grieken R, Analytical chemistry 73, 4574 (2001). http://doi.org/10.1021/AC010438X
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Assessing the molecular weight of a conducting polymer by grazing emission XRF”. Blockhuys F, Claes M, Van Grieken R, Geise HJ, Analytical chemistry 72, 3366 (2000). http://doi.org/10.1021/AC990877K
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X-ray spectrometry”. Szalóki I, Török SB, Ro C-U, Injuk J, Van Grieken RE, Analytical chemistry 72, 211 (2000). http://doi.org/10.1021/A1000018H
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Determination of low-Z elements in individual environmental particles using windowless EPMA”. Ro C-U, Osán J, Van Grieken R, Analytical chemistry 71, 1521 (1999). http://doi.org/10.1021/AC981070F
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Grazing exit electron probe microanalysis for surface and particle analysis”. Tsuji K, Wagatsuma K, Nullens R, Van Grieken RE, Analytical chemistry 71, 2497 (1999). http://doi.org/10.1021/AC990075P
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Grazing-exit particle-induced X-ray emission analysis with extremely low background”. Tsuji K, Spolnik Z, Wagatsuma K, Van Grieken RE, Vis RD, Analytical chemistry 71, 5033 (1999). http://doi.org/10.1021/AC990568U
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Automated particle analysis of populations of silver halide microcrystals by electron probe microanalysis under cryogenic conditions”. Gregory CL, Nullens HA, Gijbels RH, van Espen PJ, Geuens I, de Keyzer R, Analytical chemistry 70, 2551 (1998). http://doi.org/10.1021/ac9710644
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Microprobe speciation analysis of inorganic solids by Fourier transform laser mass spectrometry”. Poels K, van Vaeck L, Gijbels R, Analytical chemistry 70, 504 (1998). http://doi.org/10.1021/ac9709108
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X-ray spectrometry”. Török S, Labar J, Schmeling M, Van Grieken R, Analytical chemistry 70, 495r (1998)
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Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis”. Verlinden G, Janssens G, Gijbels R, van Espen P, Geuens I, Analytical chemistry 69, 3773 (1997). http://doi.org/10.1021/ac970010r
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Direct current glow discharge mass spectrometry for elemental characterization of polymers”. Schelles W, Van Grieken R, Analytical chemistry 69, 2931 (1997). http://doi.org/10.1021/AC970186T
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Two-dimensional model of a direct current glow discharge : description of the argon metastable atoms, sputtered atoms and ions”. Bogaerts A, Gijbels R, Analytical chemistry 68, 2676 (1996). http://doi.org/10.1021/ac951206z
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Two-dimensional model of a direct current glow discharge: description of the electrons, argon ions and fast argon atoms”. Bogaerts A, Gijbels R, Goedheer WJ, Analytical chemistry 68, 2296 (1996). http://doi.org/10.1021/ac9510651
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Direct current glow discharge mass spectrometric analysis of Macor ceramic using a secondary cathode”. Schelles W, Van Grieken R, Analytical chemistry 68, 3570 (1996). http://doi.org/10.1021/AC960441U
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X-ray spectrometry”. Török SB, Labar J, Injuk J, Van Grieken RE, Analytical chemistry R68, 467 (1996)
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Parameter evaluation for the analysis of oxide-based samples with radio ferquency glow discharge mass spectrometry”. de Gendt S, Van Grieken RE, Ohorodnik SK, Harrison WW, Analytical chemistry 67, 1026 (1995). http://doi.org/10.1021/AC00102A002
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Hydrodynamic model of matrix-assisted laser desorption mass spectrometry”. Vertes A, Irinyi G, Gijbels R, Analytical chemistry 65, 2389 (1993). http://doi.org/10.1021/ac00065a036
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Influence of axial and radial diffusion processes on the analytical performance of a glow discharge cell”. van Straaten M, Gijbels R, Vertes A, Analytical chemistry 64, 1855 (1992). http://doi.org/10.1021/ac00041a021
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