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Author |
Laffez, P.; Lebedev, O.I.; Ruello, P.; Desfeux, R.; Banerjee, G.; Capon, F. |
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Title |
Evidence of strain induced structural change in hetero-epitaxial NdNiO3 thin films with metal-insulator transition |
Type |
A1 Journal article |
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Year  |
2004 |
Publication |
European physical journal: applied physics |
Abbreviated Journal |
Eur Phys J-Appl Phys |
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Volume |
25 |
Issue |
1 |
Pages |
25-31 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
Neodymium nickelate thin films have been prepared on NdGaO3 substrates by RF magnetron sputtering and post-annealing treatment under oxygen pressure. Transport properties are found to depend strongly on film thickness. Thick films show transport properties close to bulk ceramics, while very thin films exhibit a large transition from metal to insulator which occurs over a wide temperature range with high resistivity. Structure and surface morphology of the films have been investigated by Transmission Electron Microscopy (TEM) and Atomic Force Microscopy (AFM). Thin films (approximate to17 nm) grow heteroepitaxially, while thicker films (approximate to73 nm) show a granular structure. The thinnest sample suggests a symmetry change induced by the epitaxial strain of the substrate. This paper discusses the relationship between microstructure and transport properties. |
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Place of Publication |
Paris |
Editor |
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Wos |
000187286000003 |
Publication Date |
2003-12-15 |
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Series Editor |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1286-0042;1286-0050; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
0.684 |
Times cited |
12 |
Open Access |
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Notes |
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Approved |
Most recent IF: 0.684; 2004 IF: 0.745 |
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Call Number |
UA @ lucian @ c:irua:103256 |
Serial |
1096 |
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Author |
Laffez, P.; Retoux, R.; Boullay, P.; Zaghrioui, M.; Lacorre, P.; Van Tendeloo, G. |
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Title |
Transmission electron microscopy of NdNiO3 thin films on silicon substrates |
Type |
A1 Journal article |
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Year |
2000 |
Publication |
European physical journal: applied physics |
Abbreviated Journal |
Eur Phys J-Appl Phys |
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Volume |
12 |
Issue |
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Pages |
55-60 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Paris |
Editor |
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Language |
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Wos |
000165528800006 |
Publication Date |
2003-06-20 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1286-0042;1286-0050; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
0.684 |
Times cited |
16 |
Open Access |
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Notes |
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Approved |
Most recent IF: 0.684; 2000 IF: 0.535 |
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Call Number |
UA @ lucian @ c:irua:54781 |
Serial |
3711 |
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Author |
Leroux, C.; Badeche, T.; Nihoul, G.; Richard, O.; Van Tendeloo, G. |
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Title |
A homologous series Pb2n+1Nb2n-1O7n-1 studied by electron microscopy |
Type |
A1 Journal article |
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Year |
1999 |
Publication |
European physical journal: applied physics |
Abbreviated Journal |
Eur Phys J-Appl Phys |
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Volume |
7 |
Issue |
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Pages |
33-40 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
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Place of Publication |
Paris |
Editor |
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Wos |
000082211000005 |
Publication Date |
2003-06-20 |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1286-0042;1286-0050; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
0.684 |
Times cited |
4 |
Open Access |
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Notes |
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Approved |
Most recent IF: 0.684; 1999 IF: 0.208 |
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Call Number |
UA @ lucian @ c:irua:29717 |
Serial |
1488 |
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Author |
Tancret, F.; Monot, I.; Laffez, P.; Van Tendeloo, G.; Desgardin, G. |
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Title |
Preparation and characterization of melt textured NdBa2Cu3O7- bulk superconducting ceramics |
Type |
A1 Journal article |
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Year |
1998 |
Publication |
European physical journal: applied physics |
Abbreviated Journal |
Eur Phys J-Appl Phys |
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Volume |
1 |
Issue |
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Pages |
185-190 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Paris |
Editor |
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Language |
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Wos |
000073229800009 |
Publication Date |
2003-06-20 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1286-0042;1286-0050; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
0.684 |
Times cited |
2 |
Open Access |
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Notes |
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Approved |
Most recent IF: 0.684; 1998 IF: NA |
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Call Number |
UA @ lucian @ c:irua:25690 |
Serial |
2697 |
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