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	Author	Laffez, P.; Retoux, R.; Boullay, P.; Zaghrioui, M.; Lacorre, P.; Van Tendeloo, G.
	Title	Transmission electron microscopy of NdNiO₃ thin films on silicon substrates			Type	A1 Journal article
	Year	2000	Publication	European physical journal: applied physics	Abbreviated Journal	Eur Phys J-Appl Phys
	Volume	12	Issue		Pages	55-60
	Keywords	A1 Journal article; Electron microscopy for materials research (EMAT)
	Abstract
	Address
	Corporate Author				Thesis
	Publisher		Place of Publication	Paris	Editor
	Language		Wos	000165528800006	Publication Date	2003-06-20
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	1286-0042;1286-0050;	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor	0.684	Times cited	16	Open Access
	Notes				Approved	Most recent IF: 0.684; 2000 IF: 0.535
	Call Number	UA @ lucian @ c:irua:54781			Serial	3711
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