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Author Laffez, P.; Lebedev, O.I.; Ruello, P.; Desfeux, R.; Banerjee, G.; Capon, F. doi  openurl
  Title Evidence of strain induced structural change in hetero-epitaxial NdNiO3 thin films with metal-insulator transition Type A1 Journal article
  Year (down) 2004 Publication European physical journal: applied physics Abbreviated Journal Eur Phys J-Appl Phys  
  Volume 25 Issue 1 Pages 25-31  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract Neodymium nickelate thin films have been prepared on NdGaO3 substrates by RF magnetron sputtering and post-annealing treatment under oxygen pressure. Transport properties are found to depend strongly on film thickness. Thick films show transport properties close to bulk ceramics, while very thin films exhibit a large transition from metal to insulator which occurs over a wide temperature range with high resistivity. Structure and surface morphology of the films have been investigated by Transmission Electron Microscopy (TEM) and Atomic Force Microscopy (AFM). Thin films (approximate to17 nm) grow heteroepitaxially, while thicker films (approximate to73 nm) show a granular structure. The thinnest sample suggests a symmetry change induced by the epitaxial strain of the substrate. This paper discusses the relationship between microstructure and transport properties.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Paris Editor  
  Language Wos 000187286000003 Publication Date 2003-12-15  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1286-0042;1286-0050; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 0.684 Times cited 12 Open Access  
  Notes Approved Most recent IF: 0.684; 2004 IF: 0.745  
  Call Number UA @ lucian @ c:irua:103256 Serial 1096  
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