NANOlab Center of Excellence literature database -- Query Results

	NANOlab Center of Excellence literature database Home \| Show All \| Simple Search \| Advanced Search	Login Quick Search: Field: contains: ...
	31–60 of 180 records found matching your query (RSS \| history):

Select All Deselect All

<< 1 2 3 4 5 6 >>

List View

Citations

Details

Author	Title	Year	Publication	Volume	Times cited	Additional Links
Nistor, L.; Buschmann, V.; Ralchenko, V.; Dinca, G.; Vlasov, I.; van Landuyt, J.; Fuess, H.	Microstructural characterization of diamond films deposited on c-BN crystals	2000	Diamond and related materials T2 – 10th European Conference on Diamond, Diamond-Like Materials, Nitrides, and Silicon Carbide (Diamond 1999), SEP 12-17, 1999, PRAGUE, CZECH REPUBLIC	9	9	UA library record; WoS full record; WoS citing articles
Nistor, L.; Bender, H.; Vantomme, A.; Wu, M.F.; van Landuyt, J.; O'Donnell, K.P.; Martin, R.; Jacobs, K.; Moerman, I.	Direct evidence of spontaneous quantum dot formation in a thick InGaN epilayer	2000	Applied physics letters	77	44	UA library record; WoS full record; WoS citing articles
Li, H.; Bender, H.; Conard, T.; Maex, K.; Gutakovskii, A.; van Landuyt, J.; Froyen, L.	Interaction of a Ti-capped Co thin film with Si₃N₄	2000	Applied physics letters	77	3	UA library record; WoS full record; WoS citing articles
Ferroni, M.; Carotta, M.C.; Guidi, V.; Martinelli, G.; Ronconi, F.; Richard, O.; van Dyck, D.; van Landuyt, J.	Structural characterization of Nb-TiO₂ nanosized thick-films for gas sensing application	2000	Sensors and actuators : B : chemical	68	51	UA library record; WoS full record; WoS citing articles
Vantomme, A.; Wu, M.F.; Hogg, S.; van Landuyt, J.; et al.	Comparative study of structural properties and photoluminescence in InGaN layers with a high In content	2000	Internet journal of nitride semiconductor research T2 – Symposium on GaN and Related Alloys Held at the MRS Fall Meeting, NOV 29-DEC 03, 1999, BOSTON, MASSACHUSETTS	5		UA library record; WoS full record;
Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B.	Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study	2000				UA library record; WoS full record;
Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C.	The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals	2000				UA library record; WoS full record;
Romano-Rodriguez, A.; Perez-Rodriguez, A.; Serre, C.; van Landuyt, J.; et al.	Epitaxial growth of \beta-SiC on ion-beam synthesized \beta-SiC : structural characterization	2000	Materials science forum T2 – International Conference on Silicon Carbide and Related Materials, OCT 10-15, 1999, RES TRIANGLE PK, NORTH CAROLINA	338-3	2	UA library record; WoS full record; WoS citing articles
Nistor, L.; van Landuyt, J.; Ralchenko, V.	Structural aspects of CVD idamond wafers grown at different hydrogen flow rates	1999	Physica status solidi: A: applied research	171	15	UA library record; WoS full record; WoS citing articles
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J.	Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ electron irradiation in an HREM	1999	Physica status solidi: A: applied research T2 – International Conference on Extended Defects in Semiconductors (EDS 98), Sept. 06-11, 1998, Jaszowiec, Poland	171	40	UA library record; WoS full record; WoS citing articles
Mihailescu, I.N.; Gyorgy, E.; Marin, G.; Popescu, M.; Teodorescu, V.S.; van Landuyt, J.; Grivas, C.; Hatziapostolou, A.	Crystalline structure of very hard tungsten carbide thin films obtained by reactive pulsed laser deposition	1999	Journal of vacuum science and technology: A: vacuum surfaces and films	17	8	UA library record; WoS full record; WoS citing articles
de Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J.	Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon	1999	The review of scientific instruments	70	5	UA library record; WoS full record; WoS citing articles
Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M.	Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays	1999	Applied physics letters	75	481	UA library record; WoS full record; WoS citing articles
Ahenach, J.; Cool, P.; Vansant, E.F.; Lebedev, O.; van Landuyt, J.	Influence of water on the pillaring of montmorillonite with aminopropyltriethoxysilane	1999	Physical chemistry, chemical physics	1	10	UA library record; WoS full record; WoS citing articles
Rembeza, E.S.; Richard, O.; van Landuyt, J.	Influence of laser and isothermal treatments on microstructural properties of SnO₂ films	1999	Materials research bulletin	34	17	UA library record; WoS full record; WoS citing articles
Nistor, L.; Nistor, S.V.; Dincã, G.; van Landuyt, J.; Schoemaker, D.; Copaciu, V.; Georgeoni, P.; Arnici, N.	High resolution electron microscopy and electron spin resonance studies on cubic boron nitride crystals made by high-pressure/high-temperature synthesis	1999	Diamonds an related materials	8	7	UA library record; WoS full record; WoS citing articles
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J.	Accurate infrared absorption measurement of interstitial and precipitated oxygen in p⁺ silicon wafers	1999	Microelectronic engineering	45		UA library record; WoS full record
Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G.	Morphology and defects in shallow trench isolation structures	1999	Conference series of the Institute of Physics	164	1	UA library record; WoS full record; WoS citing articles
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J.	Clustering of vacancies on {113} planes in Si layers close to Si-Si₃N₄ interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation	1999	Institute of physics conference series T2 – Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND			UA library record; WoS full record;
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J.	Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ irradiation in an HREM	1999	Physica status solidi: A: applied research	171	40	UA library record; WoS full record; WoS citing articles
Volkov, V.V.; van Landuyt, J.; Amelinckx, S.; Pervov, V.S.; Makhonina, E.V.	Electron microscopic and X-ray structural analysis of the layered crystals TaReSe4: structure, defect structure, and microstructure, including rotation twins	1998	Journal of solid state chemistry	135	3	UA library record; WoS full record; WoS citing articles
Takeda, M.; Suzuki, N.; Shinohara, G.; Endo, T.; van Landuyt, J.	TEM study on precipitation behavior in Cu-Co alloys	1998	Physica status solidi: A: applied research	168	18	UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Landuyt, J.	Transmission electron microscopy studies of (111) twinned silver halide microcrystals	1998	Microscopy research and technique	42	8	UA library record; WoS full record; WoS citing articles
Frangis, N.; van Landuyt, J.; Lartiprete, R.; Martelli, S.; Borsella, E.; Chiussi, S.; Castro, J.; Leon, B.	High resolution electron microscopy and X-ray photoelectron spectroscopy studies of heteroepitaxial Si_xGe_1-x alloys produced through laser induced processing	1998	Applied physics letters	72	16	UA library record; WoS full record; WoS citing articles
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R.	Defects and growth mechanisms of AgCl(100) tabular crystals	1998	Journal of crystal growth	187	8	UA library record; WoS full record; WoS citing articles
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.	Defect related growth of tabular AgCl(100) crystals: a TEM study	1998				UA library record; WoS full record;
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R.	Defects in AgCl and AgBr(100) tabular crystals studied by TEM	1998				UA library record
van Landuyt, J.; Van Tendeloo, G.	Charcaterization by high-resolution transmission electron microscopy	1998				UA library record; WoS full record;
van Landuyt, J.; Van Tendeloo, G.	HREM for characterisation of nanoscale microstructures	1998				UA library record
van Landuyt, J.	Een tempel voor elektronenmicroscopie “kijken naar atomen”	1998	Fonds informatief	38		UA library record