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“Study of microgeometry of porous materials using synchrotron computed microtomography”. Jones KW, Feng H, Lindquist WB, Adler PM, Thover JF, Vekemans B, Vincze L, Szalóki I, Van Grieken R, Adams F, Riekel C page 39 (2003).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“High-resolution X-ray fluorescence micro-tomography on single sediment particles”. Vincze L, Vekemans B, Szalóki I, Janssens K, Van Grieken R, Feng H, Jones KW, Adams F page 240 (2002).
Keywords: H1 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Times cited: 11
DOI: 10.1117/12.452865
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“Synchrotron radiation induced X-ray microfluorescence analysis”. Janssens K, Vincze L, Vekemans B, Aerts A, Adams F, Jones KW, Knöchel A, Microchimica acta
T2 –, 4th Workshop of the European-Microanalysis-Society on Modern, Developments and Applications in Microbeam Analysis, MAY, 1995, ST MALO, FRANCE , 87 (1996)
Abstract: mu-XRF is the microscopic equivalent of the well-established multielement analytical technique. In this paper, after comparing the interaction of X-ray photons, electrons and protons with matter and an introduction to synchrotron rings and microfocussing of X-rays, the instrumentation for mu-XRF is discussed, both for laboratory source and synchrotron based setups and the analytical characteristics of mu-XRF are contrasted to that of other microanalytical techniques, Also, this issue of quantification of mu-XRF data is addressed; the applicability of the method in archeological and geological analysis is illustrated.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Microscopic synchroton radiation induced X-ray fluorescence analysis”. Janssens K, Vincze L, Aerts A, Vekemans B, Adams F, Jones K, Knöchel A, Mikrochimica acta: supplementum , 87 (1996)
Keywords: A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Quantitative mu-XRF analysis of heterogeneous samples”. Vincze L, Janssens K, Adams F, Jones K, Microbeam Analysis 1995: Proceedings Of The 29th Annual Conference Of The Microbeam Analysis Society , 175 (1995)
Keywords: P1 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Synchrotron radiation-induced X-ray microanalysis”. Janssens K, Vincze L, Adams F, Jones KW, Analytica chimica acta 283, 98 (1993). http://doi.org/10.1016/0003-2670(93)85213-4
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/0003-2670(93)85213-4
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“Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens KH, Adams FC, van Langevelde F, Vis RD, Jones KW, Rivers M, Sutton S, Advances in X-ray analysis 35, 1265 (1992)
Keywords: A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens K, van Langevelde F, Adams F, Vis R, Sutton S, Rivers M, Jones K, Bowen D, (1992)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Analysis of individual microscopic particles by means of synchrotron radiation induced X-ray micro fluorescence”. Janssens K, Adams F, Rivers ML, Jones KW, Proceedings 27th MAS (1992)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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