Number of records found: 3
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Citations
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Multilayer graphene, Moire patterns, grain boundaries and defects identified by scanning tunneling microscopy on the m-plane, non-polar surface of SiC”. Xu P, Qi D, Schoelz JK, Thompson J, Thibado PM, Wheeler VD, Nyakiti LO, Myers-Ward RL, Eddy CR, Gaskill DK, Neek-Amal M, Peeters FM;, Carbon 80, 75 (2014). http://doi.org/10.1016/j.carbon.2014.08.028
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Crystal fields, disorder, and antiferromagnetic short-range order in Yb0.24Sn0.76Ru”. Klimczuk T, Wang CH, Lawrence JM, Xu Q, Durakiewicz T, Ronning F, Llobet A, Trouw F, Kurita N, Tokiwa Y, Lee Ho, Booth CH, Gardner JS, Bauer ED, Joyce JJ, Zandbergen HW, Movshovich R, Cava RJ, Thompson JD;, Physical review : B : condensed matter and materials physics 84, 075152 (2011). http://doi.org/10.1103/PhysRevB.84.075152
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Crystal growth of CsCl-type Yb0.24Sn0.76Ru”. Klimczuk T, Wang CH, Xu Q, Lawrence J, Durakiewicz T, Ronning F, Llobet A, Bauer ED, Griveau J-C, Sadowski W, Zandbergen HW, Thompson JD, Cava RJ, Journal of crystal growth 318, 1005 (2011). http://doi.org/10.1016/j.jcrysgro.2010.10.045
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