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Characterization of a degraded cadmium yellow (CdS) pigment in an oil painting by means of synchrotron radiation based X-ray techniques”. van der Snickt G, Dik J, Cotte M, Janssens K, Jaroszewicz J, de Nolf W, Groenewegen J, van der Loeff L, Analytical chemistry 81, 2600 (2009). http://doi.org/10.1021/AC802518Z
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Method for the determination of Pd-catalyst residues in active pharmaceutical ingredients by means of high-energy polarized-beam energy dispersive X-ray fluorescence”. Marguí, E, van Meel K, Van Grieken R, Buendía A, Fontás C, Hidalgo M, Queralt I, Analytical chemistry 81, 1404 (2009). http://doi.org/10.1021/AC8021373
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 80, 4317 (2008). http://doi.org/10.1021/ac8006297
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Visualization of a lost painting by Vincent van Gogh using synchrotron radiation based X-ray fluorescence elemental mapping”. Dik J, Janssens K, van der Snickt G, van der Loeff L, Rickers K, Cotte M, Analytical chemistry 80, 6436 (2008). http://doi.org/10.1021/AC800965G
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High-energy polarized-beam energy-dispersive X-ray fluorescence analysis combined with activated thin layers for cadmium determination at trace levels in complex environmental liquid samples”. Marguí, E, Fontàs C, van Meel K, Van Grieken R, Queralt I, Hidalgo M, Analytical chemistry 80, 2357 (2008). http://doi.org/10.1021/AC7018427
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Leaching of nutrients and trace metals from aerosol samples: a comparison between a re-circulation and an ultrasound system”. Eyckmans K, Zhang J, de Hoog J, Joos P, Van Grieken R, International journal of environmental analytical chemistry 80, 227 (2001). http://doi.org/10.1080/03067310108044372
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Determination of platinum, palladium, and rhodium in automotive catalysts using high-energy secondary target X-ray fluorescence spectrometry”. van Meel K, Smekens A, Behets M, Kazandjian P, Van Grieken R, Analytical chemistry 79, 6383 (2007). http://doi.org/10.1021/AC070815R
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Determination of the cd-bearing phases in municipal solid waste and Biomass single fly ash particles using SR-mu XRF Spectroscopy”. Camerani MC, Somogyi A, Vekemans B, Ansell S, Simionovici AS, Steenari B-M, Panas I, Analytical chemistry 79, 6496 (2007). http://doi.org/10.1021/AC070206J
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Single-run ion chromatographic separation of inorganic and low-molecular-mass organic anions under isocratic elution: application to environmental samples”. Krata A, Kontozova-Deutsch V, Bencs L, Deutsch F, Van Grieken R, Talanta : the international journal of pure and applied analytical chemistry 79, 16 (2009). http://doi.org/10.1016/J.TALANTA.2009.02.044
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 78, 3917 (2006). http://doi.org/10.1021/ac060597m
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In vivo investigation of the distribution and the local speciation of selenium in Allium cepa L. by means of microscopic X-ray absorption near-edge structure spectroscopy and confocal microscopic X-ray fluorescence analysis”. Bulska E, Wysocka IA, Wierzbicka MH, Proost K, Janssens K, Falkenberg G, Analytical chemistry 78, 7616 (2006). http://doi.org/10.1021/AC060380S
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 78, 4069 (2006). http://doi.org/10.1021/AC060688J
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Quantitative determination of low-Z elements in single atmospheric particles on boron substrates by automated scanning electron microscopy: energy-dispersive X-ray spectrometry”. Choël M, Deboudt K, Osán J, Flament P, Van Grieken R, Analytical chemistry 77, 5686 (2005). http://doi.org/10.1021/AC050739X
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 76, 3313 (2004). http://doi.org/10.1021/ac040052x
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Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields”. Adriaensen L, Vangaever F, Gijbels R, Analytical chemistry 76, 6777 (2004). http://doi.org/10.1021/ac049108d
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An expert system for chemical speciation of individual particles using low-Z particle electron probe X-ray microanalysis data”. Ro C-U, Kim HK, Van Grieken R, Analytical chemistry 76, 1322 (2004). http://doi.org/10.1021/AC035149I
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Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging”. Vincze L, Vekemans B, Brenker FE, Falkenberg G, Rickers K, Somogyi A, Kersten M, Adams F, Analytical chemistry 76, 6786 (2004). http://doi.org/10.1021/AC049274L
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 76, 3445 (2004). http://doi.org/10.1021/AC0400820
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Efficient separation of acetate and formate by ion chromatography: application to air samples in a cultural heritage environment”. Kontozova-Deutsch V, Krata A, Deutsch F, Bencs L, Van Grieken R, Talanta : the international journal of pure and applied analytical chemistry 75, 418 (2008). http://doi.org/10.1016/J.TALANTA.2007.11.025
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A Monte Carlo program for quantitative electron-induced x-ray analysis of individual particles”. Ro C-U, Osán J, Szalóki I, de Hoog J, Worobiec A, Van Grieken R, Analytical chemistry 75, 851 (2003). http://doi.org/10.1021/AC025973R
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 74, 2691 (2002). http://doi.org/10.1021/ac020190r
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A Monte Carlo model for studying the microheterogeneity of trace elements in reference materials by means of synchrotron microscopic X-ray fluorescence”. Kempenaers L, Janssens K, Vincze L, Vekemans B, Somogyi A, Drakopoulos M, Simionovici AS, Adams F, Analytical chemistry 74, 5017 (2002). http://doi.org/10.1021/AC025662G
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Quantitative trace element analysis of individual fly ash particles by means of X-ray microfluorescence”. Vincze L, Somogyi A, Osán J, Vekemans B, Török S, Janssens K, Adams F, Analytical chemistry 74, 1128 (2002). http://doi.org/10.1021/AC010789B
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X-ray spectrometry”. Szalóki I, Török SB, Injuk J, Van Grieken RE, Analytical chemistry 74, 2895 (2002). http://doi.org/10.1021/AC020241K
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Heterogeneity assessment in individual CaCO3-CaSO4 particles using ultrathin window electron probe X-ray microanalysis”. Ro C-U, Oh K-Y, Osán J, de Hoog J, Worobiec A, Van Grieken R, Analytical chemistry 73, 4574 (2001). http://doi.org/10.1021/AC010438X
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Assessing the molecular weight of a conducting polymer by grazing emission XRF”. Blockhuys F, Claes M, Van Grieken R, Geise HJ, Analytical chemistry 72, 3366 (2000). http://doi.org/10.1021/AC990877K
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X-ray spectrometry”. Szalóki I, Török SB, Ro C-U, Injuk J, Van Grieken RE, Analytical chemistry 72, 211 (2000). http://doi.org/10.1021/A1000018H
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Determination of low-Z elements in individual environmental particles using windowless EPMA”. Ro C-U, Osán J, Van Grieken R, Analytical chemistry 71, 1521 (1999). http://doi.org/10.1021/AC981070F
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Grazing exit electron probe microanalysis for surface and particle analysis”. Tsuji K, Wagatsuma K, Nullens R, Van Grieken RE, Analytical chemistry 71, 2497 (1999). http://doi.org/10.1021/AC990075P
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Grazing-exit particle-induced X-ray emission analysis with extremely low background”. Tsuji K, Spolnik Z, Wagatsuma K, Van Grieken RE, Vis RD, Analytical chemistry 71, 5033 (1999). http://doi.org/10.1021/AC990568U
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