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  Author Title Year Publication Volume Times cited Additional Links Links (down)
Marguí, E.; Padilla, R.; Hidalgo, M.; Queralt, I.; Van Grieken, R. High-energy polarized-beam EDXRF for trace metal analysis of vegetation samples in environmental studies 2006 X-ray spectrometry 35 UA library record; WoS full record; WoS citing articles doi
Belikov, K.N.; Mikhailova, L.I.; Spolnik, Z.M.; Van Grieken, R. EDXRF determination of impurities in potassium dihydrogenphosphate single crystals and raw materials 2006 X-ray spectrometry 35 UA library record; WoS full record; WoS citing articles doi
Worobiec, A.; Kaplinski, A.; Van Grieken, R. Ruthenium staining as an alternative preparation method for automated EPMA of individual biogenic and organic particles 2005 X-ray spectrometry 34 UA library record; WoS full record; WoS citing articles doi
Spolnik, Z.; Tsuji, K.; Van Grieken, R. Grazing-exit electron probe x-ray microanalysis of light elements in particles 2004 X-ray spectrometry 33 UA library record; WoS full record; WoS citing articles doi
Injuk, J.; Van Grieken, R. Literature trends in x-ray emission spectrometry in the period 1990-2000: a review 2003 X-ray spectrometry 32 UA library record; WoS full record; WoS citing articles doi
Samek, L.; Injuk, J.; van Espen, P.; Van Grieken, R. Performance of a new compact EDXRF spectrometer for aerosol analysis 2002 X-ray spectrometry 31 UA library record; WoS full record; WoS citing articles doi
Osán, J.; de Hoog, J.; van Espen, P.; Szalóki, I.; Ro, C.-U.; Van Grieken, R. Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles 2001 X-ray spectrometry 30 UA library record; WoS full record; WoS citing articles doi
van Malderen, H.; Hoornaert, S.; Injuk, J.; Przybylowicz, W.J.; Pineda, C.A.; Prozesky, V.M.; Van Grieken, R. Individual particle characterization of Siberian aerosols by micro-PIXE and backscattering spectrometry 2001 X-ray spectrometry 30 UA library record; WoS full record; WoS citing articles doi
Szalóki, I.; Osán, J.; Worobiec, A.; de Hoog, J.; Van Grieken, R. Optimization of experimental conditions of thin-window EPMA for ligh-element analysis of individual environmental particles 2001 X-ray spectrometry 30 UA library record; WoS full record; WoS citing articles doi
Szalóki, I.; Szegedi, S.; Varga, K.; Braun, M.; Osán, J.; Van Grieken, R. Efficiency calibartion of energy-dispersive detectors for application in quantitative x- and γ-ray spectrometry 2001 X-ray spectrometry 30 UA library record; WoS full record; WoS citing articles doi
Ozen, S.A.; Ozkalayci, F.; Cevik, U.; Van Grieken, R. Investigation of heavy metal distributions along 15m soil profiles using EDXRF, XRD, SEM-EDX, and ICP-MS techniques 2018 X-ray spectrometry 47 UA library record; WoS full record; WoS citing articles pdf doi
Romero-Pastor, J.; Garcia-Porras, A.; Van Grieken, R.; Potgieter-Vermaak, S.; Coll-Conesa, J.; Cardell, C. New insights in technology characterization of medieval Valencia glazes 2015 X-ray spectrometry 44 UA library record; WoS full record pdf doi
Cabal, A.; Schalm, O.; Eyskens, P.; Willems, P.; Harth, A.; van Espen, P. Comparison of x-ray absorption and emission techniques for the investigation of paintings 2015 X-ray spectrometry 44 UA library record; WoS full record; WoS citing articles pdf doi
Van Grieken, R. Introducing four new members of the editorial board of X-ray spectrometry 2015 X-ray spectrometry 44 UA library record; WoS full record doi
Van Grieken, R. 2014 Award for best referee of X-Ray Spectrometry 2014 X-ray spectrometry 43 UA library record; WoS full record doi
Arana, A.; Loureiro, A.L.; Barbosa, H.M.J.; Van Grieken, R.; Artaxo, P. Optimized energy dispersive X-ray fluorescence analysis of atmospheric aerosols collected at pristine and perturbed Amazon Basin sites 2014 X-ray spectrometry 43 UA library record; WoS full record; WoS citing articles pdf doi
Van Grieken, R. Introducing John Campbell, the new regional editor for North America of X-Ray Spectrometry 2014 X-ray spectrometry 43 UA library record; WoS full record doi
Van Grieken, R. Awards for best referees of X-ray Spectrometry 2014 X-ray spectrometry 43 UA library record doi
Van Grieken, R. Editorial : introducing Dr Markowicz as X-Ray Spectrometry's new associate editor for Europe 2013 X-ray spectrometry 42 UA library record; WoS full record pdf doi
Van Grieken, R. New members of the editorial board of X-ray Spectrometry 2013 X-ray spectrometry 42 UA library record; WoS full record pdf doi
Van Grieken, R. Editorial : award for best X-Ray Spectrometry referee during 2011-2012 2013 X-ray spectrometry 42 UA library record; WoS full record pdf doi
Vekemans, B.; Janssens, K.; Vincze, L.; Adams, F.; van Espen, P. Analysis of X-ray spectra by iterative least squares (AXIL): new developments 1994 X-ray spectrometry 23 UA library record; WoS full record; WoS citing articles doi
Trincavelli, J.; Montoro, S.; van Espen, P.; Van Grieken, R. M\alpha/L\alpha intensity ratios for Ta, W, Pt, Au, Pb and Bi for electron energies in the 11-40 keV range 1993 X-ray spectrometry 22 UA library record; WoS full record; WoS citing articles doi
Janssens, K.; Vincze, L.; van Espen, P.; Adams, F. Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers 1993 X-ray spectrometry 22 UA library record; WoS full record; WoS citing articles doi
Injuk, J.; van Malderen, H.; Van Grieken, R.; Swietlicki, E.; Knox, J.M.; Schofield, R. EDXRS study of aerosol composition variations in air masses crossing the North Sea 1993 X-ray spectrometry 22 UA library record; WoS full record; WoS citing articles doi
Van Grieken, R.; Markowicz, A.; Veny, P. Current trends in the literature on X-ray emission spectrometry 1991 X-ray spectrometry 20 UA library record; WoS full record; WoS citing articles doi
Muia, L.M.; Van Grieken, R. Use of theoretical accurate binary influence coefficients with Tertian's equation in X-ray fluorescence analysis of silicate rocks in borax glass beads 1990 X-ray spectrometry 19 UA library record; WoS full record; WoS citing articles doi
Araujo, M.F.; van Espen, P.; Van Grieken, R. Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation 1990 X-ray spectrometry 19 UA library record; WoS full record; WoS citing articles doi
Muia, L.M.; Van Grieken, R. Theoretical evaluation of the effective alpha and De Jongh approaches in X-ray fluorescence analysis of geological materials in borax glass beads 1989 X-ray spectrometry 18 UA library record; WoS full record; WoS citing articles doi
Storms, H.M.; Janssens, K.H.; Török, S.B.; Van Grieken, R.E. Evaluation of the ArmstrongBuseck correction for automated electron probe X-ray microanalysis of particles 1989 X-ray spectrometry 18 UA library record; WoS full record; WoS citing articles doi
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