| |
Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Marguí, E.; Padilla, R.; Hidalgo, M.; Queralt, I.; Van Grieken, R. |
High-energy polarized-beam EDXRF for trace metal analysis of vegetation samples in environmental studies |
2006 |
X-ray spectrometry |
35 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Padilla, R.; Janssens, K.; van Espen, P.; Van Grieken, R. |
XRS activities at the Micro & Trace Analysis Centre (MiTAC), University of Antwerp, Belgium |
2006 |
IAEA XRF newsletter |
12 |
|
UA library record |
|
|
|
Padilla, R.; Schalm, O.; Janssens, K.; Arrazcaeta, R.; van Espen, P. |
Microanalytical characterization of surface decoration in Majolica pottery |
2005 |
Analytica chimica acta |
535 |
20 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Padilla, R.; van Espen, P.; Abrahantes, A.; Janssens, K. |
Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses |
2005 |
X-ray spectrometry |
34 |
23 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Grieken, R.; Janssens, K.; van Espen, P.; Injuk, J.; Padilla, R.; Vittiglio, G.; Potgieter, J.H. |
Novel quantitative procedures for in-situ X-ray fluorescence analysis |
2005 |
|
|
|
UA library record |
|
