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Author |
Title  |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D. |
On the interpretation of HREM images of partially ordered alloys |
1995 |
Ultramicroscopy |
60 |
20 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
Optimal experimental design of STEM measurement of atom column positions |
2002 |
Ultramicroscopy |
90 |
35 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Dyck, D.; Van Aert, S.; den Dekker, A.J. |
Physical limits on atomic resolution |
2004 |
Microscopy and microanalysis |
10 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. |
Plasmon holographic experiments: theoretical framework |
2005 |
Ultramicroscopy |
102 |
43 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. |
Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? |
2012 |
Ultramicroscopy |
114 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis |
2003 |
Institute of physics conference series |
|
|
UA library record; WoS full record; |
|
|
|
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. |
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy |
2009 |
Ultramicroscopy |
109 |
166 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative |
2006 |
Optics express |
14 |
45 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D. |
Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction |
2005 |
Microscopy and microanalysis |
11 |
|
UA library record |
|
|
|
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
Statistical experimental design for quantitative atomic resolution transmission electron microscopy |
2004 |
|
|
13 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Dyck, D.; Croitoru, M.D. |
Statistical method for thickness measurement of amorphous objects |
2007 |
Applied physics letters |
90 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Ferroni, M.; Carotta, M.C.; Guidi, V.; Martinelli, G.; Ronconi, F.; Richard, O.; van Dyck, D.; van Landuyt, J. |
Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application |
2000 |
Sensors and actuators : B : chemical |
68 |
51 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. |
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data |
2008 |
|
|
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UA library record |
|
|
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Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
The notion of resolution |
2008 |
|
|
|
UA library record |
|
|
|
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
The notion of resolution |
2007 |
|
|
|
UA library record |
|
|
|
van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. |
Throughput maximization of particle radius measurements by balancing size and current of the electron probe |
2011 |
Ultramicroscopy |
111 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Tendeloo, G.; op de Beeck, M.; De Meulenaere, P.; van Dyck, D. |
Towards quantitative high resolution electron microscopy? |
1995 |
Institute of physics conference series |
147 |
|
UA library record; WoS full record; |
|
|
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Van Tendeloo, G.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; Amelinckx, S. |
Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp |
1994 |
MRS bulletin |
|
|
UA library record; WoS full record; |
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