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Author |
Title |
Year |
Publication |
Volume |
Times cited  |
Additional Links |
Links |
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Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S.; Leibold, B.; Habermeier, H.-U. |
HREM investigation of La1-xCaxMnO3- thin films |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Nihoul, G.; Leroux, C.; Cesari, C.; Van Tendeloo, G. |
Layered structures accomodating stoichiometry in M2X2O7 systems, as seen by diffraction and HREM |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Seo, J.W.; Perret, J.; Fompeyrine, J.; Loquet, J.-P.; Van Tendeloo, G. |
Microstructural investigation of a La1.9Sr0.1CuO4 thin film grown by MBE under a large compressive strain |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Verbist, K.; Tafuri, F.; Miletto Granozio, F.; di Chiara, S.; Van Tendeloo, G. |
Microstructure of artificial [100] 45° twist grain boundaries in YBa2Cu3O7- |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Jinschek, J.R.; Bals, S.; Gopal, V.; Xus, X.; Kisielowski, C. |
Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs |
2004 |
Microscopy and microanalysis |
10 |
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UA library record |
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Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D. |
Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction |
2005 |
Microscopy and microanalysis |
11 |
|
UA library record |
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Yandouzi, M.; Pauwels, B.; Schryvers, D.; van Swygenhoven, H.; Van Tendeloo, G. |
Structural characterisation of nanostructured Ni3Al processed by inert gas condensation |
2003 |
Defects and diffusion in metals |
213/215 |
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UA library record; WoS full record; |
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Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L. |
Electron microscopy study of twinning in the Ni5Al3 bainitic phase |
1994 |
TMS |
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Schryvers, D.; Van Landuyt, J. |
Electron microscopy study of twin sequences and branching in NissAl34 3R martensite |
1992 |
ICOMAT |
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Tanner, L.E.; Shapiro, S.M.; Krumhansl, J.A; Schryvers, D.; Noda, Y.; Yamada, Y.; Barsch, G.R.; Gooding, R.; Moss, S.C. |
Firsto order phase transformation in the Ni-Al system |
1992 |
Metallurgy and Ceramics |
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Schryvers, D.; Tanner, L.E. |
On the phase-like nature of the 7M structure in Ni-Al |
1994 |
Ecomaterials |
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Xu, W.; Peeters, F.M.; Devreese, J.T. |
The hot electron distribution of two-dimensional electrons in a polar semiconductor at zero temperature |
1991 |
Journal of physics: C: condensed matter |
3 |
1 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Tanner, L.E. |
On the phase-like nature of the 7M structure in Ni-Al |
1993 |
MRS Japan: shape memory materials |
18 |
1 |
UA library record; WoS full record; WoS citing articles |
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Vandelannoote, R.; Blommaert, W.; Van 't dack, L.; Gijbels, R.; van Grieken, R. |
Statistical grouping and controlling factors of dissolved trace elements in a surface water system |
1983 |
Environmental technology letters |
4 |
1 |
UA library record |
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Jenett, H.; Grallath, E.; Riedel, R.; Strecker, K.; Gijbels, R.; Kennis, P. |
Comparative bulk, surface and depth profile analyses on AIN and SiC-coated B4C powders |
1991 |
Fres J. Anal. Chem. |
341 |
2 |
UA library record; WoS full record; WoS citing articles |
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Tanner, L.E.; Shapiro, S.M.; Schryvers, D.; Noda, Y. |
Review of phonon behaviour and microstructural development leading to martensitic transformations in NixAl100-x alloys |
1992 |
Shape memory materials and phenomena: fundamental aspects and applications |
246 |
4 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Tanner, L.E. |
Electron microscopy of stress-induced martensite and pretransition microstructures in Ni62.5Al37.5 |
1992 |
Shape memory materials and phenomena: fundamental aspects and applications |
246 |
5 |
UA library record; WoS full record; WoS citing articles |
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Helm, M.; Peeters, F.M.; DeRosa, F.; Colas, E.; Harbison, J.P.; Florez, L.T. |
Infrared spectroscopy of subbands, minibands, and donors in GaAs/AlGaAs superlatices |
1992 |
Surface science |
263 |
5 |
UA library record; WoS full record; WoS citing articles |
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Vanhellemont, J.; Romano-Rodriguez, A.; Fedina, L.; van Landuyt, J.; Aseev, A. |
Point defect reactions in silicon studies in situ by high flux electron irradiation in high voltage transmission electron microscope |
1995 |
Materials science and technology |
11 |
7 |
UA library record; WoS full record; WoS citing articles |
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Vandelannoote, R.; Blommaert, W.; Gijbels, R.; van Grieken, R. |
Analysis of geothermal waters by spark source mass spectrometry |
1981 |
Fresenius' Zeitschrift für analytische Chemie |
309 |
8 |
UA library record |
|
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Michel, K.H.; Copley, J.R.D. |
Orientational mode coupling, diffuse scattering, and the order-disorder phase transition in solid C60 |
1997 |
Zeitschrift für Physik: B: condensed matter and quanta |
103 |
21 |
UA library record; WoS full record; WoS citing articles |
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