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  Author Title Year Publication Volume Times cited (down) Additional Links Links
Padilla, R.; van Espen, P.; Abrahantes, A.; Janssens, K. Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses 2005 X-ray spectrometry 34 23 UA library record; WoS full record; WoS citing articles doi
Padilla, R.; Schalm, O.; Janssens, K.; Arrazcaeta, R.; van Espen, P. Microanalytical characterization of surface decoration in Majolica pottery 2005 Analytica chimica acta 535 20 UA library record; WoS full record; WoS citing articles doi
Gregory, C.L.; Nullens, H.A.; Gijbels, R.H.; van Espen, P.J.; Geuens, I.; de Keyzer, R. Automated particle analysis of populations of silver halide microcrystals by electron probe microanalysis under cryogenic conditions 1998 Analytical chemistry 70 12 UA library record; WoS full record; WoS citing articles doi
van der Snickt, G.; Dubois, H.; Sanyova, J.; Legrand, S.; Coudray, A.; Glaude, C.; Postec, M.; van Espen, P.; Janssens, K. Large-area elemental imaging reveals Van Eyck's original paint layers on the Ghent altarpiece (1432), rescoping its conservation treatment 2017 Angewandte Chemie: international edition in English 56 11 UA library record; WoS full record; WoS citing articles pdf doi
van Vaeck, L.; van Espen, P.; Gijbels, R.; Baykut, G.; Laukien, F.H. A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source 2000 European mass spectrometry 6 10 UA library record; WoS full record; WoS citing articles doi
Verlinden, G.; Janssens, G.; Gijbels, R.; van Espen, P.; Geuens, I. Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis 1997 Analytical chemistry 69 6 UA library record; WoS full record; WoS citing articles doi
Hellar-Kihampa, H.; Potgieter-Vermaak, S.; De Wael, K.; Lugwisha, E.; van Espen, P.; Van Grieken, R. Concentration profiles of metal contaminants in fluvial sediments of a rural-urban drainage basin in Tanzania 2014 International journal of environmental analytical chemistry 94 5 UA library record; WoS full record; WoS citing articles doi
Cabal, A.; Legrand, S.; Van den Bril, B.; Tote, K.; Janssens, K.; van Espen, P. Study of the uniformity of aerosol filters by scanning MA-XRF 2017 X-ray spectrometry T2 – 17th European Conference on X-Ray Spectrometry (EXRS), JUN 19-24, 2016, Univ Gothenburg, Univ Gothenburg, Gothenburg, SWEDEN 46 4 UA library record; WoS full record; WoS citing articles pdf doi
Geuens, I.; Nys, B.; Naudts, J.; Gijbels, R.; Jacob, W.; van Espen, P. The primary energy dependence of backscattered electron images up to 100 keV 1991 Scanning microscopy 5 3 UA library record; WoS full record; WoS citing articles
Oleshko, V.; Kindratenko, V.; Gijbels, R.; van Espen, P.; Jacob, W. Study of quasi-fractal many-particle-systems and percolation networks by zero-loss spectroscopic imaging, electron energy-loss spectroscopy and digital image analysis 1996 Mikrochimica acta: supplementum 13 UA library record; WoS full record;
Janssens, K.; van Espen, P.; Van 't dack, L. Euroanalysis 14: the European Conference on Analytical Chemistry 2008 Analytical and bioanalytical chemistry 391 UA library record; WoS full record doi
Gijbels, R.; van Grieken, R.; Blommaert, W.; Van 't dack, L.; van Espen, P.; Nullens, H.; Saelens, R. Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges) 1983 UA library record
Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe 1996 UA library record
Janssens, K.; van Espen, P. A general-purpose interface between fortran and the low-level functions of the ibm-pc 1988 Trends in analytical chemistry 7 UA library record; WoS full record; WoS citing articles pdf doi
Janssens, K.; Vekemans, B.; Adams, F.; van Espen, P.; Mutsaers, P. Accurate evaluation of \mu-PIXE and \mu-XRF spectral data through iterative least squares fitting 1996 Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 – 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY 26-30, 1995, Abano Terme, Italy 109 UA library record; WoS full record; WoS citing articles doi
Vekemans, B.; Janssens, K.; Vincze, L.; Adams, F.; van Espen, P. Analysis of X-ray spectra by iterative least squares (AXIL): new developments 1994 X-ray spectrometry 23 UA library record; WoS full record; WoS citing articles doi
van Espen, P.; Janssens, K.; Nobels, J. AXIL-PC, software for the analysis of complex-x-ray spectra 1986 Chemometrics and intelligent laboratory systems 1 UA library record; WoS full record; WoS citing articles pdf doi
Rojas, C.M.; Figueroa, L.; Janssens, K.H.; Van Espen, P.E.; Adams, F.C.; Van Grieken, R.E. The elemental composition of airborne particulate matter in the Atacama desert, Chile 1990 The science of the total environment 91 UA library record; WoS full record; WoS citing articles pdf doi
Janssens, K.; van Espen, P. Evaluation of energy-dispersive x-ray-spectra with the aid of expert systems 1986 Analytica chimica acta 191 UA library record; WoS full record; WoS citing articles pdf doi
Janssens, K.; van Espen, P. Implementation of an expert system for the qualitative interpretation of x-ray-fluorescence spectra 1986 Analytica chimica acta 184 UA library record; WoS full record; WoS citing articles pdf doi
Janssens, K.; Vanborm, W.; van Espen, P. Increased accuracy in the automated interpretation of large epma data sets by the use of an expert system 1988 Journal of research of the National Bureau of Standards (1934) 93 UA library record; WoS full record; WoS citing articles pdf doi
Janssens, K.; Vincze, L.; van Espen, P.; Adams, F. Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers 1993 X-ray spectrometry 22 UA library record; WoS full record; WoS citing articles doi
Van Grieken, R.; Janssens, K.; van Espen, P.; Injuk, J.; Padilla, R.; Vittiglio, G.; Potgieter, J.H. Novel quantitative procedures for in-situ X-ray fluorescence analysis 2005 UA library record
Injuk, J.; Janssens, K.; van Espen, P.; Van Grieken, R. Novel quantitative procedures for in-situ X-ray fluorescence analysis 2001 UA library record
Janssens, K.; Nobels, J.; van Espen, P. PC-MCA : a software package for the acquisition and processing of spectral data 1988 Chemometrics and intelligent laboratory systems 3 UA library record; WoS full record; WoS citing articles pdf doi
Lemberge, P.; Deraedt, I.; Janssens, K.; van Espen, P. Quantitative analysis of 16-17th century archaeological glass vessels using PLS regression of EPXMA and μ-XRF data 2000 Journal of chemometrics 14 UA library record; WoS full record; WoS citing articles doi
van Espen, P.; Janssens, K. Spectrum evaluation 1992 UA library record
Janssens, K.; Dorrine, W.; van Espen, P. The development process of an expert system for the automated interpretation of large epma data sets 1988 Chemometrics and intelligent laboratory systems 4 UA library record; WoS full record; WoS citing articles pdf doi
Padilla, R.; Janssens, K.; van Espen, P.; Van Grieken, R. XRS activities at the Micro & Trace Analysis Centre (MiTAC), University of Antwerp, Belgium 2006 IAEA XRF newsletter 12 UA library record
Vanmeert, F.; De Meyer, S.; Gestels, A.; Clerici, E.A.; Deleu, N.; Legrand, S.; Van Espen, P.; Van der Snickt, G.; Alfeld, M.; Dik, J.; Monico, L.; De Nolf, W.; Cotte, M.; Gonzalez, V.; Saverwyns, S.; Depuydt-Elbaum, L.; Janssens, K. Non-invasive and non-destructive examination of artists’ pigments, paints and paintings by means of X-ray imaging methods 2022 UA library record pdf doi
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