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Gijbels R, van Grieken R, Blommaert W, Van 't dack L, van Espen P, Nullens H, Saelens R (1983) Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges). S.l
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Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe”. Janssens G, Geuens I, de Keyzer R, van Espen P, Gijbels R, Hubin A, Terryn H, Vereecken J Wiley, Chichester, page 161 (1996).
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A general-purpose interface between fortran and the low-level functions of the ibm-pc”. Janssens K, van Espen P, Trends in analytical chemistry 7, 128 (1988). http://doi.org/10.1016/0165-9936(88)87009-2
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Accurate evaluation of \mu-PIXE and \mu-XRF spectral data through iterative least squares fitting”. Janssens K, Vekemans B, Adams F, van Espen P, Mutsaers P, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 –, 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY 26-30, 1995, Abano Terme, Italy 109, 179 (1996). http://doi.org/10.1016/0168-583X(95)01211-7
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Analysis of X-ray spectra by iterative least squares (AXIL): new developments”. Vekemans B, Janssens K, Vincze L, Adams F, van Espen P, X-ray spectrometry 23, 278 (1994). http://doi.org/10.1002/XRS.1300230609
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AXIL-PC, software for the analysis of complex-x-ray spectra”. van Espen P, Janssens K, Nobels J, Chemometrics and intelligent laboratory systems 1, 109 (1986). http://doi.org/10.1016/0169-7439(86)80031-4
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The elemental composition of airborne particulate matter in the Atacama desert, Chile”. Rojas CM, Figueroa L, Janssens KH, Van Espen PE, Adams FC, Van Grieken RE, The science of the total environment 91, 251 (1990). http://doi.org/10.1016/0048-9697(90)90302-B
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Evaluation of energy-dispersive x-ray-spectra with the aid of expert systems”. Janssens K, van Espen P, Analytica chimica acta 191, 169 (1986). http://doi.org/10.1016/S0003-2670(00)86306-0
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Implementation of an expert system for the qualitative interpretation of x-ray-fluorescence spectra”. Janssens K, van Espen P, Analytica chimica acta 184, 117 (1986). http://doi.org/10.1016/S0003-2670(00)86475-2
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Increased accuracy in the automated interpretation of large epma data sets by the use of an expert system”. Janssens K, Vanborm W, van Espen P, Journal of research of the National Bureau of Standards (1934) 93, 260 (1988). http://doi.org/10.6028/JRES.093.037
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Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers”. Janssens K, Vincze L, van Espen P, Adams F, X-ray spectrometry 22, 234 (1993). http://doi.org/10.1002/XRS.1300220412
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Novel quantitative procedures for in-situ X-ray fluorescence analysis”. Van Grieken R, Janssens K, van Espen P, Injuk J, Padilla R, Vittiglio G, Potgieter JH page 45 (2005).
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Novel quantitative procedures for in-situ X-ray fluorescence analysis”. Injuk J, Janssens K, van Espen P, Van Grieken R, (2001)
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PC-MCA : a software package for the acquisition and processing of spectral data”. Janssens K, Nobels J, van Espen P, Chemometrics and intelligent laboratory systems 3, 335 (1988). http://doi.org/10.1016/0169-7439(88)80033-9
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Quantitative analysis of 16-17th century archaeological glass vessels using PLS regression of EPXMA and μ-XRF data”. Lemberge P, Deraedt I, Janssens K, van Espen P, Journal of chemometrics 14, 751 (2000). http://doi.org/10.1002/1099-128X(200009/12)14:5/6<751::AID-CEM622>3.0.CO;2-D
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Spectrum evaluation”. van Espen P, Janssens K (1992).
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The development process of an expert system for the automated interpretation of large epma data sets”. Janssens K, Dorrine W, van Espen P, Chemometrics and intelligent laboratory systems 4, 147 (1988). http://doi.org/10.1016/0169-7439(88)80086-8
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XRS activities at the Micro &, Trace Analysis Centre (MiTAC), University of Antwerp, Belgium”. Padilla R, Janssens K, van Espen P, Van Grieken R, IAEA XRF newsletter 12, 13 (2006)
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Non-invasive and non-destructive examination of artists’ pigments, paints and paintings by means of X-ray imaging methods”. Vanmeert F, De Meyer S, Gestels A, Clerici EA, Deleu N, Legrand S, Van Espen P, Van der Snickt G, Alfeld M, Dik J, Monico L, De Nolf W, Cotte M, Gonzalez V, Saverwyns S, Depuydt-Elbaum L, Janssens K page 317 (2022).
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Background aerosol composition at Gobabeb, South West Africa”. Annegarn H, Van Grieken R, van Espen P, von Blottnitz F, Sellschop J, Winchester J, Maenhaut W, Madoqua , 107 (1976)
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CAC-2010 : Twelfth international conference on chemometrics in analytical chemistry”. Buydens L, van Espen P, Rutan S, Analytica chimica acta 705, 1 (2011). http://doi.org/10.1016/J.ACA.2011.08.001
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Case specific prediction intervals for tri-PLS1 : the full local linearisation”. Serneels S, Faber K, Verdonck T, van Espen PJ, Chemometrics and intelligent laboratory systems 108, 93 (2011). http://doi.org/10.1016/J.CHEMOLAB.2011.05.002
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Characterization of individual soot aggregates from different sources using image analysis”. Smekens A, Godoi RHM, Vervoort M, van Espen P, Potgieter-Vermaak SS, Van Grieken R, Journal of atmospheric chemistry 56, 211 (2007). http://doi.org/10.1007/S10874-006-9050-X
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Classification of coal mine dust particles through fuzzy clustering of their energy-dispersive electron microprobe X-ray spectra”. Bondarenko I, van Espen P, Treiger B, Van Grieken R, Adams F, Microbeam analysis 3, 33 (1994)
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Classification of mineral particles by nonlinear mapping of electron microprobe energy-dispersive X-ray spectra”. Treiger B, Bondarenko I, van Espen P, Van Grieken R, Adams F, The analyst 119, 971 (1994). http://doi.org/10.1039/AN9941900971
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Comparison of x-ray absorption and emission techniques for the investigation of paintings”. Cabal A, Schalm O, Eyskens P, Willems P, Harth A, van Espen P, X-ray spectrometry 44, 141 (2015). http://doi.org/10.1002/XRS.2591
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Determination of fluorine in uranium oxyfluoride particles as an indicator of particle age”. Kips R, Pidduck AJ, Houlton MR, Leenaers A, Mace JD, Marie O, Pointurier F, Stefaniak EA, Taylor PDP, van den Berghe S, van Espen P, Van Grieken R, Wellum R, Spectrochimica acta: part B : atomic spectroscopy 64, 199 (2009). http://doi.org/10.1016/J.SAB.2008.12.001
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Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation”. Araujo MF, van Espen P, Van Grieken R, X-ray spectrometry 19, 29 (1990). http://doi.org/10.1002/XRS.1300190107
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DFT study of the hyperfine parameters and magnetic properties of ZnO doped with 57Fe”. Abreu Y, Cruz CM, Pinera I, Leyva A, Cabal AE, van Espen P, Solid state communications 185, 25 (2014). http://doi.org/10.1016/J.SSC.2014.01.010
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Effective sample weight from scatter peaks in energy-dispersive x-ray fluorescence”. van Espen P, Van 't dack L, Adams F, Van Grieken R, Analytical chemistry 51, 961 (1979). http://doi.org/10.1021/AC50043A042
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