| |
Author |
Title |
Year |
Publication  |
Volume |
Times cited |
Additional Links |
Links |
|
|
Eltayeb, M.A.H.; van Espen, P.J.; Cafmeyer, J.; Van Grieken, R.E.; Maenhaut, W. |
Size-differentiated composition of aerosols in Khartoum, Sudan |
1992 |
The science of the total environment |
120 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Janssens, K.; van Espen, P. |
A general-purpose interface between fortran and the low-level functions of the ibm-pc |
1988 |
Trends in analytical chemistry |
7 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Cabal, A.; Legrand, S.; Van den Bril, B.; Tote, K.; Janssens, K.; van Espen, P. |
Study of the uniformity of aerosol filters by scanning MA-XRF |
2017 |
X-ray spectrometry
T2 – 17th European Conference on X-Ray Spectrometry (EXRS), JUN 19-24, 2016, Univ Gothenburg, Univ Gothenburg, Gothenburg, SWEDEN |
46 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vekemans, B.; Janssens, K.; Vincze, L.; Adams, F.; van Espen, P. |
Analysis of X-ray spectra by iterative least squares (AXIL): new developments |
1994 |
X-ray spectrometry |
23 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Janssens, K.; Vincze, L.; van Espen, P.; Adams, F. |
Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers |
1993 |
X-ray spectrometry |
22 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Padilla, R.; van Espen, P.; Abrahantes, A.; Janssens, K. |
Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses |
2005 |
X-ray spectrometry |
34 |
23 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Cabal, A.; Schalm, O.; Eyskens, P.; Willems, P.; Harth, A.; van Espen, P. |
Comparison of x-ray absorption and emission techniques for the investigation of paintings |
2015 |
X-ray spectrometry |
44 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Araujo, M.F.; van Espen, P.; Van Grieken, R. |
Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation |
1990 |
X-ray spectrometry |
19 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Osán, J.; de Hoog, J.; van Espen, P.; Szalóki, I.; Ro, C.-U.; Van Grieken, R. |
Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles |
2001 |
X-ray spectrometry |
30 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Samek, L.; Injuk, J.; van Espen, P.; Van Grieken, R. |
Performance of a new compact EDXRF spectrometer for aerosol analysis |
2002 |
X-ray spectrometry |
31 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Trincavelli, J.; Montoro, S.; van Espen, P.; Van Grieken, R. |
M\alpha/L\alpha intensity ratios for Ta, W, Pt, Au, Pb and Bi for electron energies in the 11-40 keV range |
1993 |
X-ray spectrometry |
22 |
|
UA library record; WoS full record; WoS citing articles |
|
