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Scanning XRF investigation of a Flower Still Life and its underlying composition from the collection of the Kröller-Muller Museum”. Alfeld M, van der Snickt G, Vanmeert F, Janssens K, Dik J, Appel K, van der Loeff L, Chavannes M, Meedendorp T, Hendriks E, Applied physics A : materials science &, processing 111, 165 (2013). http://doi.org/10.1007/S00339-012-7526-X
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Visualizing the 17th century underpainting in Portrait of an Old Man by Rembrandt van Rijn using synchrotron-based scanning macro-XRF”. Alfeld M, Siddons DP, Janssens K, Dik J, Woll A, Kirkham R, van de Wetering E, Applied physics A : materials science &, processing 111, 157 (2013). http://doi.org/10.1007/S00339-012-7490-5
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2D X-ray and FTIR micro-analysis of the degradation of cadmium yellow pigment in paintings of Henri Matisse”. Pouyet E, Cotte M, Fayard B, Salome M, Meirer F, Mehta A, Uffelman ES, Hull A, Vanmeert F, Kieffer J, Burghammer M, Janssens K, Sette F, Mass J, Applied physics A : materials science &, processing 121, 967 (2015). http://doi.org/10.1007/S00339-015-9239-4
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The corrosion process of sterling silver exposed to a Na2S solution: monitoring and characterizing the complex surface evolution using a multi-analytical approach”. Schalm O, Crabbé, A, Storme P, Wiesinger R, Gambirasi A, Grieten E, Tack P, Bauters S, Kleber C, Favaro M, Schryvers D, Vincze L, Terryn H, Patelli A, Applied Physics A-Materials Science &, Processing 122, 903 (2016). http://doi.org/10.1007/s00339-016-0436-6
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Effects of a Non-Thermal Atmospheric Pressure Plasma Jet with Different Gas Sources and Modes of Treatment on the Fate of Human Mesenchymal Stem Cells”. Kang T-Y, Kwon J-S, Kumar N, Choi E, Kim K-M, Applied Sciences 9, 4819 (2019). http://doi.org/10.3390/app9224819
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IR reflectography and active thermography on artworks : the added value of the 1.53 µm band”. Peeters J, Steenackers G, Sfarra S, Legrand S, Ibarra-Castanedo C, Janssens K, van der Snickt G, Applied Sciences 8, 50 (2018). http://doi.org/10.3390/APP8010050
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Non-thermal plasma accelerates astrocyte regrowth and neurite regeneration following physical trauma in vitro”. Katiyar KS, Lin A, Fridman A, Keating CE, Cullen DK, Miller V, Applied Sciences 9, 3747 (2019). http://doi.org/10.3390/APP9183747
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Qualitative Comparison of Lock-in Thermography (LIT) and Pulse Phase Thermography (PPT) in Mid-Wave and Long-Wave Infrared for the Inspection of Paintings”. Hillen M, Sels S, Ribbens B, Verspeek S, Janssens K, Van der Snickt G, Steenackers G, Applied Sciences 13, 1 (2023). http://doi.org/10.3390/APP13074094
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Nitrogen Oxidation in a Multi-Pin Plasma System in the Presence and Absence of a Plasma/Liquid Interface”. Adhami Sayad Mahaleh M, Narimisa M, Nikiforov A, Gromov M, Gorbanev Y, Bitar R, Morent R, De Geyter N, Applied Sciences 13, 7619 (2023). http://doi.org/10.3390/app13137619
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Plasma medicine technologies”. Kaushik NK, Bekeschus S, Tanaka H, Lin A, Choi EH, Applied Sciences-Basel 11, 4584 (2021). http://doi.org/10.3390/APP11104584
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Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope”. Jannis D, Müller-Caspary K, Béché, A, Verbeeck J, Applied Sciences-Basel 11, 9058 (2021). http://doi.org/10.3390/app11199058
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Cluster analysis of IR thermography data for differentiating glass types in historical leaded-glass windows”. Hillen M, Legrand S, Dirkx Y, Janssens K, van der Snickt G, Caen J, Steenackers G, Applied Sciences-Basel 10, 4255 (2020). http://doi.org/10.3390/APP10124255
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Photoelectric and electrical responses of several erbium silicide/silicon interfaces”. Muret P, Nguyen TTA, Frangis N, Van Tendeloo G, van Landuyt J, Applied surface science T2 –, International Symposium on Si Heterostructures –, From Physics to Devices, SEP 11-14, 1995, IRAKLION, GREECE 102, 173 (1996). http://doi.org/10.1016/0169-4332(96)00042-6
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Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry”. Vanhellemont J, Maes HE, Schaekers M, Armigliato A, Cerva H, Cullis A, de Sande J, Dinges H, Hallais J, Nayar V, Pickering C, Stehlé, JL, Van Landuyt J, Walker C, Werner H, Salieri P;, Applied surface science T2 –, SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE 63, 45 (1993). http://doi.org/10.1016/0169-4332(93)90062-G
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A comparative study of carbocyanine dyes measured with TOF-SIMS and other mass spectrometric techniques”. Adriaensen L, Vangaever F, Gijbels R, Applied surface science 231/232, 348 (2004). http://doi.org/10.1016/j.apsusc.2004.03.091
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Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study”. Ignatova VA, Conard T, Möller W, Vandervorst W, Gijbels R, Applied surface science 231/232, 603 (2004). http://doi.org/10.1016/j.apsusc.2004.03.121
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Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate”. Frangis N, Van Tendeloo G, van Landuyt J, Muret P, Nguyen TTA, Applied surface science 102, 163 (1996). http://doi.org/10.1016/0169-4332(96)00040-2
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Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS)”. de Mondt R, Adriaensen L, Vangaever F, Lenaerts J, van Vaeck L, Gijbels R, Applied surface science 252, 6652 (2006). http://doi.org/10.1016/j.apsusc.2006.02.110
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First-principles electronic functionalization of silicene and germanene by adatom chemisorption”. van den Broek B, Houssa M, Scalise E, Pourtois G, Afanas'ev VV, Stesmans A, Applied surface science 291, 104 (2014). http://doi.org/10.1016/j.apsusc.2013.09.032
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High crystalline quality erbium silicide films on (100) silicon grown in high vacuum”. Kaltsas G, Travlos A, Nassiopoulos AG, Frangis N, van Landuyt J, Applied surface science 102, 151 (1996). http://doi.org/10.1016/0169-4332(96)00036-0
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Imaging TOF-SIMS for the surface analysis of silver halide microcrystals”. Lenaerts J, Gijbels R, van Vaeck L, Verlinden G, Geuens I, Applied surface science 203/204, 614 (2003). http://doi.org/10.1016/S0169-4332(02)00777-8
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Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks”. de Witte H, Conard T, Vandervorst W, Gijbels R, Applied surface science 203, 523 (2003). http://doi.org/10.1016/S0169-4332(02)00728-6
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The microstructure and interfaces of intermediate layers in sapphire bicrystals”. Vasiliev AL, Stepantsov EA, Ivanov ZG, Verbist K, Van Tendeloo G, Olsson E, Applied surface science 119, 215 (1997)
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Organic SIMS: the influence of time on the ion yield enhancement by silver and gold deposition”. Adriaensen L, Vangaever F, Gijbels R, Applied surface science 231/232, 256 (2004). http://doi.org/10.1016/j.apsusc.2004.03.031
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S-SIMS and MetA-SIMS study of organic additives in thin polymer coatings”. Adriaensen L, Vangaever F, Lenaerts J, Gijbels R, Applied surface science 252, 6628 (2006). http://doi.org/10.1016/j.apsusc.2006.02.275
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Theoretical aspects of graphene-like group IV semiconductors”. Houssa M, van den Broek B, Scalise E, Ealet B, Pourtois G, Chiappe D, Cinquanta E, Grazianetti C, Fanciulli M, Molle A, Afanas’ev VV, Stesmans A;, Applied surface science 291, 98 (2014). http://doi.org/10.1016/j.apsusc.2013.09.062
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Vibrational properties of epitaxial silicene layers on (111) Ag”. Scalise E, Cinquanta E, Houssa M, van den Broek B, Chiappe D, Grazianetti C, Pourtois G, Ealet B, Molle A, Fanciulli M, Afanas’ev VV, Stesmans A;, Applied surface science 291, 113 (2014). http://doi.org/10.1016/j.apsusc.2013.08.113
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A comparative DFT study on CO oxidation reaction over Si-doped BC2N nanosheet and nanotube”. Nematollahi P, Neyts EC, Applied surface science 439, 934 (2018). http://doi.org/10.1016/J.APSUSC.2017.12.254
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Experimental and computational investigation of graphene/SAMs/n-Si Schottky diodes”. Aydin H, Bacaksiz C, Yagmurcukardes N, Karakaya C, Mermer O, Can M, Senger RT, Sahin H, Selamet Y, Applied Surface Science 428, 1010 (2018). http://doi.org/10.1016/J.APSUSC.2017.09.204
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Tailoring the functional properties of polyurethane foam with dispersions of carbon nanofiber for power generator applications”. Sathiyamoorthy S, Girijakumari G, Kannan P, Venugopal K, Thiruvottriyur Shanmugam S, Veluswamy P, De Wael K, Ikeda H, Applied surface science 449, 507 (2018). http://doi.org/10.1016/J.APSUSC.2018.01.088
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