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Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope”. Jannis D, Müller-Caspary K, Béché, A, Verbeeck J, Applied Sciences-Basel 11, 9058 (2021). http://doi.org/10.3390/app11199058
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Cluster analysis of IR thermography data for differentiating glass types in historical leaded-glass windows”. Hillen M, Legrand S, Dirkx Y, Janssens K, van der Snickt G, Caen J, Steenackers G, Applied Sciences-Basel 10, 4255 (2020). http://doi.org/10.3390/APP10124255
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Agricultural land conversion drivers in Northeast Iran : application of structural equation model”. Azadi H, Akbar Barati A, Rafiaani P, Raufirad V, Zarafshani K, Mamoorian M, Van Passel S, Lebailly P, Applied Spatial Analysis And Policy 9, 591 (2016). http://doi.org/10.1007/S12061-015-9160-4
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Exploring a hidden painting below the surface of Rene Magritte's Le Portrait”. van der Snickt G, Martins A, Delaney J, Janssens K, Zeibel J, Duffy M, McGlinchey C, Van Driel B, Dik J, Applied spectroscopy 70, 57 (2016). http://doi.org/10.1177/0003702815617123
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Analysis of lateritic material from Cerro impacto by instrumental neutron activation employing a low-energy photon semiconductor and a high-energy Ge(Li) detector”. LaBrecque JJ, Beusen JM, Van Grieken RE, Applied spectroscopy 40, 140 (1986). http://doi.org/10.1366/0003702864509600
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Evaluation of secondary cathodes for glow discharge mass spectrometry analysis of different nonconducting sample types”. Schelles W, de Gendt S, Müller V, Van Grieken R, Applied spectroscopy 49, 939 (1995). http://doi.org/10.1366/0003702953964741
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Optimization of measurement conditions of an energy dispersive X-ray fluorescence spectrometer with high-energy polarized beam excitation for analysis of aerosol filters”. Spolnik Z, Belikov K, van Meel K, Adriaenssens E, de Roeck F, Van Grieken R, Applied spectroscopy 59, 1465 (2005). http://doi.org/10.1366/000370205775142647
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Preliminary evaluation of micro-Raman spectrometry for the characterization of individual aerosol particles”. Potgieter-Vermaak SS, Van Grieken R, Applied spectroscopy 60, 39 (2006). http://doi.org/10.1366/000370206775382848
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Preconcentration methods for the analysis of liquid samples by X-ray fluorescence techniques”. Marguí, E, Van Grieken R, Fontàs C, Hidalgo M, Queralt I, Applied spectroscopy reviews 45, 179 (2010). http://doi.org/10.1080/05704920903584198
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Analysis of composite structure and primordial wood remains in petrified wood”. Nowak J, Nowak D, Chevallier P, Lekki J, Van Grieken R, Kuczumov A, Applied spectrsocopy 61, 889 (2007). http://doi.org/10.1366/000370207781540141
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Photoelectric and electrical responses of several erbium silicide/silicon interfaces”. Muret P, Nguyen TTA, Frangis N, Van Tendeloo G, van Landuyt J, Applied surface science T2 –, International Symposium on Si Heterostructures –, From Physics to Devices, SEP 11-14, 1995, IRAKLION, GREECE 102, 173 (1996). http://doi.org/10.1016/0169-4332(96)00042-6
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Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry”. Vanhellemont J, Maes HE, Schaekers M, Armigliato A, Cerva H, Cullis A, de Sande J, Dinges H, Hallais J, Nayar V, Pickering C, Stehlé, JL, Van Landuyt J, Walker C, Werner H, Salieri P;, Applied surface science T2 –, SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE 63, 45 (1993). http://doi.org/10.1016/0169-4332(93)90062-G
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A comparative study of carbocyanine dyes measured with TOF-SIMS and other mass spectrometric techniques”. Adriaensen L, Vangaever F, Gijbels R, Applied surface science 231/232, 348 (2004). http://doi.org/10.1016/j.apsusc.2004.03.091
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Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study”. Ignatova VA, Conard T, Möller W, Vandervorst W, Gijbels R, Applied surface science 231/232, 603 (2004). http://doi.org/10.1016/j.apsusc.2004.03.121
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Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate”. Frangis N, Van Tendeloo G, van Landuyt J, Muret P, Nguyen TTA, Applied surface science 102, 163 (1996). http://doi.org/10.1016/0169-4332(96)00040-2
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Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS)”. de Mondt R, Adriaensen L, Vangaever F, Lenaerts J, van Vaeck L, Gijbels R, Applied surface science 252, 6652 (2006). http://doi.org/10.1016/j.apsusc.2006.02.110
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First-principles electronic functionalization of silicene and germanene by adatom chemisorption”. van den Broek B, Houssa M, Scalise E, Pourtois G, Afanas'ev VV, Stesmans A, Applied surface science 291, 104 (2014). http://doi.org/10.1016/j.apsusc.2013.09.032
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High crystalline quality erbium silicide films on (100) silicon grown in high vacuum”. Kaltsas G, Travlos A, Nassiopoulos AG, Frangis N, van Landuyt J, Applied surface science 102, 151 (1996). http://doi.org/10.1016/0169-4332(96)00036-0
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Imaging TOF-SIMS for the surface analysis of silver halide microcrystals”. Lenaerts J, Gijbels R, van Vaeck L, Verlinden G, Geuens I, Applied surface science 203/204, 614 (2003). http://doi.org/10.1016/S0169-4332(02)00777-8
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Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks”. de Witte H, Conard T, Vandervorst W, Gijbels R, Applied surface science 203, 523 (2003). http://doi.org/10.1016/S0169-4332(02)00728-6
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The microstructure and interfaces of intermediate layers in sapphire bicrystals”. Vasiliev AL, Stepantsov EA, Ivanov ZG, Verbist K, Van Tendeloo G, Olsson E, Applied surface science 119, 215 (1997)
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Organic SIMS: the influence of time on the ion yield enhancement by silver and gold deposition”. Adriaensen L, Vangaever F, Gijbels R, Applied surface science 231/232, 256 (2004). http://doi.org/10.1016/j.apsusc.2004.03.031
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S-SIMS and MetA-SIMS study of organic additives in thin polymer coatings”. Adriaensen L, Vangaever F, Lenaerts J, Gijbels R, Applied surface science 252, 6628 (2006). http://doi.org/10.1016/j.apsusc.2006.02.275
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Theoretical aspects of graphene-like group IV semiconductors”. Houssa M, van den Broek B, Scalise E, Ealet B, Pourtois G, Chiappe D, Cinquanta E, Grazianetti C, Fanciulli M, Molle A, Afanas’ev VV, Stesmans A;, Applied surface science 291, 98 (2014). http://doi.org/10.1016/j.apsusc.2013.09.062
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Vibrational properties of epitaxial silicene layers on (111) Ag”. Scalise E, Cinquanta E, Houssa M, van den Broek B, Chiappe D, Grazianetti C, Pourtois G, Ealet B, Molle A, Fanciulli M, Afanas’ev VV, Stesmans A;, Applied surface science 291, 113 (2014). http://doi.org/10.1016/j.apsusc.2013.08.113
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A comparative DFT study on CO oxidation reaction over Si-doped BC2N nanosheet and nanotube”. Nematollahi P, Neyts EC, Applied surface science 439, 934 (2018). http://doi.org/10.1016/J.APSUSC.2017.12.254
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Experimental and computational investigation of graphene/SAMs/n-Si Schottky diodes”. Aydin H, Bacaksiz C, Yagmurcukardes N, Karakaya C, Mermer O, Can M, Senger RT, Sahin H, Selamet Y, Applied Surface Science 428, 1010 (2018). http://doi.org/10.1016/J.APSUSC.2017.09.204
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Tailoring the functional properties of polyurethane foam with dispersions of carbon nanofiber for power generator applications”. Sathiyamoorthy S, Girijakumari G, Kannan P, Venugopal K, Thiruvottriyur Shanmugam S, Veluswamy P, De Wael K, Ikeda H, Applied surface science 449, 507 (2018). http://doi.org/10.1016/J.APSUSC.2018.01.088
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Direct methane conversion to methanol on M and MN4 embedded graphene (M = Ni and Si): a comparative DFT study”. Nematollahi P, Neyts EC, Applied surface science 496, 143618 (2019). http://doi.org/10.1016/J.APSUSC.2019.143618
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Interaction of Ge with single layer GaAs : from Ge-island nucleation to formation of novel stable monolayers”. Sozen Y, Eren I, Ozen S, Yagmurcukardes M, Sahin H, Applied Surface Science 505, 144218 (2020). http://doi.org/10.1016/J.APSUSC.2019.144218
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