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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Martin, J.M.L.; François, J.P.; Gijbels, R. |
Ab initio spectroscopy and thermochemistry of the BN molecule |
1991 |
Zeitschrift für Physik : D : atoms, molecules and clusters |
21 |
17 |
UA library record; WoS full record; WoS citing articles |
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Martin, J.M.L.; François, J.P.; Gijbels, R. |
Accurate ab initio quartic force fields and thermochemistry of FNO and CINO |
1994 |
The journal of physical chemistry |
98 |
21 |
UA library record; WoS full record; WoS citing articles |
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Vandelannoote, R.; Blommaert, W.; van Grieken, R.; Gijbels, R. |
L'analyse des eaux géothermales par spectrométrie de masse à étincelles |
1979 |
Spectra 2000: la revue de l'instrumentation |
53 |
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UA library record |
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Vandelannoote, R.; Blommaert, W.; Gijbels, R.; van Grieken, R. |
Analysis of geothermal waters by spark source mass spectrometry |
1981 |
Fresenius' Zeitschrift für analytische Chemie |
309 |
8 |
UA library record |
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Veldeman, E.; Van 't dack, L.; Gijbels, R.; Campbell, M.; Vanhaecke, F.; Vanhoe, H.; Vandecasteele, C. |
Analysis of thermal waters by ICP-MS |
1991 |
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UA library record |
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Gijbels, R.; van Grieken, R. |
Application of analytical methods for trace elements in geothermal waters : part 1 : Amélie-les-Bains (Eastern Pyrenees) |
1977 |
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UA library record |
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Gijbels, R.; van Grieken, R.; Blommaert, W.; Van 't dack, L.; van Espen, P.; Nullens, H.; Saelens, R. |
Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges) |
1983 |
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UA library record |
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Geuens, I.; Nys, B.; Gijbels, R.; Jacob, W. |
Application of neural networks in image analysis: the classification of geometrical shapes |
1993 |
CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology |
10 |
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UA library record |
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Gijbels, R.; van Grieken, R.; Blommaert, W.; Vandelannoote, R.; Van 't dack, L. |
Application of trace element analysis to geothermal waters |
1977 |
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UA library record |
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Gijbels, R.; Oksenoid, K.G. |
Atomic mass spectrometry |
1995 |
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UA library record |
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Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1995 |
Microbeam analysis |
4 |
9 |
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1994 |
Microbeam analysis |
3 |
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UA library record |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
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UA library record |
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Oleshko, V.; Gijbels, R.; Jacob, W.; Lakiere, F.; van Daele, A.; Silaev, E.; Kaplun, L. |
Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy dispersive X-ray microanalysis |
1995 |
Microscopy, microanalysis, microstructures |
6 |
7 |
UA library record; WoS full record; WoS citing articles |
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Gijbels, R. |
Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals |
1991 |
Acta technica Belgica: metallurgie |
30 |
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UA library record |
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Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
The chemical characterization of silver halide microcrystals |
1993 |
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UA library record |
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Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Combined characterization of nanostructures by AEM and STM |
1996 |
Mikrochimica acta: supplementum |
13 |
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UA library record; WoS full record; |
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Oleshko, V.P.; Gijbels, R.; Jacob, W. |
Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques |
1996 |
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UA library record |
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Jenett, H.; Grallath, E.; Riedel, R.; Strecker, K.; Gijbels, R.; Kennis, P. |
Comparative bulk, surface and depth profile analyses on AIN and SiC-coated B4C powders |
1991 |
Fres J. Anal. Chem. |
341 |
2 |
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Complex structural and analytical characterization of silver halide photographic systems by means of analytical electron microscopy |
1994 |
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UA library record; WoS full record; |
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Pentcheva, E.N.; Petrov, P.S.; Veldeman, E.; Van 't dack, L.; Gijbels, R. |
Comportement hydrogéochimique des éléments traces au cours de l'interaction eau – roche en milieu alcalin |
1990 |
Doklady Bolgarskoi Akademii Nauk |
43 |
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UA library record |
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Pentcheva, E.; Van 't dack, L.; Veldeman, E.; Gijbels, R. |
Corrélations chimiques-géothermométriques des paramètres microchimiques des hydrothermes profonds |
1996 |
Comptes rendus de l'Académie bulgare des sciences |
49 |
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UA library record |
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Pentcheva, E.N.; Van 't dack, L.; Veldeman, E.; Gijbels, R. |
Correlations géothermométriques des éléments-traces des hydrothermes de terrains granitiques (Bulgarie Méridionale) |
1992 |
Doklady na Balgarskata Akademija na Naukite |
44 |
|
UA library record; WoS full record; |
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van Straaten, M.; Butaye, L.; Gijbels, R. |
Depth profiling of coated steel wires by GDMS |
1992 |
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UA library record |
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Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Depth profiling of silver halide microcrystals |
1992 |
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UA library record |
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Geuens, I.; Gijbels, R.; Jacob, W. |
Depth profiling of silver halide microcrystals |
1991 |
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UA library record |
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van Grieken, R.; Gijbels, R.; Speecke, A.; Hoste, J. |
Determination of oxygen, silicon, phosphorus and copper in iron and steel by 14 MeV neutron activation analysis |
1971 |
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UA library record |
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Gijbels, R. |
Development of a Fourier transform laser microprobe mass spectrometer with external ion source |
1993 |
ICR/Ion trap newsletter |
30 |
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UA library record |
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Volkov, V.V.; Luyten, W.; van Landuyt, J.; Férauge, C.; Oksenoid, K.G.; Gijbels, R.; Vasilev, M.G.; Shelyakin, A.A.; Lazarev, V.B. |
Electron microscopy and mass-spectrometry study of In GaAsP/InP heterostructures (p-i-n diodes) grown by liquid phase epitaxy |
1993 |
Physica status solidi: A: applied research |
140 |
7 |
UA library record; WoS full record; WoS citing articles |
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Luyten, W.; Volkov, V.V.; van Landuyt, J.; Amelinckx, S.; Férauge, C.; Gijbels, R.; Vasilev, M.G.; Shelyakin, A.A.; Lazarev, V.B. |
Electron microscopy and mass-spectrometry study of In0.72Ga0.28As0.62P0.38 lasers grown by liquid phase epitaxy |
1993 |
Physica status solidi: A: applied research |
140 |
3 |
UA library record; WoS full record; WoS citing articles |
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