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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Robben, J.; Dufour, D.; Gijbels, R. |
Design and development of a new program for data processing of mass spectra acquired by means of a high-resolution double-focusing glow-discharge mass spectrometer |
2001 |
Fresenius' journal of analytical chemistry |
370 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Lenaerts, J.; Verlinden, G.; Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS) |
2001 |
Fresenius' journal of analytical chemistry |
370 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Kempenaers, L.; de Koster, C.; van Borm, W.; Janssens, K. |
Micro-heterogeneity study of trace elements in BCR CRM 680 by means of synchrotron micro-XRF |
2001 |
Fresenius' journal of analytical chemistry |
369 |
15 |
UA library record; WoS full record; WoS citing articles |
|
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Janssens, K.; Vincze, L.; Vekemans, B.; Williams, C.T.; Radtke, M.; Haller, M.; Knöchel, A. |
The non-destructive determination of REE in fossilized bone using synchrotron radiation induced K-line X-ray microfluorescence analysis |
1999 |
Fresenius' journal of analytical chemistry |
363 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
New developments and applications in GDMS |
1999 |
Fresenius' journal of analytical chemistry |
364 |
17 |
UA library record; WoS full record; WoS citing articles |
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Hołynska, B.; Olko, M.; Ostachowicz, B.; Ostachowicz, J.; Wegrzynek, D.; Claes, M.; Van Grieken, R.; de Bokx, P.; Kump, P.; Necemer, M. |
Performance of total reflection and grazing emission X-ray fluorescence spectrometry for the determination of trace metals in drinking water in relation to other analytical techniques |
1998 |
Fresenius' journal of analytical chemistry |
362 |
|
UA library record; WoS full record; WoS citing articles |
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Gijbels, R.; Bogaerts, A. |
Recent trends in solids mass spectrometry: GDMS and other methods |
1997 |
Fresenius' journal of analytical chemistry |
359 |
5 |
UA library record; WoS full record; WoS citing articles |
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|
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Bogaerts, A.; Gijbels, R. |
Three-dimensional modeling of a direct current glow discharge in argon: is it better than one-dimensional modeling? |
1997 |
Fresenius' journal of analytical chemistry |
359 |
9 |
UA library record; WoS full record; WoS citing articles |
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Schelles, W.; de Gendt, S.; Maes, K.; Van Grieken, R. |
The use of a secondary cathode to analyse solid non-conducting samples with direct current glow discharge mass spectrometry: potential and restrictions |
1996 |
Fresenius' journal of analytical chemistry |
355 |
|
UA library record; WoS full record; WoS citing articles |
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Jambers, W.; de Bock, L.; Van Grieken, R. |
Applications of micro-analysis to individual environmental particles |
1996 |
Fresenius' journal of analytical chemistry |
355 |
|
UA library record; WoS full record; WoS citing articles |
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Bogaerts, A.; Gijbels, R. |
Mathematical description of a direct current glow discharge in argon |
1996 |
Fresenius' journal of analytical chemistry |
355 |
12 |
UA library record; WoS full record; WoS citing articles |
|
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van Put, A.; Vertes, A.; Wegrzynek, D.; Treiger, B.; Van Grieken, R. |
Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images |
1994 |
Fresenius' journal of analytical chemistry |
350 |
|
UA library record; WoS full record; WoS citing articles |
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