NANOlab Center of Excellence literature database -- Query Results

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	Author	Title	Year	Publication	Volume	Times cited	Additional Links	Links
	Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G.	Morphology and defects in shallow trench isolation structures	1999	Conference series of the Institute of Physics	164	1	UA library record; WoS full record; WoS citing articles
	Vanhellemont, J.; Bender, H.; van Landuyt, J.	TEM studies of processed Si device materials	1997	Conference series of the Institute of Physics	157		UA library record; WoS full record;
	Fedina, L.; Lebedev, O.I.; Van Tendeloo, G.; van Landuyt, J.	In-situ HREM irradiation study of point defect clustering in strained Ge_xSi_1-x/(001)Si heterostructure	1997	Conference series of the Institute of Physics	157	1	UA library record; WoS full record; WoS citing articles
	Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J.	New intermediate defect configuration in Si studied by in situ HREM irradiation	1997	Conference series of the Institute of Physics	157		UA library record; WoS full record;

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