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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Suvorov, A.V.; Lebedev, O.I.; Suvorova, A.A.; van Landuyt, J.; Usov, I.O. Defect characterization in high temperature implanted 6H-SiC using TEM 1997 Nuclear instruments and methods in physics research: B 127/128 17 UA library record; WoS full record; WoS citing articles doi
Lebedev, O.I.; Van Tendeloo, G.; Suvorova, A.A.; Usov, I.O.; Suvorov, A.V. HREM study of ion implantation in 6H-SiC at high temperatures 1997 Journal of electron microscopy 46 7 UA library record; WoS full record; WoS citing articles
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