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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Haller, M.; Radtke, M.; Knöchel, A.; Clöck, W.; Sutton, S.; Janssens, K.; Vincze, L. |
Quantification of SY-XRF measurements at the X-ray microprobe |
1996 |
HASYLAB Jahresbericht |
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|
UA library record |
|
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Janssens, K.; van Langevelde, F.; Adams, F.; Vis, R.; Sutton, S.; Rivers, M.; Jones, K.; Bowen, D. |
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis |
1992 |
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|
|
UA library record |
|
|
|
Janssens, K.H.; Adams, F.C.; van Langevelde, F.; Vis, R.D.; Jones, K.W.; Rivers, M.; Sutton, S. |
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis |
1992 |
Advances in X-ray analysis |
35 |
|
UA library record |
|
