| |
Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Janssens, K.H.; Adams, F.C.; van Langevelde, F.; Vis, R.D.; Jones, K.W.; Rivers, M.; Sutton, S. |
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis |
1992 |
Advances in X-ray analysis |
35 |
|
UA library record |
|
|
|
Janssens, K.; van Langevelde, F.; Adams, F.; Vis, R.; Sutton, S.; Rivers, M.; Jones, K.; Bowen, D. |
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis |
1992 |
|
|
|
UA library record |
|
|
|
Janssens, K.; Adams, F.; Rivers, M.L.; Jones, K.W. |
Analysis of individual microscopic particles by means of synchrotron radiation induced X-ray micro fluorescence |
1992 |
Proceedings 27th MAS |
|
|
UA library record |
|
