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	Author	Title	Year	Publication	Volume	Times cited	Additional Links	Links
	Lebedev, O.I.; Bals, S.; Van Tendeloo, G.; Snoeck, G.E.; Retoux, R.; Boudin, S.; Hervieu, M.	Mixed (Sr_1-xCa_x)₃₃Bi₂₄Al₄₈O₁₄₁ fullerenoids: the defect structure analysed by (S)TEM techniques	2006	International journal of materials research	97	1	UA library record; WoS full record; WoS citing articles
	Laffez, P.; Retoux, R.; Boullay, P.; Zaghrioui, M.; Lacorre, P.; Van Tendeloo, G.	Transmission electron microscopy of NdNiO₃ thin films on silicon substrates	2000	European physical journal: applied physics	12	16	UA library record; WoS full record; WoS citing articles

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