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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
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Zhong, Z.; Aveyard, R.; Rieger, B.; Bals, S.; Palenstijn, W.J.; Batenburg, K.J. |
Automatic correction of nonlinear damping effects in HAADF-STEM tomography for nanomaterials of discrete compositions |
2018 |
Ultramicroscopy |
184 |
8 |
UA library record; WoS full record; WoS citing articles |
|
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Sentosun, K.; Lobato, I.; Bladt, E.; Zhang, Y.; Palenstijn, W.J.; Batenburg, K.J.; Van Dyck, D.; Bals, S. |
Artifact Reduction Based on Sinogram Interpolation for the 3D Reconstruction of Nanoparticles Using Electron Tomography |
2017 |
Particle and particle systems characterization |
34 |
2 |
UA library record; WoS full record; WoS citing articles |
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Zanaga, D.; Bleichrodt, F.; Altantzis, T.; Winckelmans, N.; Palenstijn, W.J.; Sijbers, J.; de Nijs, B.; van Huis, M.A.; Sanchez-Iglesias, A.; Liz-Marzan, L.M.; van Blaaderen, A.; Joost Batenburg, K.; Bals, S.; Van Tendeloo, G. |
Quantitative 3D analysis of huge nanoparticle assemblies |
2016 |
Nanoscale |
8 |
34 |
UA library record; WoS full record; WoS citing articles |
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van Aarle, W.; Palenstijn, W.J.; De Beenhouwer, J.; Altantzis, T.; Bals, S.; Batenburg, K.J.; Sijbers, J. |
The ASTRA Toolbox: A platform for advanced algorithm development in electron tomography |
2015 |
Ultramicroscopy |
157 |
562 |
UA library record; WoS full record; WoS citing articles |
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