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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Bittencourt, C.; Ke, X.; Van Tendeloo, G.; Tagmatarchis, N.; Guttmann, P. |
NEXAFS spectromicroscopy of suspended carbon nanohorns |
2013 |
Chemical physics letters |
587 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bittencourt, C.; Krüger, P.; Lagos, M.J.; Ke, X.; Van Tendeloo, G.; Ewels, C.; Umek, P.; Guttmann, P. |
Towards atomic resolution in sodium titanate nanotubes using near-edge X-ray-absorption fine-structure spectromicroscopy combined with multichannel multiple-scattering calculations |
2012 |
Beilstein journal of nanotechnology |
3 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bittencourt, C.; Hitchock, A.P.; Ke, X.; Van Tendeloo, G.; Ewels, C.P.; Guttmann, P. |
X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge |
2012 |
Beilstein journal of nanotechnology |
3 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Guttmann, P.; Bittencourt, C.; Rehbein, S.; Umek, P.; Ke, X.; Van Tendeloo, G.; Ewels, C.P.; Schneider, G. |
Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM |
2012 |
Nature photonics |
6 |
76 |
UA library record; WoS full record; WoS citing articles |
|
|
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Guttmann, P.; Bittencourt, C.; Ke, X.; Van Tendeloo, G.; Umek, P.; Arcon, D.; Ewels, C.P.; Rehbein, S.; Heim, S.; Schneider, G. |
TXM-NEXAFS of TiO2-based nanostructures |
2011 |
AIP conference proceedings |
1365 |
2 |
UA library record; WoS full record; WoS citing articles |
|
