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Author |
Guttmann, P.; Bittencourt, C.; Rehbein, S.; Umek, P.; Ke, X.; Van Tendeloo, G.; Ewels, C.P.; Schneider, G. |
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Title |
Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM |
Type |
A1 Journal article |
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Year  |
2012 |
Publication |
Nature photonics |
Abbreviated Journal |
Nat Photonics |
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Volume |
6 |
Issue |
1 |
Pages |
25-29 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
Near-edge X-ray absorption spectroscopy (NEXAFS)1 is an essential analytical tool in material science. Combining NEXAFS with scanning transmission X-ray microscopy (STXM) adds spatial resolution and the possibility to study individual nanostructures2, 3. Here, we describe a full-field transmission X-ray microscope (TXM) that generates high-resolution, large-area NEXAFS data with a collection rate two orders of magnitude faster than is possible with STXM. The TXM optical design combines a spectral resolution of E/ΔE = 1 × 104 with a spatial resolution of 25 nm in a field of view of 1520 µm and a data acquisition time of ~1 s. As an example, we present image stacks and polarization-dependent NEXAFS spectra from individual anisotropic sodium and protonated titanate nanoribbons. Our NEXAFS-TXM technique has the advantage that one image stack visualizes a large number of nanostructures and therefore already contains statistical information. This new high-resolution NEXAFS-TXM technique opens the way to advanced nanoscale science studies. |
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Wos |
000298416200011 |
Publication Date |
2011-11-25 |
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ISSN |
1749-4885;1749-4893; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
37.852 |
Times cited |
76 |
Open Access |
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Notes |
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Approved |
Most recent IF: 37.852; 2012 IF: 27.254 |
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Call Number |
UA @ lucian @ c:irua:94198 |
Serial |
2272 |
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| Permanent link to this record |
