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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Oleshko, V.P.; Gijbels, R.; Amelinckx, S. Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis 2013 UA library record
Van 't dack, L.; Gijbels, R.; Walker, C.T. Modern developments and applications in microbeam analysis: proceedings of the 10th Workshop of the European Microbeam Analysis Society (EMAS), Antwerp, Belgium, May 6-10, 2007 2008 Microchimica acta 161 1 UA library record; WoS full record; WoS citing articles doi
Bogaerts, A.; Temelkov, K.A.; Vuchkov, N.K.; Gijbels, R. Calculation of rate constants for asymmetric charge transfer, and their effect on relative sensitivity factors in glow discharge mass spectrometry 2007 Spectrochimica acta: part B : atomic spectroscopy 62 28 UA library record; WoS full record; WoS citing articles doi
Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. S-SIMS and MetA-SIMS study of organic additives in thin polymer coatings 2006 Applied surface science 252 3 UA library record; WoS full record; WoS citing articles doi
de Mondt, R.; Adriaensen, L.; Vangaever, F.; Lenaerts, J.; van Vaeck, L.; Gijbels, R. Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS) 2006 Applied surface science 252 9 UA library record; WoS full record; WoS citing articles doi
Kolev, I.; Bogaerts, A.; Gijbels, R. Influence of electron recapture by the cathode upon the discharge characteristics in dc planar magnetrons 2005 Physical review : E : statistical physics, plasmas, fluids, and related interdisciplinary topics 72 29 UA library record; WoS full record; WoS citing articles url doi
Cenian, A.; Chernukho, A.; Bogaerts, A.; Gijbels, R.; Leys, C. Particle-in-cell Monte Carlo modeling of Langmuir probes in an Ar plasma 2005 Journal of applied physics 97 18 UA library record; WoS full record; WoS citing articles doi
Baguer, N.; Bogaerts, A.; Donko, Z.; Gijbels, R.; Sadeghi, N. Study of the Ar metastable atom population in a hollow cathode discharge by means of a hybrid model and spectrometric measurements 2005 Journal of applied physics 97 40 UA library record; WoS full record; WoS citing articles doi
Ignatova, V.A.; Möller, W.; Conard, T.; Vandervorst, W.; Gijbels, R. Interpretation of TOF-SIMS depth profiles from ultrashallow high-k dielectric stacks assisted by hybrid collisional computer simulation 2005 Applied physics A : materials science & processing 81 4 UA library record; WoS full record; WoS citing articles doi
Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. Matrix-enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films 2005 Rapid communications in mass spectrometry 19 24 UA library record; WoS full record; WoS citing articles doi
Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. Comparative study of organic dyes with time-of-flight static secondary ion mass spectrometry and related techniques 2005 Journal of mass spectrometry 40 4 UA library record; WoS full record; WoS citing articles doi
Bogaerts, A.; Okhrimovskyy, A.; Baguer, N.; Gijbels, R. Hollow cathode discharges with gas flow: numerical modelling for the effect on the sputtered atoms and the deposition flux 2005 Plasma sources science and technology 14 9 UA library record; WoS full record; WoS citing articles doi
Neyts, E.; Bogaerts, A.; Gijbels, R.; Benedikt, J.; van de Sanden, M.C.M. Molecular dynamics simulation of the impact behaviour of various hydrocarbon species on DLC 2005 Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 228 19 UA library record; WoS full record; WoS citing articles doi
Adriaensen, L.; Vangaever, F.; Gijbels, R. Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields 2004 Analytical chemistry 76 67 UA library record; WoS full record; WoS citing articles doi
Bogaerts, A.; Gijbels, R. Calculation of cathode heating in analytical glow discharges 2004 Journal of analytical atomic spectrometry 19 21 UA library record; WoS full record; WoS citing articles doi
Okhrimovskyy, A.; Bogaerts, A.; Gijbels, R. Incorporating the gas flow in a numerical model of rf discharges in methane 2004 Journal of applied physics 96 11 UA library record; WoS full record; WoS citing articles doi
Kalitzova, M.; Vlakhov, E.; Marinov, Y.; Gesheva, K.; Ignatova, V.A.; Lebedev, O.; Muntele, C.; Gijbels, R. Effect of high-frequency electromagnetic field on Te+-implanted (001) Si</tex> 2004 Vacuum: the international journal and abstracting service for vacuum science and technology 76 2 UA library record; WoS full record; WoS citing articles pdf doi
Neyts, E.; Bogaerts, A.; Gijbels, R.; Benedikt, J.; van den Sanden, M.C.M. Molecular dynamics simulations for the growth of diamond-like carbon films from low kinetic energy species 2004 Diamond and related materials 13 53 UA library record; WoS full record; WoS citing articles doi
Depla, D.; Chen, Z.Y.; Bogaerts, A.; Ignatova, V.; de Gryse, R.; Gijbels, R. Modeling of the target surface modification by reactive ion implantation during magnetron sputtering 2004 Journal of vacuum science and technology: A: vacuum surfaces and films 22 13 UA library record; WoS full record; WoS citing articles doi
de Bleecker, K.; Bogaerts, A.; Goedheer, W.; Gijbels, R. Investigation of growth mechanisms of clusters in a silane discharge with the use of a fluid model 2004 IEEE transactions on plasma science 32 29 UA library record; WoS full record; WoS citing articles doi
Ignatova, V.A.; Conard, T.; Möller, W.; Vandervorst, W.; Gijbels, R. Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study 2004 Applied surface science 231/232 4 UA library record; WoS full record; WoS citing articles doi
de Bleecker, K.; Bogaerts, A.; Gijbels, R.; Goedheer, W. Numerical investigation of particle formation mechanisms in silane discharges 2004 Physical review : E : statistical physics, plasmas, fluids, and related interdisciplinary topics 69 74 UA library record; WoS full record; WoS citing articles doi
Bogaerts, A.; Gijbels, R.; Gamez, G.; Hieftje, G.M. Fundamental studies on a planar-cathode direct current glow discharge: part 2: numerical modeling and comparison with laser scattering experiments 2004 Spectrochimica acta: part B : atomic spectroscopy 59 26 UA library record; WoS full record; WoS citing articles doi
Adriaensen, L.; Vangaever, F.; Gijbels, R. A comparative study of carbocyanine dyes measured with TOF-SIMS and other mass spectrometric techniques 2004 Applied surface science 231/232 7 UA library record; WoS full record; WoS citing articles doi
Adriaensen, L.; Vangaever, F.; Gijbels, R. Organic SIMS: the influence of time on the ion yield enhancement by silver and gold deposition 2004 Applied surface science 231/232 10 UA library record; WoS full record; WoS citing articles doi
Georgieva, V.; Bogaerts, A.; Gijbels, R. Numerical investigation of ion energy distribution functions in single and dual frequency capacitively coupled plasma reactors 2004 Physical review : E : statistical physics, plasmas, fluids, and related interdisciplinary topics 69 97 UA library record; WoS full record; WoS citing articles url doi
Lenaerts, J.; van Vaeck, L.; Gijbels, R.; Van Luppen, J. Comparison of mono- and polyatomic primary ions for the characterization of organic dye overlayers with static secondary ion mass spectrometry 2004 Rapid communications in mass spectrometry 18 5 UA library record; WoS full record; WoS citing articles doi
Madani, M.; Bogaerts, A.; Gijbels, R.; Vangeneugden, D. Parametric study by means of numerical modelling for a dielectric barrier discharge at atmospheric pressure in nitrogen 2004 UA library record
Adriaensen, L.; Vangaever, F.; Gijbels, R. Organische TOF-S-SIMS: gebruik van opgedampt Ag en Au voor de verhoging van secundaire ionenintensiteiten 2004 Chemie magazine UA library record
de Bleecker, K.; Bogaerts, A.; Goedheer, W.J.; Gijbels, R. Modelling of formation and transport of nanoparticles in silane discharges 2004 UA library record
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