NANOlab Center of Excellence literature database -- Query Results

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	Author	Title	Year	Publication	Volume	Times cited	Additional Links	Links
	Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J.	Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping	2019	Applied physics letters	114	17	UA library record; WoS full record; WoS citing articles
	Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J.	Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer	2019				UA library record

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