NANOlab Center of Excellence literature database -- Query Results

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	Author	Title	Year	Publication	Volume	Times cited	Additional Links	Links
	Schulze, A.; Hantschel, T.; Dathe, A.; Eyben, P.; Ke, X.; Vandervorst, W.	Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects	2012	Nanotechnology	23	29	UA library record; WoS full record; WoS citing articles
	Stuer, G.; Bender, H.; van Landuyt, J.; Eyben, P.	Stress analysis with convergent beam electron diffraction around NMOS transistors	2001				UA library record; WoS full record;

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