|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
Van Aert, S.; Chen, J.H.; van Dyck, D. |
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy |
2010 |
Ultramicroscopy |
110 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example |
2005 |
Ultramicroscopy |
104 |
37 |
UA library record; WoS full record; WoS citing articles |
|
|
Chen, J.H.; Van Tendeloo, G. |
Microstructure of tough polycrystalline natural diamond |
1999 |
Journal of electron microscopy |
48 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
Chen, J.H.; Bernaerts, D.; Seo, J.W.; Van Tendeloo, G.; Kagi, H. |
Voidites in polycrystalline natural diamond |
1998 |
Philosophical magazine letters |
77 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. |
Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging |
1997 |
Ultramicroscopy |
69 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
Chen, J.H.; van Dyck, D.; op de Beeck, M.; Broeckx, J.; van Landuyt, J. |
Modification of the multislice method for calculating coherent STEM images |
1995 |
Physica status solidi: A: applied research |
150 |
5 |
UA library record; WoS full record; WoS citing articles |
|