Records |
Author |
Reniers, G.; Sörensen, K.; Vrancken, K. |
Title |
Sustainable industrial chemistry from a nontechnological viewpoint |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H1 Book chapter |
Year |
2013 |
Publication |
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Abbreviated Journal |
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Volume |
|
Issue |
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Pages |
33-41
T2 - Management principles of sustainable in |
Keywords |
H1 Book chapter; Economics; Engineering Management (ENM); Sustainable Energy, Air and Water Technology (DuEL) |
Abstract |
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Corporate Author |
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Place of Publication |
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Wos |
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Publication Date |
2013-03-14 |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
9783527330997; 9783527649488 |
Additional Links |
UA library record |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:106566 |
Serial |
8629 |
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Author |
Margu'i', E.; Queralt, I.; Van Grieken, R. |
Title |
X-ray fluorescence analysis, sample preparation for |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H1 Book chapter |
Year |
2009 |
Publication |
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Abbreviated Journal |
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Volume |
|
Issue |
|
Pages |
1-20
T2 - Sncyclopedia of analytical chemistry / M |
Keywords |
H1 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Corporate Author |
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Thesis |
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Place of Publication |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
978-0-471-97670-7 |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:81641 |
Serial |
8765 |
Permanent link to this record |
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Author |
Kollarahithlu, S.C.; Sathiyamoorthy, S.; Thiruvottriyur Shanmugam, S.; De Wael, K.; Das, J.; Veluswamy, P. |
Title |
Foodborne outbreaks : sources and mode of transmission of foodborne pathogenic microorganisms |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H1 Book chapter |
Year |
2023 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
93-104
T2 - Global food safety : microbial interve |
Keywords |
H1 Book chapter; Antwerp Electrochemical and Analytical Sciences Lab (A-Sense Lab) |
Abstract |
The foodborne pathogens and microorganisms have played a prevalent role in the ebb and flow of the economy worldwide. The increasing population has strained the food processing industry to produce food in large quantity, which in turn has affected the quality of food. To curb this issue, there is immense pressure to produce and maintain quality food within a short time frame. Hence, high throughput technology is used to determine and timely assess the safety and hygiene of food. Further, the revolution of the food industry has also seen an upsurge of new pathogens and microorganisms, thereby increasing the risk of exposure towards rarest diseases to a larger population. This chapter sheds light on the different types of foodborne pathogens affecting the food industry and its social impact. It further emphasizes the safety measures to be taken on the prevention of the disease from the farm to the processing industries and in turn to the household. |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
978-1-003-28314-0 |
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UA library record |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:200591 |
Serial |
9039 |
Permanent link to this record |
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Author |
Idrissi, H.; Schryvers, D. |
Title |
Investigation of the elementary mechanisms controlling dislocation/twin boundary interactions in fcc metals and alloys : from conventional to advanced TEM characterization |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2012 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
1213-1224 |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT) |
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Corporate Author |
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Thesis |
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Publisher |
Formatex Research Center |
Place of Publication |
S.l. |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
978-84-939843-6-6 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:104694 |
Serial |
1737 |
Permanent link to this record |
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Author |
Bals, S.; Stes, A.; Celis, V. |
Title |
Klassieke toetsing in de praktijk |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2009 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
211-225 |
Keywords |
H2 Book chapter; Educational sciences; EduBROn; Electron microscopy for materials research (EMAT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
LannooCampus |
Place of Publication |
Leuven |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
978 90 209 8819 2 |
Additional Links |
UA library record |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:79658 |
Serial |
1762 |
Permanent link to this record |
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Author |
Van Tendeloo, G. |
Title |
Art, science and sustainability = Kunst, wetenschap en duurzaamheid |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2016 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
24-39 |
Keywords |
H2 Book chapter; Art; Electron microscopy for materials research (EMAT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Vrienden van het M HKA |
Place of Publication |
Antwerpen |
Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
978-90-824885-0-0 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:139519 |
Serial |
4369 |
Permanent link to this record |
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Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
Title |
High resolution electron microscopy from imaging towards measuring |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2001 |
Publication |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
Abbreviated Journal |
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Volume |
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Issue |
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Pages |
2081-2086 |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Ieee |
Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
2002-11-13 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
0-7803-6646-8 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:136870 |
Serial |
4501 |
Permanent link to this record |
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Author |
De Vis, K.; Caen, J.; Janssens, K.; Jacobs, P. |
Title |
The consolidation of cracks and fissures in dalle de verre : assessment of selected adhesives |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2013 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
43-52 |
Keywords |
H2 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Antwerp Cultural Heritage Sciences (ARCHES) |
Abstract |
Dalle de verre windows, created from 19301940 onwards, consist of glass pieces with a thickness of approximately 2 to 5 cm, set in a matrix of (reinforced) concrete. Besides the degradation of the concrete, the windows suffer mainly from a complex three-dimensional form of cracking of the glass elements. The cracks need to be consolidated in order to ensure stability and improve transparency. A selection of possible adhesives was evaluated: Araldite® 2020, Hxtal NYL-1, Fynebond, Paraloid® B-72, LV740, A18 and OR-G®. An attempt has been made to objectively compare these adhesives using a bench-marking system. None of the adhesives appears to be suitable for in situ application; sufficient penetration of the adhesives can only be realised with the help of vacuum techniques. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
978-90-8932-113-8 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:114606 |
Serial |
5557 |
Permanent link to this record |
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Author |
Nuyts, G.; Cagno, S.; Jaroszewicz, J.; Wouters, H.; De Vis, K.; Caen, J.; Janssens, K. |
Title |
High-resolution desktop microcomputed tomography for the evaluation of reducing treatments on historical glass suffering from manganese browning |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2013 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
201-209 |
Keywords |
H2 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Antwerp Cultural Heritage Sciences (ARCHES) |
Abstract |
Historical glass, especially non-durable mediaeval glass, can undergo corrosion. This sometimes results in the formation of dark-coloured manganese-rich inclusions or stains that reduce the transparency of the glass. A conservation treatment with reducing or chelating agents may be considered with the aim of improving the transparency. In this paper, high-resolution desktop microcomputed tomography (µCT) is used in combination with element-specific twodimensional imaging methods for in situ monitoring of manganese removal by hydroxylamine hydrochloride from an archaeological stained-glass sample suffering from manganese browning and from artificially corroded model glass samples. µCT also proved itself useful for the study of the (re-)penetration of manganese into the gel layer during artificial corrosion of a model glass. |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
978-90-8932-113-8 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:114604 |
Serial |
5641 |
Permanent link to this record |
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Author |
Caen, J.; Cagno, S.; Janssens, K. |
Title |
The stained-glass panel depicting the anointing at Bethany : art historical research, technical analysis, and treatment |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2013 |
Publication |
|
Abbreviated Journal |
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Volume |
|
Issue |
|
Pages |
247-257 |
Keywords |
H2 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Antwerp Cultural Heritage Sciences (ARCHES) |
Abstract |
In 2008, Museum M in Louvain (Flanders, Belgium) acquired a panel depicting The Anointing at Bethany that is believed once to have adorned the citys former Charterhouse. The panel required conservation treatment, which was preceded by a thorough art-historical and technical examination. It emerged that comparable panels are kept at the Metropolitan Museum of Art and the Riverside Church in New York. Chemical analyses show most of the glass in the panel to have a typical 16th century high-limelow-alkali composition. The conservation treatment was based on the evaluation of these findings and focused very strongly on enhancing the aesthetic balance for an improved reading of the panel. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
978-90-8932-113-8 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:114605 |
Serial |
5847 |
Permanent link to this record |
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Author |
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Title |
Atom column detection |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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Volume |
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Issue |
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Pages |
177-214 |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
By combining statistical parameter estimation and model-order selection using a Bayesian framework, the maximum a posteriori (MAP) probability rule is proposed in this chapter as an objective and quantitative method to detect atom columns from high-resolution scanning transmission electron microscopy (HRSTEM) images. The validity and usefulness of this approach is demonstrated to both simulated and experimental annular dark-field (ADF) STEM images, but also to simultaneously acquired annular bright-field (ABF) and ADF STEM image data. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
2021-03-06 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
217 |
Series Issue |
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Edition |
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ISSN |
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ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:177531 |
Serial |
6775 |
Permanent link to this record |
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Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Title |
Atom counting |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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Volume |
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Issue |
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Pages |
91-144 |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
In this chapter, a statistical model-based method to count the number of atoms of monotype crystalline nanostructures from high-resolution annular dark-field (ADF) scanning transmission electron microscopy (STEM) images is discussed in detail together with a thorough study on the possibilities and inherent limitations. We show that this method can be applied to nanocrystals of arbitrary shape, size, and atom type. The validity of the atom-counting results is confirmed by means of detailed image simulations and it is shown that the high sensitivity of our method enables us to count atoms with single atom sensitivity. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
2021-03-06 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
217 |
Series Issue |
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Edition |
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ISSN |
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ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:177529 |
Serial |
6776 |
Permanent link to this record |
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Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Title |
Efficient fitting algorithm |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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Volume |
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Issue |
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Pages |
73-90 |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT) |
Abstract |
An efficient model-based estimation algorithm is introduced to quantify the atomic column positions and intensities from atomic-resolution (scanning) transmission electron microscopy ((S)TEM) images. This algorithm uses the least squares estimator on image segments containing individual columns fully accounting for overlap between neighboring columns, enabling the analysis of a large field of view. To provide end-users with this well-established quantification method, a user friendly program, StatSTEM, is developed which is freely available under a GNU public license. In this chapter, this efficient algorithm is applied to three different nanostructures for which the analysis of a large field of view is required. |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
2021-03-06 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
217 |
Series Issue |
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Edition |
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ISSN |
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ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:177528 |
Serial |
6778 |
Permanent link to this record |
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Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Title |
General conclusions and future perspectives |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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Volume |
|
Issue |
|
Pages |
243-253 |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
This chapter provides an overview of statistical and quantitative methodologies that have pushed (scanning) transmission electron microscopy ((S)TEM) toward accurate and precise measurements of unknown structure parameters for understanding the relation between the structure of a material and its properties. Hereby, statistical parameter estimation theory has extensively been used which enabled not only measuring atomic column positions, but also quantifying the number of atoms, and detecting atomic columns as accurately and precisely as possible from experimental images. As a general conclusion, it can be stated that advanced statistical techniques are ideal tools to perform quantitative electron microscopy at the atomic scale. In the future, statistical methods will continue to be developed and novel quantification procedures will open up new possibilities for studying material structures at the atomic scale. |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
2021-03-06 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
217 |
Series Issue |
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Edition |
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ISSN |
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ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:177533 |
Serial |
6781 |
Permanent link to this record |
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Author |
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Title |
Image-quality evaluation and model selection with maximum a posteriori probability |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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Volume |
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Issue |
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Pages |
215-242 |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
The maximum a posteriori (MAP) probability rule for atom column detection can also be used as a tool to evaluate the relation between scanning transmission electron microscopy (STEM) image quality and atom detectability. In this chapter, a new image-quality measure is proposed that correlates well with atom detectability, namely the integrated contrast-to-noise ratio (ICNR). Furthermore, the working principle of the MAP probability rule is described in detail showing a close relation to the principles of model-selection methods. |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
2021-03-06 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
217 |
Series Issue |
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Edition |
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ISSN |
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ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:177532 |
Serial |
6782 |
Permanent link to this record |
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Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Title |
Introduction |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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Volume |
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Issue |
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Pages |
1-28 |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
2021-03-06 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
217 |
Series Issue |
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Edition |
|
ISSN |
|
ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:177525 |
Serial |
6784 |
Permanent link to this record |
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Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Title |
Optimal experiment design for nanoparticle atom counting from ADF STEM images |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
|
Volume |
|
Issue |
|
Pages |
145-175 |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
In this chapter, the principles of detection theory are used to quantify the probability of error for atom counting from high-resolution scanning transmission electron microscopy (HRSTEM) images. Binary and multiple hypothesis testing have been investigated in order to determine the limits to the precision with which the number of atoms in a projected atomic column can be estimated. The probability of error has been calculated when using STEM images, scattering cross-sections or peak intensities as a criterion to count atoms. Based on this analysis, we conclude that scattering cross-sections perform almost equally well as images and perform better than peak intensities. Furthermore, the optimal STEM detector design can be derived for atom counting using the expression of the probability of error. We show that for very thin objects the low-angle annular dark-field (LAADF) regime is optimal and that for thicker objects the optimal inner detector angle increases. |
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Publication Date |
2021-03-06 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
217 |
Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
Not_Open_Access |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:177530 |
Serial |
6785 |
Permanent link to this record |
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Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Title |
Statistical parameter estimation theory : principles and simulation studies |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
|
Volume |
|
Issue |
|
Pages |
29-72 |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
In this chapter, the principles of statistical parameter estimation theory for a quantitative analysis of atomic-resolution electron microscopy images are introduced. Within this framework, electron microscopy images are described by a parametric statistical model. Here, parametric models are introduced for different types of electron microscopy images: reconstructed exit waves, annular dark-field (ADF) scanning transmission electron microscopy (STEM) images, and simultaneously acquired ADF and annular bright-field (ABF) STEM images. Furthermore, the Cramér-Rao lower bound (CRLB) is introduced, i.e. a theoretical lower bound on the variance of any unbiased estimator. This CRLB is used to quantify the precision of the structure parameters of interest, such as the atomic column positions and the integrated atomic column intensities. |
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Publication Date |
2021-03-06 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
217 |
Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
Not_Open_Access |
Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:177527 |
Serial |
6788 |
Permanent link to this record |
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Author |
Gielis, J.; Caratelli, D.; Tavkelidze, I.; Fougerolle, Y.; Ricci, P.E.; Gerats, T. |
Title |
Bulky knots and links generated by cutting generalized Mobius-Listing bodies and applications in the natural sciences |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2013 |
Publication |
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Abbreviated Journal |
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Volume |
|
Issue |
|
Pages |
167-183
T2 - Math Art Summit : Koninklijke Vlaamse |
Keywords |
H2 Book chapter; Engineering sciences. Technology; Sustainable Energy, Air and Water Technology (DuEL) |
Abstract |
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Address |
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Wos |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
|
ISBN |
978-90-6569-119-4 |
Additional Links |
UA library record |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:110955 |
Serial |
7569 |
Permanent link to this record |
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Author |
Godoi, R.H.M.; Lima Bittencourt, A.V.; Hirata, P.Y.; Jafelicci Junior, M.; dos Reis Neto, J.M.; Van Grieken, R. |
Title |
Characterization of the ionic and particulate systems in the reservoir |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2014 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
143-159
T2 - Reservoir eutrophication : preventive |
Keywords |
H2 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Place of Publication |
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Wos |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
|
ISSN |
|
ISBN |
9781780406473 |
Additional Links |
UA library record |
Impact Factor |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:119046 |
Serial |
7634 |
Permanent link to this record |
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Author |
Vázquez, C.; Darchuk, L.; Stefaniak, E.A.; Van Grieken, R.; Palacios, O.R. |
Title |
Compositional correlation between pigments found in excavations and on human bones investigated with micro-raman spectrometry and scanning electron microscopy |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2011 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
13-18
T2 - Integration of nuclear spectrometry met |
Keywords |
H2 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Place of Publication |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
|
ISBN |
978-92-0-121310-5 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
|
Approved |
no |
Call Number |
UA @ admin @ c:irua:108205 |
Serial |
7716 |
Permanent link to this record |
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Author |
Janssens, K.; Alfeld, M.; Van der Snickt, G.; De Nolf, W.; Vanmeert, F.; Monico, L.; Legrand, S.; Dik, J.; Cotte, M.; Falkenberg, G.; van der Loeff, L.; Leeuwestein, M.; Hendriks, E. |
Title |
Examination of Vincent van Gogh's paintings and pigments by means of state-of-the-art analytical methods |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2014 |
Publication |
|
Abbreviated Journal |
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Volume |
|
Issue |
|
Pages |
373-403
T2 - Science and art : the painted surface |
Keywords |
H2 Book chapter; Art; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
Recent studies in which X-ray beams of macroscopic to (sub) microscopic dimensions were used for non-destructive analysis and characterization of pigments, paint micro samples and/or entire paintings by Vincent van Gogh are concisely reviewed. The overview presented encompasses the use of laboratory and synchrotron radiation-based instrumentation and deals with the use of several variants of X-ray fluorescence (XRF) as a method of elemental analysis and imaging as well as with the combined use of X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS). Microscopic and macroscopic XRF are variants of the method that are well suited to visualize the elemental distribution of key elements, mostly metals, present in paint multi layers, either on the length scale from 1–100 μm inside micro samples taken from paintings or on the 1–100 cm length scale when the (subsurface) distribution of specific pigments in entire paintings is concerned. In the context of the characterization of van Gogh's pigments subject to natural degradation, the use of methods limited to elemental analysis or imaging usually is not sufficient to elucidate the chemical transformations that have taken place. However, at synchrotron facilities, combinations of μ-XRF with related methods such as μ-XAS and μ-XRD have proven themselves to be very suitable for such studies. Their use is often combined with microscopic Fourier transform infra-red (μ-FTIR) spectroscopy since this method delivers complementary information at more or less the same length scale as the X-ray microprobe techniques. Also in the context of macroscopic imaging of works of art, the complementary use of X-ray based and infra-red based imaging appears very promising; some recent developments are discussed. |
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Publication Date |
2020-02-24 |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
|
ISBN |
978-1-84973-818-7 |
Additional Links |
UA library record |
Impact Factor |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:190782 |
Serial |
7943 |
Permanent link to this record |
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Author |
Potgieter-Vermaak, S.; Van Grieken, R.; Potgieter, J.H. |
Title |
Integrated analytical techniques for analysing individual environmental particles |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2012 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
123-141
T2 - Spectroscopic properties of inorganic |
Keywords |
H2 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Publisher |
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Place of Publication |
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Editor |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
|
ISBN |
978-1-84973-395-3 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:109314 |
Serial |
8108 |
Permanent link to this record |
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Author |
Van Grieken, R.; Darchuk, L.; Kontozova, V.; Potgieter-Vermaak, S.; van Meel, K.; Stefaniak, E.; Worobiec, A. |
Title |
Integration of analysis techniques of different scales using X ray induced and electron induced X ray spectrometry for applications in preventive conservation and environmental monitoring |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2011 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
53-56
T2 - Integration of nuclear spectrometry met |
Keywords |
H2 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Laboratory Experimental Medicine and Pediatrics (LEMP) |
Abstract |
In the past years, and also within the framework of this CRP, we have used a combination of several nuclear and non-nuclear techniques in fundamental research and especially in various applications. Most work has been done with energy-dispersive X ray fluorescence in combination with electron probe X ray microanalysis, but several other more common analysis techniques have been used as well. The applications have included mostly preventive conservation (e.g. characterisation of damaging atmospheric particles in many museums) and environmental monitoring (e.g. for atmospheric particles in relation to their health effects in outdoor and especially indoor environments). Fundamental aspects have been in the optimising of interfaced electron microprobe and Raman microprobe analysis and the evaluation of the potential of such an instrument for atmospheric aerosols; quite a few unexpected and unpredicted problems have appeared in the latter study. |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
978-92-0-121310-5 |
Additional Links |
UA library record |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:97169 |
Serial |
8110 |
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Author |
Vandevijvere, M.; Van de Voorde, L.; Caen, J.; van Espen, P.; Vekemans, B.; Vincze, L.; Schalm, O. |
Title |
Manufacturing techniques and production defects of 16th-17th century majolica tiles from Antwerp (Belgium) |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2013 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
169-176
T2 - Recent advances in glass, stained-gla |
Keywords |
H2 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Antwerp Cultural Heritage Sciences (ARCHES) |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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ISSN |
|
ISBN |
978-90-8932-113-8 |
Additional Links |
UA library record |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:115032 |
Serial |
8199 |
Permanent link to this record |
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Author |
Rosenberg, E.; De Santis, F.; Kontozova-Deutsch, V.; Odlyha, M.; Van Grieken, R.; Vichi, F. |
Title |
Measuring gaseous and particulate pollutants: instruments and instrumental problems |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2010 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
115-146
T2 - Basic environmental mechanisms: affec |
Keywords |
H2 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
978-88-404-4334-8 |
Additional Links |
UA library record |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:83559 |
Serial |
8213 |
Permanent link to this record |
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Author |
Bencs, L.; Ravindra, K.; Van Grieken, R. |
Title |
Platinum : environmental pollution and health effects |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2011 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
580-595
T2 - Encyclopedia of environmental health |
Keywords |
H2 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
978-0-444-52273-3 |
Additional Links |
UA library record |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:93109 |
Serial |
8390 |
Permanent link to this record |
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Author |
Vervoort, P.; Grymonprez, H.; Bouckaert, N.; Derijcke, D.; De Wael, W. |
Title |
Ruimte en gezondheidsongelijkheid aanpakken : een kwestie van sociale rechtvaardigheid |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H2 Book chapter |
Year |
2023 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
|
Keywords |
H2 Book chapter; Sociology; Law; Centre for Research on Environmental and Social Change |
Abstract |
De bijdrage gaat dieper in op de relatie tussen ruimte en gezondheidsongelijkheid, bespreekt gezondheidsongelijkheid vanuit een rechtenperspectief en illustreert een aantal praktijken waarin de aandacht voor ruimte en gezondheidsongelijkheid samenkomen. |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
978-2-509-04324-5 |
Additional Links |
UA library record |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:200534 |
Serial |
9225 |
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Author |
Geuens, P.; Lebedev, O.I.; van Dyck, D.; Van Tendeloo, G. |
Title |
Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H3 Book chapter |
Year |
2000 |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
1133-1134 |
Keywords |
H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
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Place of Publication |
s.l. |
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Publication Date |
0000-00-00 |
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Abbreviated Series Title |
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Edition |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:54730 |
Serial |
49 |
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Author |
Bogaerts, A.; Schelles, W.; van Grieken, R. |
Title |
Analysis of nonconducting materials by dc glow discharge spectrometry |
Type ![sorted by Type field, ascending order (up)](img/sort_asc.gif) |
H3 Book chapter |
Year |
2003 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
293-315 |
Keywords |
H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Publisher |
Wiley |
Place of Publication |
Chichester |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:40196 |
Serial |
101 |
Permanent link to this record |